Patents Assigned to Being Advanced Memory Corporation
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Publication number: 20150078076Abstract: Methods and systems for time-based cell decoding for PCM memory. Generally, the higher the PCM element resistance, the longer it takes for a read output to change state. PCM memory output is determined using differentiated timings of read outputs changing state, rather than differentiated values of read outputs. In some single-bit single-ended sensing embodiments, a reference, with resistance between the resistances corresponding to a pair of adjacent logical states, is stored in multiple reference cells; a “vote” unit emits a clock signal when a majority of the reference cell read outputs transition at the vote unit. Timing units produce different binary outputs depending on whether a data read output or the clock signal changes state first at the timing unit. Time-based decoding provides advantages including improved temperature and drift resilience, improved state discrimination, improved reliability of multibit PCM, and fast and reliable sensing.Type: ApplicationFiled: April 1, 2014Publication date: March 19, 2015Applicant: BEING ADVANCED MEMORY CORPORATIONInventors: Aaron D. Willey, Ryan Jurasek
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Patent number: 8891294Abstract: Methods and systems for multi-bit phase change memories. Using differential sensing for memory reads provides advantages including improved temperature and drift resilience, improved state discrimination and increased storage density.Type: GrantFiled: April 24, 2013Date of Patent: November 18, 2014Assignee: Being Advanced Memory CorporationInventors: Ryan A. Jurasek, Aaron D. Willey
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Publication number: 20140321200Abstract: Methods and systems for time-based cell decoding for PCM memory. Generally, the higher the PCM element resistance, the longer it takes for a read output to change state. PCM memory output is determined using differentiated timings of read outputs changing state, rather than differentiated values of read outputs. In some single-bit single-ended sensing embodiments, a reference, with resistance between the resistances corresponding to a pair of adjacent logical states, is stored in multiple reference cells; a “vote” unit emits a clock signal when a majority of the reference cell read outputs transition at the vote unit. Timing units produce different binary outputs depending on whether a data read output or the clock signal changes state first at the timing unit. Time-based decoding provides advantages including improved temperature and drift resilience, improved state discrimination, improved reliability of multibit PCM, and fast and reliable sensing.Type: ApplicationFiled: March 24, 2014Publication date: October 30, 2014Applicant: Being Advanced Memory CorporationInventors: Aaron D. Willey, Ryan Jurasek
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Publication number: 20140211554Abstract: Methods and systems for phase change memories and arrays with improved write characteristics. If a data word can be more efficiently written by e.g. exchanging SETs and RESETs, it is written as such on the fly, and e.g. a bit of overhead is written to indicate the transformation. This has a surprising synergy with phase change memory as SET operations usually take longer and consume more power than do RESET operations. In one sample embodiment of multilevel phase change memory, states intermediate between SET and RESET can be even less desirable to write than SETs, as they take more precision than do the extreme states of SET and RESET, so that a desirable transformation can be to exchange intermediate states for extreme states.Type: ApplicationFiled: April 8, 2014Publication date: July 31, 2014Applicant: BEING ADVANCED MEMORY CORPORATIONInventors: Yuanxing Li, Van Butler, Ryan Jurasek
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Publication number: 20140211556Abstract: Methods and systems for phase change memories and arrays with improved write characteristics. If a data word can be more efficiently written by e.g. exchanging SETs and RESETs, it is written as such on the fly, and e.g. a bit of overhead is written to indicate the transformation. This has a surprising synergy with phase change memory as SET operations usually take longer and consume more power than do RESET operations. In one sample embodiment of multilevel phase change memory, states intermediate between SET and RESET can be even less desirable to write than SETs, as they take more precision than do the extreme states of SET and RESET, so that a desirable transformation can be to exchange intermediate states for extreme states.Type: ApplicationFiled: April 1, 2014Publication date: July 31, 2014Applicant: Being Advanced Memory CorporationInventors: Yuanxing Li, Van Butler, Ryan Jurasek
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Publication number: 20140211555Abstract: Methods and systems for phase change memories and arrays with improved write characteristics. If a data word can be more efficiently written by e.g. exchanging SETs and RESETs, it is written as such on the fly, and e.g. a bit of overhead is written to indicate the transformation. This has a surprising synergy with phase change memory as SET operations usually take longer and consume more power than do RESET operations. In one sample embodiment of multilevel phase change memory, states intermediate between SET and RESET can be even less desirable to write than SETs, as they take more precision than do the extreme states of SET and RESET, so that a desirable transformation can be to exchange intermediate states for extreme states.Type: ApplicationFiled: April 1, 2014Publication date: July 31, 2014Applicant: BEING ADVANCED MEMORY CORPORATIONInventors: Yuanxing Li, Van Butler, Ryan Jurasek
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Publication number: 20140204665Abstract: Methods and systems for multi-bit phase change memories. Using differential sensing for memory reads provides advantages including improved temperature and drift resilience, improved state discrimination and increased storage density.Type: ApplicationFiled: March 24, 2014Publication date: July 24, 2014Applicant: Being Advanced Memory CorporationInventors: Ryan A. Jurasek, Aaron D. Willey
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Publication number: 20140204668Abstract: The present application discloses phase-change memory architectures and methods, in which an additional test is performed, after the normal power-valid signal, to assure that the phase-change memory components which are used for storing configuration data are able to operate correctly. Surprisingly, the inventor has discovered that this additional test is highly desirable when using phase-change memory for configuration data.Type: ApplicationFiled: March 24, 2014Publication date: July 24, 2014Applicant: BEING ADVANCED MEMORY CORPORATIONInventor: Ryan Jurasek
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Publication number: 20140204666Abstract: The present application discloses phase-change memory architectures and methods, in which an additional test is performed, after the normal power-valid signal, to assure that the phase-change memory components which are used for storing configuration data are able to operate correctly. Surprisingly, the inventor has discovered that this additional test is highly desirable when using phase-change memory for configuration data.Type: ApplicationFiled: March 24, 2014Publication date: July 24, 2014Applicant: Being Advanced Memory CorporationInventor: Ryan Jurasek
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Publication number: 20140204667Abstract: The present application discloses phase-change memory architectures and methods, in which an additional test is performed, after the normal power-valid signal, to assure that the phase-change memory components which are used for storing configuration data are able to operate correctly. Surprisingly, the inventor has discovered that this additional test is highly desirable when using phase-change memory for configuration data.Type: ApplicationFiled: March 24, 2014Publication date: July 24, 2014Applicant: BEING ADVANCED MEMORY CORPORATIONInventor: Ryan Jurasek
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Patent number: 8773891Abstract: Methods and systems for phase change memories and arrays with improved write characteristics. If a data word can be more efficiently written by e.g. exchanging SETs and RESETs, it is written as such on the fly, and e.g. a bit of overhead is written to indicate the transformation. This has a surprising synergy with phase change memory as SET operations usually take longer and consume more power than do RESET operations. In one sample embodiment of multilevel phase change memory, states intermediate between SET and RESET can be even less desirable to write than SETs, as they take more precision than do the extreme states of SET and RESET, so that a desirable transformation can be to exchange intermediate states for extreme states.Type: GrantFiled: August 27, 2013Date of Patent: July 8, 2014Assignee: Being Advanced Memory CorporationInventors: Yuanxing Li, Van Butler, Ryan Jurasek
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Patent number: 8743600Abstract: Systems in which PCM is used, including memory systems, as well as methods for operating such systems. A comparison of PCM memory elements storing logical values to a trigger resistance or to each other can be used to determine the extent of resistance drift since the PCM memory elements were last written. If the comparison determines that the resistance drift has passed a sense margin threshold or a trigger resistance, a memory refresh is triggered and pre-drift resistances corresponding to the stored logical values are written to the PCM memory elements.Type: GrantFiled: April 24, 2013Date of Patent: June 3, 2014Assignee: Being Advanced Memory CorporationInventor: Wolfgang Hokenmaier
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Publication number: 20140146602Abstract: Methods and systems for fast, low power PCM memory using a bitline precharge scheme in which unselected bitlines are driven to predetermined voltages and a selected bitline is set to ground, such that when selected and unselected bitlines are shorted together, the selected bitline is charged to a PCM sense voltage. Inventive methods and systems do not require a precharge voltage regulator to drive selected bitlines to a sense voltage.Type: ApplicationFiled: April 24, 2013Publication date: May 29, 2014Applicant: Being Advanced Memory CorporationInventor: Being Advanced Memory Corporation
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Publication number: 20140146601Abstract: Systems and devices in which multi-bit phase change memory is used, including memory systems and memories, as well as methods for operating such systems and devices. According to the present invention, a reference corresponding to a pair of adjacent logical states (e.g., 0 and 1) can be generated by averaging outputs from multiple phase change memory reference cells designated to store said adjacent logical states. By writing reference cells contemporaneously with words of cells that are configured to be written together, resulting references can closely track output changes in corresponding ones of said words resulting from, e.g., drift and other time- and phase change material-dependent factors. Ordering of states within said reference cells can be used to encode information such as checksums of corresponding words.Type: ApplicationFiled: April 24, 2013Publication date: May 29, 2014Applicant: Being Advanced Memory CorporationInventor: Being Advanced Memory Corporation
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Publication number: 20140071746Abstract: Methods and systems for multi-bit phase change memories. Using differential sensing for memory reads provides advantages including improved temperature and drift resilience, improved state discrimination and increased storage density.Type: ApplicationFiled: April 24, 2013Publication date: March 13, 2014Applicant: Being Advanced Memory CorporationInventors: Ryan A. Jurasek, Aaron D. Willey
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Publication number: 20140071747Abstract: Methods and systems for processors and processing systems having multi-bit phase change memories. Using differential sensing for memory reads provides advantages including improved temperature and drift resilience, improved state discrimination and increased storage density.Type: ApplicationFiled: April 24, 2013Publication date: March 13, 2014Applicant: Being Advanced Memory CorporationInventors: Ryan A. Jurasek, Aaron D. Willey
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Publication number: 20140071748Abstract: Methods and systems for phase change memories and arrays with improved write characteristics. If a data word can be more efficiently written by e.g. exchanging SETs and RESETs, it is written as such on the fly, and e.g. a bit of overhead is written to indicate the transformation. This has a surprising synergy with phase change memory as SET operations usually take longer and consume more power than do RESET operations. In one sample embodiment of multilevel phase change memory, states intermediate between SET and RESET can be even less desirable to write than SETs, as they take more precision than do the extreme states of SET and RESET, so that a desirable transformation can be to exchange intermediate states for extreme states.Type: ApplicationFiled: August 27, 2013Publication date: March 13, 2014Applicant: Being Advanced Memory CorporationInventors: Yuanxing Li, Van Butler, Ryan Jurasek
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Publication number: 20140063931Abstract: Systems and devices in which multi-bit phase change memory is used, including memory systems and memories, as well as methods for operating such systems and devices. According to the present invention, a reference corresponding to a pair of adjacent logical states (e.g., 0 and 1) can be generated by averaging outputs from multiple phase change memory reference cells designated to store said adjacent logical states. By writing reference cells contemporaneously with words of cells that are configured to be written together, resulting references can closely track output changes in corresponding ones of said words resulting from, e.g., drift and other time- and phase change material-dependent factors. Ordering of states within said reference cells can be used to encode information such as checksums of corresponding words.Type: ApplicationFiled: April 24, 2013Publication date: March 6, 2014Applicant: Being Advanced Memory CorporationInventor: Aaron D. Willey
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Publication number: 20140063927Abstract: Phase-change memory arrays, subarrays and chips, and systems and devices in which phase change memory is used, in which two reference columns are added on to hold complementary states for each wordline of data. The outputs from the cells in the two reference columns are combined (e.g. as a plain or weighted average) to provide a reference value for read discrimination of cell states in the other columns. This provides reference values which closely track resistance changes in corresponding ones of said words resulting from, e.g., drift and other time- and phase change material-dependent factors. One of the columns of reference cells can hold a checksum.Type: ApplicationFiled: April 24, 2013Publication date: March 6, 2014Applicant: Being Advanced Memory CorporationInventor: Being Advanced Memory Corporation
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Publication number: 20140063930Abstract: Phase change memory arrays, subarrays, modules, and chips, as well as systems and devices in which phase change memory is used, wherein a reference corresponding to a pair of adjacent logical states (e.g., 0 and 1) can be generated by averaging outputs from a designated data-storing cell and a designated reference cell storing the logical complement to the logical state stored by the data-storing cell. By writing designated cells contemporaneously with words of cells that are configured to be written together, resulting references can closely track resistance changes in said words resulting from, e.g., drift and other time- and phase change material-dependent factors.Type: ApplicationFiled: April 24, 2013Publication date: March 6, 2014Applicant: Being Advanced Memory CorporationInventor: Being Advanced Memory Corporation