Abstract: An X-ray optical element (1, 1?, 1?) with a Soller slit comprising several lamellas for collimating an X-ray beam with respect to the direction of the axis (5, 15) of the Soller slit, and a further collimator for delimiting an X-ray (10), wherein the further collimator is rigidly connected to the Soller slit (2, 14) during operation, is characterized in that the X-ray beam (10) delimited by the further collimator intersects the axis (5, 15) of the Soller slit within the Soller slit, and the direction of the X-ray beam (10) subtends an angle ??10° with respect to the axis (5, 15) of the Soller slit. An X-ray optical element (1, 1?, 1?) with a Soller slit (2, 14) and a further collimator is thereby realized, which permits automatic change between the Soller slit (2, 14) and the further collimator.

Abstract: An X-ray optical configuration (1), comprising a position for an X-ray source (2), a position for a sample (3), a first focusing element (4) for directing X-ray radiation from the position of the X-ray source (2) via an intermediate focus (5) onto the position of the sample (3), and an X-ray detector (6) that can be moved on a circular arc (7) of radius R around the position of the sample (3), is characterized in that the configuration also comprises a second focusing element (8) for directing part of the X-ray radiation emanating from the intermediate focus (5) onto the position of the sample (3), and an aperture system (9) for selecting between illumination of the position of the sample (3) exclusively and directly from the intermediate focus (5) (=first optical path (10?)), or exclusively via the second focusing element (8) (=second optical path (10?)).

Abstract: A safety housing (1) for an X-ray apparatus, comprises a working chamber (2) which can accommodate X-ray apparatus protection elements (3a-3c, 5a, 5b; 21), in particular lead-containing walls and/or lead glass panes, which are impermeable to X-rays and which surround the working chamber (2) and at least one door (6a, 6b) for opening and closing an access (4) to the working chamber (2) of the safety housing (1), wherein the door (6a, 6b) has at least one door protection element (5a, 5b; 21), in particular a lead glass pane, which is impermeable to X-ray radiation, wherein the at least one door protection element (5a, 5b; 21) can completely cover the access to the working chamber (2), and wherein the door (6a, 6b) can be pivoted about an axis S relative to a main frame (9) of the safety housing (1).

Abstract: An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in a correlated fashion. Each goniometer leg (or linkage) thereby has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance. The movement of the main center of rotation relative to the guidance can be easily driven by means of one single motor.

Abstract: An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength and energy, and a detector (5) for measuring the selected X-ray beams, a diffractometry channel (6) that selects, by means of a monochromator (7), an X-ray beam wavelength of the source subsequent to diffraction of the X-ray beams by the sample, and a detector (8) for measuring the selected X-ray beams, is characterized in that a single slit device (9) is provided between the source and the sample, which can be moved transversely with respect to the direction of the beam from the source, and the monochromator of the diffractometry channel is stationarily disposed with respect to the source and the sample and has an entry single slit (10) which defines, together with the movable single slit device and the sample position, the characteristic diffraction angle 2? of a predetermined crystal structure of the polycrystalli

Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.

Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.

Abstract: An X-ray optical element (1, 1?, 1?) with a Soller slit comprising several lamellas for collimating an X-ray beam with respect to the direction of the axis (5, 15) of the Soller slit, and a further collimator for delimiting an X-ray (10), wherein the further collimator is rigidly connected to the Soller slit (2, 14) during operation, is characterized in that the X-ray beam (10) delimited by the further collimator intersects the axis (5, 15) of the Soller slit within the Soller slit, and the direction of the X-ray beam (10) subtends an angle ??10° with respect to the axis (5, 15) of the Soller slit. An X-ray optical element (1, 1?, 1?) with a Soller slit (2, 14) and a further collimator is thereby realized, which permits automatic change between the Soller slit (2, 14) and the further collimator.

Abstract: A safety housing (1) for an X-ray apparatus, comprises a working chamber (2) which can accommodate X-ray apparatus protection elements (3a-3c, 5a, 5b; 21), in particular lead-containing walls and/or lead glass panes, which are impermeable to X-rays and which surround the working chamber (2) and at least one door (6a, 6b) for opening and closing an access (4) to the working chamber (2) of the safety housing (1), wherein the door (6a, 6b) has at least one door protection element (5a, 5b; 21), in particular a lead glass pane, which is impermeable to X-ray radiation, wherein the at least one door protection element (5a, 5b; 21) can completely cover the access to the working chamber (2), and wherein the door (6a, 6b) can be pivoted about an axis S relative to a main frame (9) of the safety housing (1).

Abstract: A door configuration (1a, 1b) comprising a door (6a, 6b) for opening and closing an access (4), wherein the door (6a, 6b) can be pivoted about an axis S relative to a main frame (9) of the door configuration (1a, 1b), wherein the door (6a, 6b) has a sliding door (10a, 10b) that is disposed on a casement (7a, 7b) of the door (6a, 6b) such that it can be displaced in a direction V, and wherein the casement (7a, 7b) can be pivoted about the axis S relative to the main frame (9).

Abstract: An X-ray diffractometer (1; 24; 30) has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source (2) and detector (3; 31) are respectively disposed, at the same time and in a correlated fashion, wherein the ?-angle can be scanned, and at the same time a ?-?-geometry (Bragg-Brentano measurement geometry) is always maintained. This is achieved in that each goniometer leg (or linkage (5, 6; 25, 26)) has a common main center of rotation HDP and also one respective auxiliary center of rotation HD1, HD2. The two auxiliary centers of rotation are symmetrically disposed with respect to a symmetry plane E which contains the main center of rotation, and can be moved on a guidance (13; 13a, 13b) that is symmetrical with respect to the plane E. The main center of rotation can only be moved in the plane E, e.g. along a rail guidance.

Abstract: The invention describes an X-ray source in which a cooling plate (36) for water-cooling the anode (28) of an X-ray tube (26) is firmly mounted on a radiation protection casing (20) and the X-ray tube (26) is rotatably borne relative to the cooling plate (36) in the radiation protection casing (20). The cooling plate (36) and X-ray tube (26) have small axial play with respect to each other, which allows for rotation. Radial seals (R1, R2) ensure adequate sealing of the cooling water throughout the entire axial play. Advantageously, a sealing plate (27) for adaptation to the cooling plate (36) is attached to the X-ray tube (25). With the X-ray source in accordance with the invention, it is easy to switch between various focus types in one casing structure.

Abstract: The invention describes an X-ray source in which a cooling plate (36) for water-cooling the anode (28) of an X-ray tube (26) is firmly mounted on a radiation protection casing (20) and the X-ray tube (26) is rotatably borne relative to the cooling plate (36) in the radiation protection casing (20). The cooling plate (36) and X-ray tube (26) have small axial play with respect to each other, which allows for rotation. Radial seals (R1, R2) ensure adequate sealing of the cooling water throughout the entire axial play. Advantageously, a sealing plate (27) for adaptation to the cooling plate (36) is attached to the X-ray tube (25). With the X-ray source in accordance with the invention, it is easy to switch between various focus types in one casing structure.

Abstract: A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector.

Abstract: An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . .

Abstract: An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of the measured diffraction pattern, acquiring an element spectrum of the measuring sample and determining concentrations of chemical elements in the measuring sample from the acquired element spectrum, and carrying out a quantitative phase analysis of the measuring sample on the basis of the measured intensities of the acquired diffraction pattern thereby taking into consideration determined element concentrations as a boundary condition, wherein differences between calculated and measured intensities of the diffraction pattern and between calculated and determined element concentrations are simultaneously minimized in an iterative process. The inventive method permits quantitative phase determination with high reliability.

Abstract: A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector.

Abstract: A method of determining parameters of a sample by X-ray scattering comprising the steps of exposing the sample to X-rays and measuring scattered X-ray intensity, generating a parameterized model of the sample which is used for numerical simulation of scattered X-ray intensity on the basis of a physical scattering theory, comparing the experimental and simulated X-ray scattering data to generate an error value and modifying the parameters of the model by means of a genetic algorithm involving an amount of individuals each with an equal number N of encoded parameters forming a generation and applying the genetic operators of “selection”, “crossover” and “mutation” used for composing successive generations of evolving individuals, is characterized in that after a given number k of successive generations the genetic operator of “mutation” is no longer applied in evolution of further generations.

Abstract: A method for operating an X-ray analysis device is characterized by the following steps: a) recording a first data set in a first relative spatial position of a source, an object and a detector; b) displacement and/or rotation of the detector in the detector plane relative to the source and the object, whereby the relative position of source and object is not changed; c) recording a second data set In the position displaced according to step b); and d) superposition of the recorded data sets to form an overall data set, wherein the pixels of the recorded data sets are combined corresponding to their actual relative position with respect to the source and object.

Abstract: A method of determining parameters of a sample by X-ray scattering comprising the steps of exposing the sample to X-rays and measuring scattered X-ray intensity, generating a parameterized model of the sample which is used for numerical simulation of scattered X-ray intensity on the basis of a physical scattering theory, comparing the experimental and simulated X-ray scattering data to generate an error value, and modifying the parameters of the model by means of a genetic algorithm involving an amount of individuals each with an equal number N of encoded parameters forming a generation and applying the genetic operators of “selection”, “crossover” and “mutation” used for composing successive generations of evolving individuals, is characterized in that from one generation to the next a “movement” genetic operator is applied which moves at least some of the encoded parameters of at least some of the individuals towards the respective encoded parameters of the individual with the smallest error value.