Patents Assigned to Chemical Art Technology Inc.
  • Patent number: 10226959
    Abstract: A substrate processing device, which processes by immersing the substrate in the processing liquid comprising a mixture of a chemical and a diluting liquid, is provided with: a processing tank (1) that retains the processing liquid; heating means (2, 3) that heat the processing liquid; a temperature detection means (4) that detects the temperature of the processing liquid; a temperature control means (5) that operates the aforementioned heating means (2, 3) in a manner so that the detected temperature approaches a set temperature; a replenishing means (6) that replenishes the diluting liquid in the processing liquid; a concentration detection means (7) that detects the concentration of the processing liquid by measuring the light absorption characteristics of the processing liquid; and a concentration control means (8) that operates the aforementioned replenishing means (6) in a manner so that the detected concentration approaches a set concentration.
    Type: Grant
    Filed: July 21, 2011
    Date of Patent: March 12, 2019
    Assignees: Kurashiki Boseki Kabushiki Kaisha, Chemical Art Technology, Inc.
    Inventors: Hiromi Kiyose, Satoru Hiraki, Hiroshi Watanabe
  • Publication number: 20130240143
    Abstract: A substrate processing device, which processes by immersing the substrate in the processing liquid comprising a mixture of a chemical and a diluting liquid, is provided with: a processing tank (1) that retains the processing liquid; heating means (2, 3) that heat the processing liquid; a temperature detection means (4) that detects the temperature of the processing liquid; a temperature control means (5) that operates the aforementioned heating means (2, 3) in a manner so that the detected temperature approaches a set temperature; a replenishing means (6) that replenishes the diluting liquid in the processing liquid; a concentration detection means (7) that detects the concentration of the processing liquid by measuring the light absorption characteristics of the processing liquid; and a concentration control means (8) that operates the aforementioned replenishing means (6) in a manner so that the detected concentration approaches a set concentration.
    Type: Application
    Filed: July 21, 2011
    Publication date: September 19, 2013
    Applicants: CHEMICAL ART TECHNOLOGY, INC., KURASHIKI BOSEKI KABUSHIKI KAISHA
    Inventors: Hiromi Kiyose, Satoru Hiraki, Hiroshi Watanabe
  • Patent number: 8158075
    Abstract: This invention intends to enable silicon compound to be removed from waste etching solution at a high removal rate and waste etching solution to be recycled without disposing it. The etching solution reproducing apparatus includes: temperature adjusting means for adjusting the temperature of taken out waste etching solution; atomizing means for atomizing waste etching solution adjusted in temperature by the temperature adjusting means; precipitating means for collecting waste etching solution atomized by the atomizing means and precipitating silicon compound in the waste etching solution; and separating means for separating silicon compound precipitated from the waste etching solution by the precipitating means so as to obtain reproduced etching solution.
    Type: Grant
    Filed: November 7, 2007
    Date of Patent: April 17, 2012
    Assignee: Chemical Art Technology Inc.
    Inventor: Hiroshi Watanabe
  • Publication number: 20090049653
    Abstract: This invention intends to enable silicon compound to be removed from waste etching solution at a high removal rate and waste etching solution to be recycled without disposing it. The etching solution reproducing apparatus includes: temperature adjusting means for adjusting the temperature of taken out waste etching solution; atomizing means for atomizing waste etching solution adjusted in temperature by the temperature adjusting means; precipitating means for collecting waste etching solution atomized by the atomizing means and precipitating silicon compound in the waste etching solution; and separating means for separating silicon compound precipitated from the waste etching solution by the precipitating means so as to obtain reproduced etching solution.
    Type: Application
    Filed: November 7, 2007
    Publication date: February 26, 2009
    Applicant: CHEMICAL ART TECHNOLOGY INC.
    Inventor: Hiroshi WATANABE
  • Publication number: 20060231124
    Abstract: Provided is a processing method capable of reliably processing the inside of a depression such as a trench, a contact hole, a deep pattern, or a pore of a porous substrate. A chemical solution M is supplied into a processing bath 1 placing a substrate W, and the processing bath 1 is repetitively evacuated and pressurized several times at a pressure lower than the atmospheric pressure. Alcohol X is brought into contact with the surface of the substrate W and supplied into a depression W?1. The chemical solution M is supplied into the processing bath 1 containing the substrate W until the chemical solution M reaches a water level at which the substrate W is dipped, thereby allowing the chemical solution M to enter the depression W?1. The chemical solution M is discharged from the processing bath 1, and a portion of the chemical solution M entering the depression W?1 and mixed with the alcohol X is evaporated by evacuating the processing bath 1. This process is repeated several times.
    Type: Application
    Filed: May 15, 2006
    Publication date: October 19, 2006
    Applicants: Chemical Art Technology Inc., Cannon Kabushiki Kaisha
    Inventors: Hiroshi Watanabe, Tamotsu Mezaki, Shigeru Kido, Kiyofumi Sakaguchi
  • Publication number: 20040060574
    Abstract: Provided is a processing method capable of reliably processing the inside of a depression such as a trench, a contact hole, a deep pattern, or a pore of a porous substrate. A chemical solution M is supplied into a processing bath 1 placing a substrate W, and the processing bath 1 is repetitively evacuated and pressurized several times at a pressure lower than the atmospheric pressure. Alcohol X is brought into contact with the surface of the substrate W and supplied into a depression W-1. The chemical solution M is supplied into the processing bath 1 containing the substrate W until the chemical solution M reaches a water level at which the substrate W is dipped, thereby allowing the chemical solution M to enter the depression W-1. The chemical solution M is discharged from the processing bath 1, and a portion of the chemical solution M entering the depression W-1 and mixed with the alcohol X is evaporated by evacuating the processing bath 1. This process is repeated several times.
    Type: Application
    Filed: July 16, 2003
    Publication date: April 1, 2004
    Applicants: CHEMICAL ART TECHNOLOGY INC., CANON KABUSHIKI KAISHA
    Inventors: Hiroshi Watanabe, Tamotsu Mezaki, Shigeru Kido, Kiyofumi Sakaguchi