Abstract: The invention relates to a powder of an alloy comprising uranium and molybdenum in ?-metastable phase, a composition of powders comprising this powder, and the uses of said alloy powder and of said composition of powders. The alloy powder comprising uranium and molybdenum in ?-metastable phase according to the invention is formed of particles comprising a nucleus which consists of said alloy, and which is covered with a layer of alumina positioned in contact with this nucleus. Applications: manufacture of nuclear fuel elements and, in particular, of fuel elements for experimental nuclear reactors; manufacture of targets intended for production of radioelements, which are useful in particular for medical imaging, such as technetium 99m.

Abstract: A casing for a lithium bipolar electrochemical battery including a bipolar element. The casing includes a composite material including a matrix and at least one porous reinforcement, the matrix of which includes at least one hardened polymer impregnating the at least one porous reinforcement, wherein the at least one porous reinforcement and the at least one hardened polymer encase the bipolar element and maintain a determined pressure on either side of the bipolar element to maintain a determined contact between its constituents.

Abstract: The invention relates to an atomic force microscope tip characterization tool. An atomic force microscope uses a very fine exploration tip placed at the end of an elastic cantilever beam and an optical system for exploring movements of the beam in contact with a relief to be explored. The shape of the exploration tip must be known, and to this end a tool is used, placed in an atomic force microscope, the known shapes whereof are used to derive the shape of the tip. The tool of the invention includes a thin silicon beam (50) placed between two separated studs, formed on a support plate. The tip to be measured is moved between the studs remaining in contact with the beam and the measurement of the position of the tip during these movements enables the shape of the tip to be derived. The very small thickness (less than 5 nm) of the beam allows great accuracy and great reproducibility of measurement.

Abstract: Method for eliminating the precipitates contained in a II-VI solid semiconductor material by annealing, in which said solid semiconductor material is a congruent sublimation solid semiconductor material, and in which the following successive steps are carried out: the solid semiconductor material is heated under an inert gas flow up to a temperature T, between a first temperature T1, corresponding to the compound II-VI/element VI eutectic, and a second temperature T2, corresponding to maximum congruent sublimation temperature; the solid material is held at this temperature T under a neutral gas flow for a time period sufficient to eliminate the precipitates; the solid semiconductor material is cooled under an inert gas flow from temperature T to ambient temperature, at a rate such that, during cooling, the solid material merges with its congruent sublimation line; the precipitate-free solid semiconductor material is recovered.