Patents Assigned to CSEM CENTRE SUISSE D'ELECTONIQUE ET DE MIROTECHNIQUE-CHINQUE SA RECHERCHE ET DEVEL
  • Publication number: 20120026321
    Abstract: A one-dimension position measurement system includes: a first ruler having a first one-dimension binary code si applied thereon, a camera for acquiring a picture of a portion of the code si, the portion having a length of I bits, and some processing elements. Each codeword of length I of the one-dimension code si is unique within the whole code si A codeword ai is read from the acquired picture, and the processing elements are implemented for computing an absolute position p of the codeword ai of the code si from: (I). An adhoc interpolation method is used to obtain a precision way below the distance between two bits of the codewords. The code si may be applied on the ruler by using some geometric primitives, a geometric primitive for encoding a “1” being different from a geometric primitive for encoding a “0”, both having the same horizontal projection. The horizontal projection is then used for fine interpolation, achieving nanometre-scale resolution.
    Type: Application
    Filed: April 3, 2009
    Publication date: February 2, 2012
    Applicant: CSEM CENTRE SUISSE D'ELECTONIQUE ET DE MIROTECHNIQUE-CHINQUE SA RECHERCHE ET DEVEL
    Inventors: David Hasler, Peter Masa, Pascal Heim, Edoardo Franzi