Abstract: An improved Raman spectrometer device is provided which provides useful spectral information in situations where Raman spectroscopy has heretofore been unworkable. The spectrometer of the invention makes use of a stationary electrooptical masking device in lieu of conventional slit scanning optics, with the mask being computer controlled to provide a multiplexing function, typically employing Hadamard mathematics. The stationary encoding mask permits use of a relatively inexpensive photodiode detector, as compared with photomultiplier tubes conventionally used in Raman instrumentation. Advantageously, unwanted Rayleigh scattered radiation can be completely eliminated, either by blanking those zones of the mask receiving such radiation, or physically locating the device in such orientation that the Rayleigh scattered radiation does not pass through operative portions of the mask.

Abstract: An improved masking device for optical-type radiations is provided and employed in improved optical apparatus, such as spectrometers, requiring alterable radiation masking. The masking device involves no movable parts, is adapted to operate in a fixed position and has radiation transmission and/or reflection characteristics which are selectively alterable merely by controlling electrical excitation applied to the device. The masking device typically has a plurality of separated and predisposedly offset, coplanar zones of solidified, electro-optically active material carried upon a typically transparent substrate and bounded by areas of an opaque material. The active material may be any of the crystalline or polycrystalline materials which have the property of changing their optical characteristic between being relatively transmissive and being relatively reflective and/or opaque for radiations of the wavelengths of interest, in response to the passage of electrical current through the material.

Abstract: An improved interferometer is provided which is of simplified construction and gives enhanced, accurate interference analysis through provision of an alterable masking device located at the interference plane which facilitates rapid computer analysis of an interference pattern. The interferometer of the invention preferably includes a source of electromagnetic radiation, a beam splitter, a lens for convergence and interference of the beams, a masking device located at the region of beam convergence, and detection apparatus for receiving and analyzing radiation from the mask. The mask is preferably stationary and electrically alterable and advantageously includes a base along with separate, plural masking structures mounted on one base face with electrical connections coupled to the separate masking structures.

Abstract: An improved masking device for optical-type radiations (e.g., infrared visible or ultraviolet) is provided and employed in improved optical apparatus, such as spectrometers, requiring alterable radiation masking. The masking device involves no movable parts, is adapted to operate in a fixed position and has radiation transmission and/or reflection characteristics which are selectively alterable merely by controlling electrical excitation applied to the device. The masking device typically has a plurality of separated and predisposedly offset, coplanar zones of solidified, electrooptically active material carried upon a typically transparent substrate and bounded by areas of an opaque material.