Patents Assigned to DiaMonTech AG
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Patent number: 11946887Abstract: The invention relates to a device and a method for analyzing a substance (5), comprising an excitation transmitting device in the form of a laser device (3) for generating at least one electromagnetic excitation beam (8), a measuring body (1) having a detection region (4), which is adjacent to a measuring surface (2) of the measuring body (1) and has a pressure-dependent or temperature-dependent specific electrical resistance and/or generates electrical, in particular piezoelectric, voltage signals in the event of pressure or temperature changes, and comprising a device for analyzing the substance on the basis of detected signals.Type: GrantFiled: December 4, 2018Date of Patent: April 2, 2024Assignee: DIAMONTECH AGInventors: Thorsten Lubinski, Uwe Schriek
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Patent number: 11639894Abstract: A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.Type: GrantFiled: January 4, 2021Date of Patent: May 2, 2023Assignee: DiaMonTech AGInventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
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Patent number: 11280728Abstract: The invention relates, inter alia, to a device (10) for analysing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), particularly an excitation light beam, with at least one excitation wavelength, and further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analysing the material on the basis of the detected reaction signal (SR).Type: GrantFiled: December 7, 2016Date of Patent: March 22, 2022Assignee: DiaMonTech AGInventors: Alexander Bauer, Otto Hertzberg, Thorsten Lubinski
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Patent number: 10883933Abstract: The invention relates to analyzing a substance. An optical medium is arrange on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.Type: GrantFiled: June 16, 2015Date of Patent: January 5, 2021Assignee: DiaMonTech AGInventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
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Patent number: 10876965Abstract: The invention relates, inter alia, to an apparatus (10) for analyzing a material (101), comprising an excitation emission device (100) for generating at least one electromagnetic excitation beam (SA), in particular an exciting light beam, having at least one excitation wavelength, further comprising a detection device (106) for detecting a reaction signal (SR), and a device (107) for analyzing the material on the basis of the detected reaction signal (SR).Type: GrantFiled: December 9, 2015Date of Patent: December 29, 2020Assignee: DiaMonTech AGInventors: Alexander Bauer, Otto Hertzberg, Thorsten Lubinski