Abstract: A circuit for testing a high speed data bus comprises a test port, a data bus port, a signal generator, a polarity monitor, and an attenuation monitor. The test port is coupled to a test controller. The data bus port is coupled to the data bus. The signal generator may generate a test signal to the data bus port at a first voltage level with a duty cycle of fifty percent or greater. The polarity monitor may receive the test signal from the data bus port and generate a voltage that is proportional to the duty cycle and indicative of a polarity of a portion of the data bus. The attenuation monitor may receive the test signal from either the signal generator or the data bus port and determine a second voltage level of the received test signal, with the second voltage level being communicated to the test port.

Abstract: A circuit for testing a high speed data bus comprises a test port, a data bus port, a signal generator, a polarity monitor, and an attenuation monitor. The test port is coupled to a test controller. The data bus port is coupled to the data bus. The signal generator may generate a test signal to the data bus port at a first voltage level with a duty cycle of fifty percent or greater. The polarity monitor may receive the test signal from the data bus port and measure a voltage proportional to the duty cycle to determine a polarity of a portion of the data bus, with the voltage level representative of the polarity being communicated to the test port. The attenuation monitor may receive the test signal from either the signal generator or the data bus port and determine a second voltage level of the received test signal, with the second voltage level being communicated to the test port.

Abstract: An adapter for connecting a wiring cable to be tested to a wiring analyzer. The adapter includes a body; a first set of contacts positioned on a first side of the body for electrically connecting with the wiring analyzer; and a second set of contacts positioned on a second side of the body and electrically connected to the first set of contacts for connecting with a connector on the cable to be tested. The first and second sides of the body are less than 4 inches apart so that the first set of contacts is positioned less than 4 inches from the second set of contacts. The body may include hanging structure for hanging the adapter on an interface of the wiring analyzer and a latch for securing the adapter to the interface.

Abstract: A fiber optic tester (10) broadly comprises a testing unit (16) to take measurements across two test points (27), a processing unit (18) to locate faults by analyzing the measurements, a switching unit (20) that can connect termination points (13) of a electrical circuit (12) to the test points (27) in a sequence controlled by the processing unit (18), and a fiber unit (22) to test a optical circuit (14). The tester (10) may also include an electrical harness (24) or an optical harness to connect the electrical circuit (12) to the switching unit (20) or the optical circuit (14) to the fiber unit (22). The processing unit (18) is preferably programed with interconnection information of the circuits (12,14) and internal characteristics of the tester (10). Using the interconnection information and the internal characteristics, the processing unit (18) may accurately detect faults within the circuits (12,14).

Abstract: A fiber optic tester (10) broadly comprises a testing unit (16) to take measurements across two test points (27), a processing unit (18) to locate faults by analyzing the measurements, a switching unit (20) that can connect termination points (13) of a electrical circuit (12) to the test points (27) in a sequence controlled by the processing unit (18), and a fiber unit (22) to test a optical circuit (14). The tester (10) may also include an electrical harness (24) or an optical harness to connect the electrical circuit (12) to the switching unit (20) or the optical circuit (14) to the fiber unit (22). The processing unit (18) is preferably programed with interconnection information of the circuits (12, 14) and internal characteristics of the tester (10). Using the interconnection information and the internal characteristics, the processing unit (18) may accurately detect faults within the circuits (12, 14).

Abstract: A fiber optic tester (10) broadly comprises a testing unit (16) to take measurements across two test points (27), a processing unit (18) to locate faults by analyzing the measurements, a switching unit (20) that can connect termination points (13) of a electrical circuit (12) to the test points (27) in a sequence controlled by the processing unit (18), and a fiber unit (22) to test a optical circuit (14). The tester (10) may also include an electrical harness (24) or an optical harness to connect the electrical circuit (12) to the switching unit (20) or the optical circuit (14) to the fiber unit (22). The processing unit (18) is preferably programed with interconnection information of the circuits (12, 14) and internal characteristics of the tester (10). Using the interconnection information and the internal characteristics, the processing unit (18) may accurately detect faults within the circuits (12, 14).

Abstract: A self-compensating fault locator (10) broadly comprises a testing unit (16) to take measurements across two test points (18), a processing unit (20) to locate faults by analyzing the measurements, and a switching unit (22) that can connect termination points (14) of an electrical circuit (12) to the test points (18) in a sequence controlled by the processing unit (20). The fault locator (10) may also include a harness (24) to connect the electrical circuit (12) to the switching unit (22). The processing unit (20) is preferably programed with the electrical circuit's (12) interconnection information. The processing unit (20) also preferably stores internal characteristics of the fault locator (10). Using the interconnection information and the internal characteristics, the processing unit (20) may accurately locate faults within the electrical circuit (12). Additionally, the processing unit (20) may locate faults within the fault locator (10) and/or the harness (24).

Abstract: Improved testing fixture apparatus for use in accurately effecting temporary electrical connections with the test point zones of printed circuit boards or the like is provided in which the board to be tested is mounted upon a locator assembly that is shiftably receivable within the fixture and includes a centering and gripping mechanism operative in conjunction with a cooperative part carried by the contact bearing portion of the fixture for automatically positioning the locator assembly and printed circuit board carried by the latter in a predetermined location within the fixture assuring precise alignment of a contact with each of the test point zones of the printed circuit board to be tested.

Abstract: An improved construction is provided for interfacing board type interconnect system apparatus for use in effecting a multiplicity of concurrent, respective, electrical connections with closely spaced, typically irregularly arranged, contactable, electrically conductive zones of a printed circuit board or the like, such as is required, for example, in the testing of such devices. The apparatus employs a preferably laminated assembly of stacked, electrically insulative plates, including support plates pre-drilled to provide a matrix of relatively small and closely spaced holes for mounting spring pin type contactor assemblies and backing plates for physical reinforcement of the support plates and pre-drilled to provide a matrix of relatively larger and less closely spaced openings each communicating with a plurality of the mentioned holes to present a clearance path for electrical leads associated with the contactor assemblies.

Abstract: Apparatus having special utility for the electrical interfacing of multi-terminal circuit testing equipment to multi-contact printed circuit boards or the like employs a fluid pressure responsive, resiliently flexible diaphragm for controllably effecting concurrent, individual, substantially equal force engagements between shiftable, rigid contacting elements and corresponding stationary contact points on the unit to be tested, despite possible lack of precise co-planarity of such contact points. The arrangement is space conserving and permits the elimination of expensive and troublesome spring contact pins, the utilization of desirable wirewrap connection techniques in fabricating interfacing assemblies, and the convenient disposition of all points of electrical contact with both the testing equipment and the unit under test at one side of the interfacing assembly.