Abstract: Measurement probe (1) is used for measuring thin layers (19) on base material (20) using a magnetic or eddy current process. On probe housing (5) above a stop for guide means (3) with measurement sensor (12) and measurement pole (13) sliding element (2) for measurement sensor (12) is guided to move in the longitudinal axis of probe housing (5) as limited by a stop. Between sliding element (2) and stop (9) on guide means (3) there is first helical spring (4) by which sliding element (2) is elastically supported relative to measurement sensor (12). Between stop (9) on guide tube (3) and lower abutment (30) on probe housing (5) is second helical spring (10) which interacts with first helical spring (4) and elastically supports measurement sensor (12) in the rest state at a distance above opening (5a) for measurement pole (13) in probe housing (5).