Patents Assigned to El-Mul Technologies Ltd.
  • Patent number: 6992300
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: January 31, 2006
    Assignees: Yeda Research and Development Co., Ltd, El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Patent number: 6989542
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Grant
    Filed: May 6, 2004
    Date of Patent: January 24, 2006
    Assignees: Yeda Research and Development Co., Ltd., El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Publication number: 20050056779
    Abstract: An ion detector having a planar electrically conducting entrance plate, a converter assembly including a planar electrically conducting converter plate and a converter member for providing free electrons upon impact of ions, a planar electrically conducting exit plate having an exit window, a magnet assembly, and an electron detection assembly. The planes of the converter plate and the entrance plate are parallel and electrically biasable in order to provide a homogeneous electric field. The magnet assembly provides a homogenous magnetic field between the converter plate and the exit plate, the magnetic field extending parallel to the plane of the converter plate. The ratio between the electric and the magnetic field is such that the electrons emitted from the converter plate travel to the exit window and are detected by the electron detection assembly.
    Type: Application
    Filed: July 29, 2004
    Publication date: March 17, 2005
    Applicant: El-Mul Technologies, Ltd.
    Inventors: Eli Chefetz, Armin Schon
  • Publication number: 20040217297
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Application
    Filed: May 6, 2004
    Publication date: November 4, 2004
    Applicants: YEDA RESEARCH AND DEVELOPMENT CO. LTD., EL-MUL TECHNOLOGIES LTD.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Publication number: 20040046120
    Abstract: A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said vacuum. The chamber is useful for allowing wet samples including living cells to be viewed under an electron microscope.
    Type: Application
    Filed: May 27, 2003
    Publication date: March 11, 2004
    Applicants: Yeda Research and Development Co., Ltd., El-Mul Technologies Ltd.
    Inventors: Elisha Moses, Ory Zik, Stephan Thiberge
  • Patent number: 6512235
    Abstract: A device that produces an electron beam with high optical quality for processing a sample, is presented. The optical quality is manifested by very high brightness and low energy spread. The device includes an electron source device comprising an electrode in the form of a shaped first layer, preferably in the form of a conducting crater carrying at least one nanotube, and an extracting electrode, which is formed with at least one aperture and is insulated from the firs layer. The source can be used in any column that requires such properties. The column according to the invention may be a full size or a miniature electron microscope, a lithography tool, a tool used for direct writing of wafers or a field emission display.
    Type: Grant
    Filed: May 1, 2000
    Date of Patent: January 28, 2003
    Assignee: El-Mul Technologies Ltd.
    Inventors: Guy Eitan, Ory Zik, David Rosenblatt
  • Patent number: 5990483
    Abstract: A particle detector for an electron microscope, a mass spectrometer or the like comprises a single flat plate electron multiplier such as a micro-channel plate or a micro-sphere plate followed by a scintillator. The use of the electron multiplier prior to the scintillator compensates for lack of efficiency in passing photons from the scintillator. The output voltage of the scintillator can be freely set.
    Type: Grant
    Filed: October 6, 1997
    Date of Patent: November 23, 1999
    Assignee: El-Mul Technologies Ltd.
    Inventors: Isaac Shariv, Yiftach Karni