Patents Assigned to EMPA Eidg. Materialprufungs- und Forschungsanstalt
  • Patent number: 10648455
    Abstract: A flying apparatus is provided that comprises a airfoil (1) with a streamlined profile for generating an aerodynamic lift force vector (L) acting on the flying apparatus when being exposed to an apparent air flow. The flying apparatus also comprises at least three drive units (4, 42; 5, 51; 6, 61) being adapted to generate a resulting thrust force vector acting on the flying apparatus, the thrust force vector being alignable essentially in parallel with the aerodynamic lift force vector (L). For controlling the aerodynamic pitch of the flying apparatus, the flying apparatus comprises at least one control surface (31, 11). Furthermore, the flying apparatus has an aerodynamic neutral point (NP) that lies, along the longitudinal centre axis (10) and in the direction from the leading edge (17) to the trailing edge (18) of the airfoil (1), behind the centre of gravity (CG) of the flying apparatus.
    Type: Grant
    Filed: October 13, 2015
    Date of Patent: May 12, 2020
    Assignees: TwingTec AG, EMPA Eidg. Materialprüfungs- und Forschungsanstalt
    Inventors: Rolf Luchsinger, Flavio Gohl
  • Publication number: 20150136220
    Abstract: Conventionally, CdTe solar cells are grown in superstrate configuration where the light enters the photovoltaic device through a transparent substrate. Still, efficiencies of CdTe solar cells grown in substrate configuration have so far been considerably lower than those grown in superstrate configuration. This invention discloses a photovoltaic device (0) in substrate configuration and a process of making thereof with which efficiencies approaching those of superstrate devices can be reproducibly achieved. Furthermore, long term stability is expected to be better than in state of the art devices. This method is advantageous because the growth in substrate configuration offers several advantages like the growth on metal foils and a more precise control of the junction.
    Type: Application
    Filed: May 31, 2013
    Publication date: May 21, 2015
    Applicant: EMPA EIDG. MATERIALPRÜFUNGS-UND FORSCHUNGSANSTALT
    Inventors: Lukas Kranz, Christina Gretener, Julian Perrenoud, Stephan Buecheler, Ayodhya N. Tiwari
  • Publication number: 20130146758
    Abstract: A sample support plate (100) for a variety of possible applications, including MALDI mass spectrometry, is disclosed. A plurality of spatially separated sample recipient sites (101) are arranged on the surface of a substrate. The recipient sites are mutually separated by areas having a different wettability than the recipient sites. They are arranged in a plurality of rows consisting of a plurality of recipient sites whose centers are regularly spaced along a first direction with a predetermined periodicity (D1), the rows being regularly spaced along a second direction perpendicular to the first direction with a predetermined centerline distance (D2). Each recipient site has a maximum lateral dimension that is preferably smaller than the diameter of a beam spot (104) of a desorption laser beam (103).
    Type: Application
    Filed: May 20, 2011
    Publication date: June 13, 2013
    Applicants: EMPA EIDG. MATERIALPRUFUNGS-UND FORSCHUNGSANSTALT, EIDGENOSSISCHE TECHNISCHE HOCHSCHULE ZURICH
    Inventors: Pawel Urban, Renato Zenobi, Konstantins Jefimovs, Andrea Amantonico, Stephan Fagerer, Nils Goedecke
  • Publication number: 20040016880
    Abstract: The method relates to the preparation of a TEM lamella from a structured sample, in particular of a microelectronic device, which has a location to be examined, situated at an unknown position. Firstly, the structural element within which the region to be examined is situated is prelocalized. Afterwards, the TEM lamella is sectioned by means of an ion beam of an FIB apparatus with a thickness such that the entire structural element is contained in the TEM lamella. This method considerably increases the probability that the location to be examined will actually be situated in the TEM lamella, without the sample or lamella having to be transported too often.
    Type: Application
    Filed: April 15, 2003
    Publication date: January 29, 2004
    Applicant: EMPA Eidg. Materialprufungs- und Forschungsanstalt
    Inventors: Joachim Reiner, Philippe Gasser