Abstract: A testing fixture which facilitates inexpensive, high-speed dynamic testing of electronic devices without subjecting the electrical leads of the devices to damage includes a first carrier plate having a plurality of electrical contacts associated with respective electrical leads of the electronic device which is to be tested, the first carrier plate including electrical conductors electrically connected with the electrical contacts for supplying power to the electronic device and for monitoring signals from the electronic device during testing, and a second carrier plate secured to the first carrier plate, the second carrier plate including abutment surfaces which overlie the electrical contacts on the first carrier plate to retain the electrical leads on the electronic device between the electrical contacts on the first carrier plate and the abutment surfaces on the second carrier plate during testing of the electronic device.

Abstract: A thermal shock insert or adaptor is used with an environmental chamber to provide a facility for conducting thermal shock testing. The thermal shock adaptor has a cabinet defining an interior specimen chamber. A chamber opening is provided through the cabinet and a specimen platform which is movable relative to the cabinet is provided to receive and support a test specimen and to move the specimen through the chamber opening, between a first position in which the specimen is contained within the specimen chamber and a second position in which the specimen is contained within the environmental chamber with which the thermal shock adaptor is used. The thermal shock adaptor is also provided with a high temperature plenum, heating coils, and a high temperature controller, all operatively connected with the specimen chamber to maintain the specimen chamber at a selected temperature in accordance with predetermined specifications.