Patents Assigned to Ether Capital Corporation
  • Patent number: 10732249
    Abstract: A method of calibrating or correcting near field or far field data from a scanner board array of integrated measuring probes that are electronically switched to capture near-field data from an antenna-under-test (AUT) and having a board output includes the steps of coupling a calibrating probe with one of the measuring probes, measuring the power through the measuring probe and the calibrating probe and isolating the effect of the RF path from the measuring probe to the board output by removing the effect of the calibrating probe, and repeating for each measuring probe. Also disclosed are methods for correcting for scattering effects and loading effects on the AUT.
    Type: Grant
    Filed: November 10, 2015
    Date of Patent: August 4, 2020
    Assignee: Ether Capital Corporation
    Inventors: Ruska Patton, Kasra Payandehjoo