Abstract: The invention comprises: a rest base (1) for a sample (2) to be examined, at least a first and a second optical systems (3, 4), identifying two optical paths located at a predetermined distance one from another. The at least a first and a second optical systems (3, 4) are commandable and are able to focus, with a predetermined enlargement, on two ends of the sample (2). The at least a first and a second optical systems (3, 4) are arranged and maintained on parallel planes which are also parallel to the rest base (1). The invention also comprises at least a monitoring and measuring device able to gather images sent by the at least a first and a second optical systems (3, 4). The apparatus is structured to carry out measurements of dimensions of a sample (2) while completely eliminating any influence on the measurements by the measuring system and the rest base for the sample.

Abstract: The invention comprises: a rest base (1) for a sample (2) to be examined, at least a first and a second optical systems (3, 4), identifying two optical paths located at a predetermined distance one from another. The at least a first and a second optical systems (3, 4) are commandable and are able to focus, with a predetermined enlargement, on two ends of the sample (2). The at least a first and a second optical systems (3, 4) are arranged and maintained on parallel planes which are also parallel to the rest base (1). The invention also comprises at least a monitoring and measuring device able to gather images sent by the at least a first and a second optical systems (3, 4). The apparatus is structured to carry out measurements of dimensions of a sample (2) while completely eliminating any influence on the measurements by the measuring system and the rest base for the sample.

Abstract: The apparatus comprises: a holder for a test piece; at least two optical systems, identifying two optical paths located at a predetermined and known reciprocal distance, which are able to focalize, with a predetermined degree of magnification, images of two ends of the test piece; the at least two optical systems being aligned with the holder; at least one viewing and measuring device able to collect the images which are focalized by the at least two optical systems. The apparatus is structured to perform measurement of a size of a test piece while completely eliminating any influence on such measurement on the part of the holder or the measuring system.