Patents Assigned to FLIR Systems Boston, Inc.
  • Patent number: 6991765
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Grant
    Filed: February 5, 2001
    Date of Patent: January 31, 2006
    Assignee: FLIR Systems Boston, Inc.
    Inventors: Andy C. Neilson, Jay S. Teich
  • Patent number: 6835574
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Grant
    Filed: February 5, 2001
    Date of Patent: December 28, 2004
    Assignee: FLIR Systems Boston, Inc.
    Inventors: Andy C. Neilson, Michael R. Sweeney, James D. Orrell, III, Michael W. Oster, John M. Hopkins, Marc Samson
  • Publication number: 20020146836
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Application
    Filed: February 5, 2001
    Publication date: October 10, 2002
    Applicant: FLIR Systems Boston, Inc.
    Inventors: Andy C. Neilson, Michael R. Sweeney, James D. Orrell, Michael W. Oster, John M. Hopkins, Marc Samson
  • Publication number: 20020132360
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Application
    Filed: January 17, 2001
    Publication date: September 19, 2002
    Applicant: FLIR Systems Boston, Inc.
    Inventors: Andy C. Neilson, Jay S. Teich
  • Publication number: 20020098592
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Application
    Filed: February 5, 2001
    Publication date: July 25, 2002
    Applicant: FLIR Systems Boston, Inc.
    Inventors: Andy C. Neilson, Jay S. Teich
  • Publication number: 20020098593
    Abstract: Apparatus and methods for performing calorimetry. The apparatus include optical devices for detecting thermal processes and multiwell sample plates for supporting samples for use with such optical devices. The methods include measurement strategies and data processing techniques for reducing noise in measurements of thermal processes. The apparatus and methods may be particularly suitable for extracting thermal data from small differential measurements made using an infrared camera and for monitoring chemical and physiological processes.
    Type: Application
    Filed: February 5, 2001
    Publication date: July 25, 2002
    Applicant: FLIR Systems Boston, Inc.
    Inventors: Andy C. Nelson, Jay S. Teich