Patents Assigned to Focus GmbH
  • Double reflection electron emission microscope
    Patent number: 5969356
    Abstract: Described is an electron microscope, with which different study modes can be conducted. An electron reflector is mounted in the rear focal plane of the objective lens or in one of its conjugate planes and oriented in such a manner that the primary beam coming from the electron source is focused on the specimen to be studied. The reflector tip can be made of a monocrystal or a polycrystalline material.
    Type: Grant
    Filed: November 22, 1996
    Date of Patent: October 19, 1999
    Assignee: Focus GmbH
    Inventor: Krzystoph Grzelakowski