Patents Assigned to GE Inspection Technologies
  • Patent number: 11639872
    Abstract: Systems, methods, and computer readable medium are provided for determining interferometric data and spectral data associated with combustion conditions of a flame in a combustion chamber using a sensor head including a first vacuum cavity, a diaphragm operatively interfaced to an inner portion of the combustion chamber, and an optical sensor interrogator configured on a computing device and coupled to the sensor head via optical fibers. The optical sensor interrogator including an interferometer configured to determine interferometric data associated with the flame based on light transmitted and reflected via a first optical fiber and a spectrometer configured to determine spectral data associated with the flame based on light transmitted via a second optical fiber.
    Type: Grant
    Filed: April 3, 2020
    Date of Patent: May 2, 2023
    Assignee: GE Inspection Technologies, LP
    Inventor: Michael Charles Spalding
  • Patent number: 11209807
    Abstract: A method includes receiving a first time-dependent data characterizing measurement by a first sensor operatively coupled to an oil and gas industrial machine; determining a first anomaly score associated with a first portion of the first time-dependent data over a time period, the determination is based on a first value of an operating characteristic over the time period and a second value of the operating characteristic over the time period, wherein the first value of the operating characteristic is calculated from the first time-dependent data and the second value of the operating characteristic is detected at the oil and gas industrial machine; and rendering, in a graphical user interface display space, a visual representation indicative of the first anomaly score. Related apparatus, systems, articles, and techniques are also described.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: December 28, 2021
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventors: Arun Karthi Subramaniyan, Michael Kennedy, Haiming Zhao, Fabio Nonato de Paula, Imran Younus
  • Patent number: 10990846
    Abstract: Data characterizing a load on a rod of a down-hole pump at different positions of a stroke of the rod can be received. An image characterizing the load of the rod at the different positions of the stroke can be determined. A defect in operating conditions of the down-hole pump can be determined. The determining can include comparing the image to a set of predetermined images with associated defects. The determined defect can be provided.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: April 27, 2021
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventors: Mahadevan Balasubramaniam, Shyam Sivaramakrishnan, Arun Karthi Subramaniyan
  • Patent number: 10976903
    Abstract: A method can include receiving data characterizing a first property of an asset over a first time period. The method can also include receiving data characterizing user interaction with an interactive graphical object. The method can further include determining, by a predictive model, data characterizing the first property of the asset over a second time period. The determining can be based in part on the received data characterizing the user interaction. The method can also include rendering, in a graphical display space, one or more of a first plot of the received data characterizing the first property over the first time period and a second plot of the determined data characterizing the first property over the second time period.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: April 13, 2021
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventors: Bobby Dale Hournbuckle, Jr., Matthew Harvey Krohn, Mark Rosenberg, Tara Merry, Naren Pradyumna Dasu, Mary Campos, Williams Garcia, Grigory Nudelman
  • Patent number: 10975668
    Abstract: The current subject matter is related to optimizing resource (e.g., steam) allocation within steam assisted gravity drainage (SAGD) system, and predicting future oil production from production wells of the SAGD system. In some embodiments data characterizing a hypothetical rate of steam injection into injection wells of the SAGD system can be applied within a capacitance resistance model (CRM) to determine an estimated rate of future fluid production, the fluid being a mixture of oil and water. An emulsion viscosity, as well as the estimate rate of future fluid production, can be applied within a Koval fractional flow model to determine an estimate rate of future oil production. In some cases, the hypothetical rate of steam injection can be optimized based on an optimization objective, e.g., a steam-to-oil ratio (SOR).
    Type: Grant
    Filed: March 29, 2018
    Date of Patent: April 13, 2021
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventors: Guoxiang Liu, Mahendra Joshi, Robert Klenner, Glen Murrell, Steven Azzaro
  • Patent number: 10883358
    Abstract: An insertion tool can include: a housing having proximal and distal ends with a sealed chamber therebetween, the distal end having a flange configured to engage with a flange of a valve assembly coupled to a pressurized vessel to allow the sealed chamber to fluidly communicate with the pressurized vessel; a hollow inner shaft slidably disposed through a proximal opening in the proximal end of the housing, through the sealed chamber, and through a distal opening in the distal end of the housing such that the inner shaft is operable to be advanced distally into the valve assembly toward an interior portion of the pressurized vessel, the inner shaft having an inner lumen that is sealed from the sealed chamber of the outer housing and that is configured to receive an inspection tool therein; and an optically transparent member disposed at a distal end of the inner shaft.
    Type: Grant
    Filed: April 12, 2019
    Date of Patent: January 5, 2021
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventor: Manuel Kenneth Bueno
  • Patent number: 10817152
    Abstract: A method can include receiving data identifying an industrial asset. The method can also include receiving data characterizing one or more sensors configured to detect a first property of the asset. The method can further include determining a first graphical representation of the asset based on the received data identifying the industrial asset, and a second graphical representation of a first sensor of the one or more sensors based on the received data characterizing one or more properties of one or more sensors. The method can further include rendering, in a graphical display space, the first graphical representation and the second graphical representation. One or more visual properties of the second graphical representation can be indicative of one or more properties of the first sensor and/or the detected first property of the asset.
    Type: Grant
    Filed: September 11, 2018
    Date of Patent: October 27, 2020
    Assignee: GE Inspection Technologies, LP
    Inventors: Bobby Dale Hournbuckle, Jr., Matthew Harvey Krohn, Mark Rosenberg, Tara Merry, Naren Pradyumna Dasu, Mary Campos, Williams Garcia, Grigory Nudelman
  • Patent number: 10754516
    Abstract: The current subject matter provides a GUI that includes an improved navigation bar for visualizing information related to a data set. The navigation bar can allow a user to navigate through, scroll, and/or selectively visualize, certain data within the data set, while also providing visual representations of values recorded within the data set. In one embodiment, the navigation bar can include multiple sections/segments that can correspond to different groups of subsets of the data set. The subsets can be grouped based on values of a particular property/variable recorded in the data set. Colors of each segment of the navigation bar can correspond to values of the property in each group, thereby providing a user with summarized information about the data set. The navigation bar can eliminate a need for additional discrete graphical objects (e.g., charts, graphs, tables, etc.) that would otherwise be used to provide summarized information to the user.
    Type: Grant
    Filed: June 5, 2018
    Date of Patent: August 25, 2020
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventors: Bright Tzeng, Min Chang, James Lee
  • Patent number: 10539515
    Abstract: Method and apparatus are provided for calibration or verification of accuracy specification of a computed tomographic system. In one embodiment, the apparatus can include a base structure, a first set of test objects arranged along a first axis and coupled to the base structure, and a second set of test objects arranged along a second axis and coupled to the base structure. The first set of test objects and the second set of test objects have a first geometry. The apparatus can also include a third set of test objects and a fourth set of test objects. The third set of test objects, and the fourth set of test objects have a second geometry different from the first geometry. Locations of the first, second third and fourth set of test objects are spatially fixed with respect to the base structure. The apparatus is a test specimen adapted for calibration or accuracy verification of computed tomography system.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: January 21, 2020
    Assignee: GE Inspection Technologies, LP
    Inventors: Andreas Fischer, Nils Rothe, Alexander Suppes, Eugen Trapet
  • Publication number: 20190121801
    Abstract: Systems, methods, and a computer readable medium are provided for generating recommendations based on semantic knowledge capture. Event data generated by domain-specific entities can be received, formatted, and aggregated so that ontological mappings can be applied to generate domain-specific event data. The ontological mappings identify relationships associated with the event data generated by two or more communicatively coupled domain-specific entities. A graph can be generated based on the domain-specific event data and provided to a user via a GUI. The graph can include nodes representing domain-specific entities and a edges representing one or more contextual relationships between two or more nodes sharing event data. The user can provide query input via the GUI to generate an updated graph corresponding to the query input. Recommendations can be provided to the user based on the query input and the contents of the updated graph.
    Type: Application
    Filed: October 17, 2018
    Publication date: April 25, 2019
    Applicant: GE Inspection Technologies, LP
    Inventors: Piyush Jethwa, Arun Karthi Subramaniyan, Alexandre Nikolov Iankoulski
  • Patent number: 8810636
    Abstract: A control signal for selectively outputting a frame of image data can be initiated using an inspection apparatus, and an inspection apparatus can process one or more frames of image data for determining a motion parameter. Responsively to the processing, the inspection apparatus can selectively output a frame of image data, improving the quality of a frame of image data output subsequently to an initiation of a control signal to selectively output a frame of image data.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: August 19, 2014
    Assignee: GE Inspection Technologies, LP
    Inventor: Clark A. Bendall
  • Patent number: 8767060
    Abstract: An inspection apparatus can include a handset and an elongated inspection tube extending from the handset. For reduction of heat energy radiating from one or more components of the apparatus, the apparatus can include a particularly designed heat sink assembly.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: July 1, 2014
    Assignee: GE Inspection Technologies, LP
    Inventors: Joshua Lynn Scott, Marjorie L. Buerkle, James J. Delmonico, Thomas W. Karpen, Joseph V. Lopez
  • Patent number: 8760447
    Abstract: A method of determining the profile of a surface of an object is disclosed that does not require that the video inspection device be at a certain angle relative to the surface when an image of the surface is obtained (e.g., allows non-perpendicular captures of the image 30). The method determines a reference surface and a reference surface line. The reference surface line is then used to determine a surface contour line on the surface of the object. The profile is then determined by determining the distances between the reference surface and the surface contour line.
    Type: Grant
    Filed: February 26, 2010
    Date of Patent: June 24, 2014
    Assignee: GE Inspection Technologies, LP
    Inventors: Clark Alexander Bendall, Michael M. Ball
  • Patent number: 8680852
    Abstract: A method of detecting defects using eddy currents is disclosed. The method comprises: exciting eddy currents in a test material using an eddy current probe driven by a drive signal; detecting induced eddy currents in the test material; converting the detected signal into integer values using an analog to digital converter; and adding or subtracting the generated integer values to or from each of two accumulators, or taking no action, so that one accumulator produces a value proportional to one component of the detected signal and the other produces a value proportional to another component of the detected signal and using these values to detect the presence of a defect.
    Type: Grant
    Filed: February 6, 2009
    Date of Patent: March 25, 2014
    Assignee: GE Inspection Technologies Ltd.
    Inventors: Alan Daly, Xiaoyu Qiao, Ian Christopher Mayes, John Hansen
  • Patent number: 8625434
    Abstract: An inspection apparatus can be provided in a system with a workstation computer. In one embodiment, the inspection apparatus can include a user interface enabling the inspection apparatus to initiate, responsively to an action by an inspector, an IP based voice communication connection with an external computer of the system. In one embodiment, the inspection apparatus and the workstation computer can be in communication with a central server that can receive data collected by said the inspection apparatus and can receive data requests from the workstation computer.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: January 7, 2014
    Assignee: GE Inspection Technologies LP
    Inventors: Bradford Morse, Thomas D. Britton, James Jonathon Delmonico
  • Patent number: 8596127
    Abstract: The invention relates to a method for processing signals which are generated by the reflection of ultrasonic waves by defects in the surface of objects during the non-destructive testing of objects such as pipes, bars, sheet metal, or uniform and complex carbon-fiber components. Said method comprises the following steps: emission of a complete wavefront onto at least one test section of the object, using a plurality of independent emission elements; receiving a wave reflected by the structure of the object by means of a plurality of receiver elements that are independent of one another; digitalization of the signals received by the receiver elements in digitizing steps; continuous modification of delay values and/or the number of receiver elements for each digitalization step (on-the-fly).
    Type: Grant
    Filed: May 28, 2009
    Date of Patent: December 3, 2013
    Assignee: GE Inspection Technologies
    Inventors: Stephan Falter, Roman Koch, Walter De Odorico, Gerhard Finger, Klaus-Peter Busch
  • Publication number: 20130317295
    Abstract: An apparatus for use as a light assembly in remote visual inspection devices is provided. The light assembly may consist of a laser diode coupled to a fiber optic bundle that transmits collimated laser light onto a wavelength converter located in the distal end of the remote video inspection system. Wavelength converters consisting of phosphorescent materials can be used to convert collimated laser light into white light for inspection illumination purposes.
    Type: Application
    Filed: December 29, 2006
    Publication date: November 28, 2013
    Applicant: GE Inspection Technologies
    Inventor: Bradford Morse
  • Patent number: 8514278
    Abstract: An inspection apparatus can comprise at least one light source for illuminating a target. The at least one light source can be disposed and/or controlled in such manner as to reduce a heat generation by the at least one light source and in such manner as to reduce a power consumption of the at least one light source.
    Type: Grant
    Filed: December 29, 2006
    Date of Patent: August 20, 2013
    Assignee: GE Inspection Technologies LP
    Inventors: Thomas W. Karpen, Bradford Morse, James Jonathon Delmonico
  • Patent number: 8434936
    Abstract: A method for performing ultrasonic testing comprising, in one embodiment, the steps of firing an ultrasonic transducer to generate an ultrasonic pulse that passes through a delay line, measuring a delay echo time of flight, and determining the temperature of the delay line using the delay echo time of flight, thereby eliminating the need for additional temperature measuring devices. Other embodiments further comprise the step of using the temperature of the delay line to determine the temperature of a test object, and using the temperature of the test object to determine a thickness of the test object that is compensated for thermal expansion and temperature dependent ultrasonic velocity.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: May 7, 2013
    Assignee: GE Inspection Technologies, LP
    Inventors: John Michael Cuffe, James Barshinger, Ying Fan
  • Patent number: D868802
    Type: Grant
    Filed: June 1, 2018
    Date of Patent: December 3, 2019
    Assignee: GE INSPECTION TECHNOLOGIES, LP
    Inventors: Bright Tzeng, Min Chang, James Lee