Abstract: A test circuit and apparatus that meets requirements of Human Body Model electrostatic discharge sensitivity testing of microelectronic components that can properly test high voltage and unconnected pins is disclosed. “No Connect” pins were exempted from HBM testing by some testing standards due to prior art testers producing unintended overstress. A HBM tester has been invented that reduces this overstressing to levels were valid testing of integrated circuit No Connect pins and pins with high voltage ESD clamping protection is possible.

Abstract: An approach for transmission line pulse and very fast transmission line pulse reflection control is provided. The approach includes using a power splitter to split an incident pulse into two identical pulses with one going to a device under test (DUT) through a delivery cable and the other going down an open ended delay cable. The structure of the power splitter, along with having the delivery cable and the open ended delay cable with the same signal propagation time and pulse transmission characteristics enable the canceling of pulse reflections from the DUT.