Abstract: A computing device includes a memory array built of several sections having memory cells arranged in rows and column, at least one cell in each column of the memory array being connected to a bit line; and at least one multiplexer to connect a bit line in a first column of a first section to a bit line in a second column in a second section different from the first section, where the second column is not continuous with the first column ; and a decoder to activate at least two word lines of the first section and a word line connected to a cell in the second column in the second section to write a bit line voltage associated with a result of a logical operation performed on the first column into the cell in the second column.

Abstract: Systems and methods of memory and memory operation are disclosed, such as providing a circuit including a local address driver voltage source for memory decoding. In one exemplary implementation, an illustrative circuit may comprise a first buffer and a capacitor. The first buffer may comprise a power input and a ground input. The capacitor may comprise a first terminal connected to the power input of the first buffer and a second terminal connected to the ground input of the first buffer. When the first buffer draws a current from the power input, at least a portion of the current may be supplied by the capacitor.

Abstract: Multi-bank SRAM devices, systems, methods of operating multi-bank SRAMs, and/or methods of fabricating multi-bank SRAM systems are disclosed. For example, illustrative multi-bank SRAMs and methods may include or involve features for capturing read and write addresses at a particular frequency, splitting and/or combining them via one or more splitting/combining processes, and bussing them to each SRAM bank, where they may be split and/or combined via one or more splitting/combining processes to read and write to a particular bank. Some implementations herein may also involve features for capturing two beats of write data at a particular frequency, splitting and/or combining them via one or more splitting/combining processes, and bussing them to each SRAM bank, where they may be split and/or combined via one or more splitting/combining processes for writing to a particular bank. Reading and writing to banks may occur at less than or equal to half the frequency of capture.

Abstract: Systems and methods involving phase-locked-loop (PLL) circuitry are disclosed. In one illustrative implementation, a PLL circuit device may comprise voltage controlled oscillator (VCO) circuitry having a bias signal that sets a frequency range, circuitry that shifts the VCO circuitry to operate in one of the frequency ranges, and other circuitry to compare/calibrate signals and/or set the bias current. According to further implementations, as a function of operation of the circuitry, an operating frequency range of the VCO circuitry may be shifted to a different operating frequency range, and closed-loop, continuous frequency range, auto-calibration or other features may be provided.

Abstract: A system may include a first inverter configured to invert a first data signal and a second inverter configured to invert a second data signal. A pull-up element may be coupled to an output of the first inverter on a first terminal and a power source on a second terminal, wherein the power source is also coupled to a pull-up element of a main output buffer. A pull-down element may b e coupled to an output of the second inverter on a first terminal and a ground on a second terminal, wherein the ground is also coupled to a pull-down element of the main output buffer.

Abstract: A multi-memory cell operator includes a non-destructive memory array, an activation unit and a multiple column decoder. The non-destructive memory array has first and second bit lines per column. The activation unit activates at least two cells in a column of the memory array at the same time thereby to generate multiple Boolean function outputs of the data and of complementary data of the at least two cells on the first bit line and different multiple Boolean function outputs of the data and of the complementary data on the second bit line. The multiple column decoder at least activates the first and second bit lines of multiple selected columns for reading or writing. The multiple column decoder also includes a write unit to write the output of the first bit line, the second bit line or both bit lines of the selected columns into the memory array.

Abstract: Systems and methods herein may include or involve control circuitry that detects missing edges of reference and/or feedback clocks and may block the next N rising edges of the feedback clock or reference clock, respectively. In some implementations, a phase frequency detector (PFD) circuit comprises first circuitry including an output that outputs a missing edge signal. The first circuitry may include components arranged to detect a missing rising edge of one or both of a reference clock signal and a feedback clock signal. Second circuitry is coupled to the first circuitry and may include components arranged to generate one or both of a reference clock blocking signal and a feedback clock blocking signal based on the missing edge signal. Further, in some implementations, the blocking of the next N rising edges of the opposite clock may effectively increase the positive gain of the PFD.

Abstract: Systems and methods of data inversion, circuitry, detection and/or schemes are disclosed. According to illustrative implementations, exemplary circuitry may include static detection or detection circuitry such as those involving static current sources to detect a threshold for data inversion, pre-conditioning of detection circuitry, and/or active detection circuitry or schemes. In some implementations, exemplary memory or data inversion circuitry may comprise a transistor array, a bias generator, and a sense amplifier, wherein the transistor array may comprise at least one pair of transistor circuits arranged so that an output of the transistor array is provided as a sum or function of signal/current outputs of at least some of the transistor circuits in the array. As set forth, various systems, methods and circuitry herein may posses only a 3 static gate delay, such that very high speed and/or fast flow-through is achieved.

Abstract: Systems and methods relating to memory and/or memory latching are disclosed. In one exemplary implementation, an illustrative memory device may include self-timed pulse generator circuitry, first input latch circuitry, read/write control circuitry, and second input latch circuitry. According to further implementations herein, fast address access for read and write may be provided in the same cycle via a self-timed pulse in the input latch circuit and/or via associated control/scheme from the control circuit.

Abstract: Systems and methods relating to memory and/or memory latching are disclosed. In one exemplary implementation, an illustrative memory device may include self-timed pulse generator circuitry, first input latch circuitry, read/write control circuitry, and second input latch circuitry. According to further implementations herein, fast address access for read and write may be provided in the same cycle via a self-timed pulse in the input latch circuit and/or via associated control/scheme from control circuitry.

Abstract: Systems and methods associated with phase frequency detection are disclosed. In one illustrative implementation, a phase frequency detection (PFD) circuit device may comprise first circuitry and second circuitry having a set input, a reset input, and an output, wherein the set input has a higher priority than the reset input, and additional circuitry arranged and operatively coupled to provide advantageous operation of the PFD circuit device. According to some implementations, for example, systems and methods with clock edge overriding reset features, extended detection range(s), and/or reduction of reverse charge after cycle slipping are provided.

Abstract: Systems and methods of synchronous memories and synchronous memory operation are disclosed. According to one illustrative implementation, a memory device is disclosed comprising memory circuitry having a memory output, the memory circuitry including a sense amplifier having a first output and a second output, a first data path coupled to the first output of the sense amplifier, the first data path including 2 latches/registers, and a second data path coupled to the second output of the sense amplifier, the second data path including a plurality latches/registers. In further implementations, various control circuitry, connections and control signals may be utilized to operate the latches/registers in the first and second data paths according to specified configurations, control, modes, latency and/or timing domain information, to achieve, for example, pipelined output latching and/or double data rate output.

Abstract: Systems, methods and fabrication processes relating to memory devices involving data bus inversion are disclosed. According to one illustrative implementation, a memory device may comprise a memory core, circuitry that receives a data bus inversion (DBI) bit associated with a data signal as input directly, without transmission through DBI logic associated with an input buffer, and circuitry that stores the DBI bit into the memory core, reads the DBI bit from the memory core, and provides the DBI bit as output. In further implementations, memory devices herein may store and process the DBI bit on an internal data bus as a regular data bit.

Abstract: Systems, methods and fabrication processes relating to dynamic random access memory (DRAM) devices involving data signals grouped into 10 bits are disclosed. According to one illustrative implementation a DRAM device may comprise a memory core, circuitry that receives a data bus inversion (DBI) bit associated with a data signal as input directly, without transmission through DBI logic associated with an input buffer, circuitry that stores the DBI bit into the memory core, reads the DBI bit from the memory core, and provides the DBI bit as output. In further implementations, DRAM devices herein may store and process the DBI bit on an internal data bus as a regular data bit.

Abstract: Systems and methods associated with control of clock signals are disclosed. In one exemplary implementation, there is provided a delay-lock-loop (DLL) and/or a delay/phase detection circuit. Moreover, such circuit may comprise digital phase detection circuitry, digital delay control circuitry, analog phase detection circuitry, and analog delay control circuitry. Implementations may include configurations that prevent transition back to the unlocked state due to jitter or noise.

Abstract: Systems and methods of memory and memory operation are disclosed, such as providing a circuit including a local address driver voltage source for memory decoding. In one exemplary implementation, an illustrative circuit may comprise a first buffer and a capacitor. The first buffer may comprise a power input and a ground input. The capacitor may comprise a first terminal connected to the power input of the first buffer and a second terminal connected to the ground input of the first buffer. When the first buffer draws a current from the power input, at least a portion of the current may be supplied by the capacitor.

Abstract: Systems and methods are disclosed involving adaptive power up features for high-speed synchronous RAM. In one exemplary implementation, there is provided a semiconductor device including a memory cell, power circuitry, and an output buffer with level shifting circuitry. Moreover, the device may include power circuitry comprised of a first power up circuit and a second power up circuit and/or level shifting circuitry comprised of a pull up level shift circuit and a pull down level shift circuit. Other implementations and specific circuit configurations are also disclosed.

Abstract: Implementations herein involve control I/O buffer enable circuitry and/or features of saving power in standby mode. In illustrative embodiments, aspects of the present innovations may be directed to providing low standby power consumption, such as providing low standby power consumption in high-speed synchronous SRAM and RLDRAM devices.

Abstract: Systems and methods are disclosed for increasing the performance of static random access memory (SRAM). Various systems herein, for example, may include or involve dual- or multi-pipe, multi-bank SRAMs, such as Quad-B2 SRAMs. In one illustrative implementation, there is provided an SRAM memory device including a memory array comprising a plurality of SRAM banks and pairs of separate and distinct pipes associated with each of the SRAM banks, wherein each pair of pipes may provide independent access to its associated SRAM bank.

Abstract: Systems and methods relating to memory and/or memory latching are disclosed. In one exemplary implementation, an illustrative memory device may include self-timed pulse generator circuitry, first input latch circuitry, read/write control circuitry, and second input latch circuitry. According to further implementations herein, fast address access for read and write may be provided in the same cycle via a self-timed pulse in the input latch circuit and/or via associated control/scheme from the control circuit.