Patents Assigned to Haas Laser Technologies, Inc.
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Patent number: 10942275Abstract: A method and apparatus for improving measurements of a laser beam in a laser imaging system. The method includes, positioning an apodizing filter having a transmission profile that approaches a maximum at its edges between a pixelated detector and a laser source. The method further includes, emitting a laser beam from the laser source onto the apodizing filter and transmitting a portion of the laser incident upon the apodizing filter to the pixelated detector in accordance with the transmission profile of the apodizing filter such that the signal-to-noise ratio of the portion of the laser incident upon the pixelated detector is improved. The apodizing filter may be selected from a linear apodizing filter, a radial apodizing filter and a prism apodizing filter.Type: GrantFiled: February 4, 2019Date of Patent: March 9, 2021Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 10708537Abstract: A method and apparatus for reducing ghost images in a laser imaging system. The method includes, positioning an absorptive neutral density filter, having an optical density (OD) of at least ?1, between a pixelated detector and a laser source. The method further includes, emitting a laser beam, from the laser source onto the absorptive neutral density filter, transmitting a portion of the light incident upon a first surface of the absorptive neutral density filter to a second surface of the absorptive neutral density filter, reflecting a portion of light incident upon the second surface of the absorptive neutral density filter and absorbing the reflected portion of light, by the absorptive neutral density filter, to reduce ghost images at the pixelated detector.Type: GrantFiled: July 28, 2018Date of Patent: July 7, 2020Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8848177Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: April 28, 2014Date of Patent: September 30, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8848179Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: April 28, 2014Date of Patent: September 30, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8848178Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: April 28, 2014Date of Patent: September 30, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Publication number: 20140233021Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: ApplicationFiled: April 28, 2014Publication date: August 21, 2014Applicant: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Publication number: 20140231634Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: ApplicationFiled: April 28, 2014Publication date: August 21, 2014Applicant: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Publication number: 20140233022Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: ApplicationFiled: April 28, 2014Publication date: August 21, 2014Applicant: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8711343Abstract: An in-line laser beam waist analyzer system includes an optical prism that picks off a portion of a second surface reflection from either a laser processing focus lens or a protective debris shield for the processing lens and directs that focused light to a pixelated detector. This provides real time monitoring of the focused laser beam while it is processing material by welding, cutting, drilling, scribing or marking, without disrupting the process.Type: GrantFiled: October 22, 2012Date of Patent: April 29, 2014Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8619247Abstract: An apparatus having a linear structure that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a low power laser beam. A laser beam source transmits a laser beam through a focusing lens, a Fabry-Perot resonator, a pair of polarizers and a camera that detects spots of light that pass through the first and second mirrors and the polarizers. The resonator includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. The polarizers are disposed at an opposite angle of incidence and are rotationally adjustable to enable intensity adjustment of the camera.Type: GrantFiled: June 27, 2012Date of Patent: December 31, 2013Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8427633Abstract: An apparatus that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a high power laser beam. The apparatus employs the optics used in a process application, including a focus lens and cover glass. An attenuation module includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. A beam dump is positioned out of a path of travel of the laser beam and in receiving relation to light reflected by the first and second mirrors. A camera detects spots of light that pass through the first and second mirrors. A high power attenuator formed by a highly reflective mirror pair is positioned between the source and the attenuation module. A second embodiment includes a single mirror plate having highly reflective surfaces.Type: GrantFiled: May 25, 2012Date of Patent: April 23, 2013Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs
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Patent number: 8237922Abstract: An apparatus that enables real time measurement of the spatial profile, circularity, centroid, astigmatism and M2 values of a laser beam generated by a high power laser beam. The apparatus employs the optics used in a process application, including a focus lens and cover glass. An attenuation module includes a pair of high reflecting mirror plates disposed in parallel, spaced apart relation to one another at a common angle of incidence to the laser beam. A beam dump is positioned out of a path of travel of the laser beam and in receiving relation to light reflected by the first and second mirrors. A camera detects spots of light that pass through the first and second mirrors. A high power attenuator formed by a highly reflective mirror pair is positioned between the source and the attenuation module. A second embodiment includes a single mirror plate having highly reflective surfaces.Type: GrantFiled: April 8, 2010Date of Patent: August 7, 2012Assignee: Haas Laser Technologies, Inc.Inventor: Michael J. Scaggs