Abstract: A method and apparatus are described for testing electronic circuit devices for proper operation and parameter tolerance levels. The apparatus includes a card reader for extracting from a plurality of programming cards comparison values against which actual parameter values of a device under test are to be compared; a memory for storing a plurality of comparison values for each parameter of the device to be checked, which different comparison values represent different tolerance levels or bins for the device; test circuitry for measuring the actual values of the parameters of a device under test; a comparator for comparing each of such actual values with the various tolerance comparison values for the same; and a visual display screen for displaying the results of the comparison.