Abstract: The present embodiment relates to a light emission device capable of removing zero-order light from output light of an S-iPM laser. The light emission device comprises an active layer and a phase modulation layer. The phase modulation layer includes a base layer and a plurality of modified refractive index regions. In a state in which a virtual square lattice is set on the phase modulation layer, a center of gravity of each modified refractive index region is separated from a corresponding lattice point, and a rotation angle around each lattice point that decides a position of the center of gravity of each modified refractive index region is set according to a phase distribution for forming an optical image. A lattice spacing and an emission wavelength satisfy a condition of M-point oscillation in a reciprocal lattice space of the phase modulation layer.

Abstract: Provided is a light-emitting device including an organic light-emitting element and a control unit that controls the organic light-emitting element. The organic light-emitting element includes a first electrode, a second electrode, and an organic light-emitting layer which is disposed between the first electrode and the second electrode and in which separation of charges occurs due to incidence of excited light. The control unit changes a potential difference between the first electrode and the second electrode so that recoupling of the charges occurs, in a second period after passage of a delay period from a first period in which the excited light is incident to the organic light-emitting layer.

Abstract: A smell sensor includes an ion sensor in which a sensing section provided with a sensitive film configured to change a potential in accordance with a state of a measurement target is formed on a semiconductor substrate; a substance adsorption film disposed on the sensitive film and configured to change the state with adsorption of a smell substance; and a reference electrode configured to apply a reference voltage to the substance adsorption film. The reference electrode is disposed to be separated from the sensitive film and not to overlap the sensing section when viewed in a thickness direction of the semiconductor substrate.

Abstract: An orientation characteristic measurement system (1) includes an irradiation optical system (5), a detection optical system (11), a light detector (13), a rotation mechanism (9) changing an angle (?) between a surface of the sample and an optical axis (L2) of the detection optical system (11), and a computer (15), and the computer (15) includes a rotation mechanism control unit (32) controlling the rotation mechanism (9), a distribution acquisition unit (34) normalizing an angle-dependent distribution of light intensity to acquire an angle-dependent distribution of light intensity, an area specifying unit (35) specifying light intensity in a maximum area on the basis of the angle-dependent distribution of the light intensity, and a parameter calculation unit (36) calculating the orientation parameter (S) on the basis of a linear relationship determined using the film thickness and refractive index of the sample and the light intensity in the maximum area.

Abstract: An image acquisition device includes: a stage on which a sample is placed; a drive unit; a first irradiation optical system; a second irradiation optical system; a beam splitter; a pupil dividing element; a first imaging lens; a first imaging element; an analysis unit; a control unit; a second imaging lens; and a second imaging element, a first irradiation light irradiation range captured by the first irradiation optical system includes a second imaging region captured by the second imaging element, the second imaging region is located behind a first imaging region in a scanning direction, and the control unit controls a focus position of an objective lens based on focus information before capturing the second imaging region by the second imaging element.

Abstract: The spectrometer includes: a light source unit emitting a laser beam; a mirror unit including a first plane mirror having a first mirror surface and a second plane mirror having a second mirror surface, wherein a measurement target is introduced between the first mirror surface and the second mirror surface; and a light detector detecting the laser beam returned by multiple reflection between the first mirror surface and the second mirror surface. The first mirror surface and the second mirror surface are arranged non-parallel to each other when viewed from the Z-axis direction so as to form an optical path of the laser beam reciprocating in the Y-axis direction while performing multiple reflection between the first mirror surface and the second mirror surface. The optical path of the laser beam between the first mirror surface and the second mirror surface is inclined with respect to the Z-axis direction.

Abstract: An active energy irradiation device includes: a plurality of active energy irradiation units; a housing that houses the active energy irradiation units; an exhaust unit that is provided in the housing, and that discharges air to an outside of the housing; and an inert gas suction unit that suctions an inert gas outside the housing, and that allows the inert gas to flow into the housing, wherein an air flow path allowing the air to flow through, and an inert gas flow path allowing the inert gas to flow through are provided inside the housing, the air flow path and the inert gas flow path merge with each other, and the exhaust unit exhausts the inert gas together with the air.

Abstract: A concentrating lens includes an incident surface, an emitting surface, and a reflective surface. The incident surface includes a central portion and an outer portion. The incident surface is formed by an inner surface of a depression portion. The reflective surface surrounds the emitting surface. The reflective surface extends so as to go toward a first side as going toward an outside. A first light incident on the outer portion of the incident surface transmits through the outer portion, is reflected by the reflective surface, reflected by the incident surface, and incident on the emitting surface. A second light incident on the central portion of the incident surface transmits through the central portion and is incident on the emitting surface. The central portion of the incident surface reflects the first light reflected by the reflective surface, toward the emitting surface and transmits the second light.

Abstract: A radiation imaging device according to one embodiment comprises a radiation detection panel, a base substrate having a support surface configured to support the radiation detection panel, and a housing, wherein: the housing has a top wall and a bottom wall, the base substrate has a protruding portion which protrudes further outward than the radiation detection panel when seen in a direction orthogonal to the support surface, a first extending portion is provided to the support surface of the protruding portion, a second extending portion is provided to a back surface of the protruding portion, the second extending portion being disposed at a position which it faces the first extending portion with the protruding portion interposed therebetween, and the base substrate is supported on the top wall via the first extending portion and is supported on the bottom wall via the second extending portion.

Abstract: An image sensor includes a plurality of pixels. Each pixel includes a photoelectric conversion portion, a reset gate for controlling removal of a charge accumulated in the photoelectric conversion portion, a charge accumulation portion, an accumulation gate for controlling a transfer of the charge from the photoelectric conversion portion to the charge accumulation portion, and a readout gate for controlling readout of the charge from the charge accumulation portion. The reset gate removes the charge generated in the photoelectric conversion portion by excitation light. The accumulation gate transfers the charge generated in the photoelectric conversion portion by fluorescence to the charge accumulation portion. The readout gate performs control for reading out the charge after the charge transfer is performed n times. The number n of the charge transfers is set for each pixel.

Abstract: A solid immersion lens unit includes a solid immersion lens having a contact surface for coming into contact with semiconductor device formed of a silicon substrate and a spherical surface to be disposed to face an objective lens; a holder holding the solid immersion lens; and an optical element held by the holder to be positioned between the objective lens and the solid immersion lens. The solid immersion lens transmits light having at least a part of wavelength in a range of 200 nm or greater and 1100 nm or lower. The optical element corrects aberration caused by a difference in refractive indices between the silicon substrate and the solid immersion lens.

Abstract: A dispersion measurement apparatus includes a pulse forming unit, a correlation optical system, a beam splitter, an operation unit, an imaging unit, a spatial filter unit, and a photodetector. The pulse forming unit forms a light pulse train including light pulses having time differences and different center wavelengths. The beam splitter branches the light pulse train passed through a measurement object. The imaging unit disperses one light pulse train and images each light pulse. The spatial filter unit extracts light of a partial region of the other light pulse train. The correlation optical system outputs correlation light including a cross-correlation or an autocorrelation of the extracted light. The photodetector detects a temporal waveform of the correlation light. The operation unit estimates a wavelength dispersion amount in the measurement object based on a feature value of the temporal waveform.

Abstract: A brain measurement apparatus includes: a magnetoencephalograph including optically pumped magnetometers, magnetic sensors for measuring a static magnetic field at positions of the optically pumped magnetometers, and a nulling coil for canceling the static magnetic field; an MRI apparatus including a permanent magnet, a gradient magnetic field coil, a transmission coil, and a receive coil for detecting a nuclear magnetic resonance signal; and a control device that, when measuring the brain's magnetic field, controls a current to be supplied to the nulling coil based on measured values of the magnetic sensors and operates so as to cancel a static magnetic field at the position of each of the optically pumped magnetometers and, when measuring an MR image, controls the gradient magnetic field by controlling a current to be supplied to the gradient magnetic field coil and generates an MR image based on an output of the receive coil.

Abstract: An intra-oral imaging system includes an imaging device and a control device. The imaging device includes an imager, a controller, and a case in which the imager and the controller are housed. The imager performs imaging detection for detecting radiation in order to acquire an image of an object and monitoring detection for detecting radiation in order to monitor the dose of radiation. The controller transmits an imaging signal and a monitoring signal to the control device, the imaging signal acquired by the imaging detection and the monitoring signal acquired by the monitoring detection. The control device receives the imaging signal and the monitoring signal, and transmits a control command to the controller, the control command generated based on the monitoring signal. The controller controls the imager according to the control command.

Abstract: An active energy irradiation device includes: an active energy irradiation unit having an emitting surface extending in both a first direction and a second direction, the emitting surface configured to emit an active energy ray to one side in a third direction; an inert gas supply unit having a spray port located on one side in the second direction with respect to the emitting surface, the spray port configured to spray an inert gas to the one side in the third direction; and a structure including a protrusion portion located on the other side in the second direction with respect to the emitting surface, the protrusion portion protruding to the one side in the third direction with respect to the emitting surface. A width in the second direction of the protrusion portion is larger than a width in the third direction of the protrusion portion.

Abstract: A shape measurement apparatus includes a light source, an irradiation optical system, an imaging optical system, a spatial light modulator, a focusing optical system, a linear sensor, and a processing unit. The irradiation optical system forms the light into a line shape and irradiates an object. The imaging optical system forms an image of the light reflected by the object. The spatial light modulator, in which a one-dimensional intensity modulation pattern is set on a light modulation plane, spatially intensity-modulates and outputs the light. The focusing optical system focuses the light output from the spatial light modulator in a line shape. The linear sensor receives the light focused in the line shape by pixels. The processing unit performs analysis by the compressive sensing technique for each of the pixels based on the intensity modulation pattern and an output signal from the linear sensor.

Abstract: A method for manufacturing a mirror device, the method includes a first step of preparing a wafer having a support layer and a device layer; a second step of forming a slit in the wafer such that the movable portion becomes movable with respect to the base portion by removing a part of each of the support layer and the device layer from the wafer by etching and forming a plurality of parts each corresponding to the structure in the wafer, after the first step; a third step of performing wet cleaning for cleaning the wafer using a cleaning liquid after the second step; and a fourth step of cutting out each of the plurality of parts from the wafer after the third step. In the second step, a circulation hole penetrating the wafer is formed at a part other than the slit in the wafer by the etching.

Abstract: The present invention relates to a method for assessing mitochondrial function in a tissue or organ other than the kidney in a test subject, including: a step of calculating a ratio (BUN/CRE) of blood urea nitrogen (BUN) concentration to blood creatinine (CRE) concentration in a test subject; and a step of estimating mitochondrial activity in a tissue or organ other than the kidney in the test subject using the calculated ratio (BUN/CRE).

Abstract: There are provided a light-emitting element, an optical detection module, a method for manufacturing a light-emitting element, and a scanning electron microscope using the same, by which it is possible to reduce crosstalk and expand the range of applications. A light-emitting element includes a fiber optic plate substrate having transparency to fluorescence and a light-emitting layer as a nitride semiconductor layer having a quantum well structure. In the light-emitting element, the fiber optic plate substrate and the light-emitting layer are directly bonded to each other.

Abstract: The ion sensor includes a substrate and a plurality of detection units. Each detection unit includes an ID portion, an ICG electrode, a TG electrode, an SG electrode, an electrode pad, and an ion sensitive film. The SG electrode is disposed between the ICG electrode and the TG electrode on the main surface of the substrate. The electrode pad is electrically connected to the SG electrode and disposed on the opposite side of the SG electrode from the substrate. The ion sensitive film is provided on the surface of the electrode pad, and changes a potential according to change in ion concentration of the aqueous solution in contact with the ion sensitive film. A width of the ion sensitive film in a facing direction in which the ICG electrode and the TG electrode face each other is greater than a separation width between the ICG electrode and the TG electrode.