Patents Assigned to HiddenLayer, Inc.
  • Patent number: 11954199
    Abstract: A machine learning model is scanned to detect actual or potential threats. The threats can be detected before execution of the machine learning model or during an isolated execution environment. The threat detection may include performing a machine learning file format check, vulnerability check, tamper check, and stenography check. The machine learning model may also be monitored in an isolated environment during an execution or runtime session. After performing a scan, the system can generate a signature based on actual, potential, or absence of detected threats.
    Type: Grant
    Filed: November 8, 2023
    Date of Patent: April 9, 2024
    Assignee: HiddenLayer, Inc.
    Inventors: Tanner Burns, Chris Sestito, James Ballard
  • Patent number: 11930030
    Abstract: A system detects and responds to malicious acts directed towards machine learning models. Data fed into and output by a machine learning model is collected by a sensor. The data fed into the model includes vectorization data, which is generated from raw data provided from a requester, such as for example a stream of timeseries data. The output data may include a prediction or other output generated by the machine learning model in response to receiving the vectorization data. The vectorization data and machine learning model output data are processed to determine whether the machine learning model is being subject to a malicious act (e.g., attack). The output of the processing may indicate an attack score. A response for handling the request by a requester may be selected based on the output that includes the attack score, and the response may be applied to the requestor.
    Type: Grant
    Filed: November 8, 2023
    Date of Patent: March 12, 2024
    Assignee: HiddenLayer Inc.
    Inventors: Tanner Burns, Chris Sestito, James Ballard
  • Patent number: 11921903
    Abstract: Data is received that characterizes artefacts associated with each of a plurality of layers of a first machine learning model. Fingerprints are then generated for each of the artefacts in the layers of the first machine learning model. These generated fingerprints collectively form a model indicator for the first machine learning model. It is then determined whether the first machine learning model is derived from another machine learning model by performing a similarity analysis between the model indicator for the first machine learning model and model indicators generated for each of a plurality of reference machine learning models each comprising a respective set of fingerprints. Data characterizing the determination can be provided to a consuming application or process. Related apparatus, systems, techniques and articles are also described.
    Type: Grant
    Filed: June 1, 2023
    Date of Patent: March 5, 2024
    Assignee: HiddenLayer, Inc.
    Inventors: David Beveridge, Andrew Davis
  • Publication number: 20240022585
    Abstract: A system detects and responds to malicious acts directed towards machine learning models. Data fed into and output by a machine learning model is collected by a sensor. The data fed into the model includes vectorization data, which is generated from raw data provided from a requester, such as for example a stream of timeseries data. The output data may include a prediction or other output generated by the machine learning model in response to receiving the vectorization data. The vectorization data and machine learning model output data are processed to determine whether the machine learning model is being subject to a malicious act (e.g., attack). The output of the processing may indicate an attack score. A response for handling the request by a requester may be selected based on the output that includes the attack score, and the response may be applied to the requestor.
    Type: Application
    Filed: July 15, 2022
    Publication date: January 18, 2024
    Applicant: HiddenLayer Inc.
    Inventors: Tanner Burns, Chris Sestito, James Ballard
  • Patent number: 11797672
    Abstract: Data is received that characterizes artefacts associated with each of a plurality of layers of a first machine learning model. Fingerprints are generated corresponding to each of the artefacts in each layer. The generated fingerprints can collectively form a model indicator for the first machine learning model. A second machine learning model then determines, based on the generated fingerprints, whether the first machine learning model is derived from another machine learning model. Data provided this characterization can be provided to a consuming application or process. This second machine learning model can be trained model with historical fingerprints having a known provenance classification. Related apparatus, systems, techniques and articles are also described.
    Type: Grant
    Filed: June 1, 2023
    Date of Patent: October 24, 2023
    Assignee: HiddenLayer, Inc.
    Inventors: David Beveridge, Andrew Davis