Patents Assigned to Holometrics, Inc.
  • Patent number: 6115114
    Abstract: A laser scanner sensor for measuring the spatial properties of objects in a scene within a range less than a predetermined maximum object distance. Applications of the laser scanner system includes measurement of the dimensional weight of parcel(s) being transported by a moving forklift. In the laser scanner sensor, a laser diode supplies a laser beam that is intensity-modulated by a reference waveform from a waveform generator. A variation of the optical scanning sensor system scans a field of measurement which the moving forklift traverses. The forklift has at least three retroreflectors attached to act as calibration targets within the viewing field.
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: September 5, 2000
    Assignee: Holometrics, Inc.
    Inventors: Johnny L. Berg, Francis H. Gerhard
  • Patent number: 5940170
    Abstract: A laser scanner for measuring the spatial properties of objects in a scene within a range less than a predetermined maximum object distance. A laser diode supplies a laser beam that is intensity-modulated by a reference waveform from a waveform generator. An optical scanning system scans the scene with the intensity-modulated laser beam, and receives reflected intensity-modulated light and supplies it to an optical processing system that includes an aperture that transmits a first percentage of light reflected from the maximum object distance and a second, lesser percentage of light reflected from objects closer than the maximum object distance. A photodetector receives the processed light and converts the energy into an amplitude-modulated range signal. A mixer down-converts the frequency into an IF frequency, and a first circuit converts the range signal to the form of a square wave.
    Type: Grant
    Filed: August 19, 1998
    Date of Patent: August 17, 1999
    Assignee: Holometrics, Inc.
    Inventors: Johnny L. Berg, Francis H. Gerhard
  • Patent number: 5831719
    Abstract: A laser scanner for measuring the spatial properties of objects in a scene within a range less than a predetermined maximum object distance. A laser diode supplies a laser beam that is intensity-modulated by a reference waveform from a waveform generator. An optical scanning system scans the scene with the intensity-modulated laser beam, and receives reflected intensity-modulated light and supplies it to an optical processing system that includes an aperture that transmits a first percentage of light reflected from the maximum object distance and a second, lesser percentage of light reflected from objects closer than the maximum object distance. A photodetector receives the processed light and converts the energy into an amplitude-modulated range signal. A mixer down-converts the frequency into an IF frequency, and a first circuit converts the range signal to the form of a square wave.
    Type: Grant
    Filed: April 12, 1996
    Date of Patent: November 3, 1998
    Assignee: Holometrics, Inc.
    Inventors: Johnny L. Berg, Francis H. Gerhard
  • Patent number: 4541496
    Abstract: The strain gauge bridge circuit located in the load cell of a load cell mass comparator is modified to provide temperature stability by coupling a remotely located temperature compensating circuit between the two normally connected output ends of strain gauges in adjacent arms of the bridge. The compensating circuit is comprised of a pair of series connected low noise, drift free precision resistors of relatively low resistance value compared to the resistance of the strain gauges. The precision resistors are shunted by relatively high valued potentiometers which operate to balance the bridge. One potentiometer additionally includes a series connected high value precision resistor for providing fine balance while the other potentiometer is used for coarse balance.
    Type: Grant
    Filed: March 12, 1984
    Date of Patent: September 17, 1985
    Assignees: Frazier Precision Instrument Company, Inc., Holometrics Inc.
    Inventor: Howard P. Layer
  • Patent number: 4523653
    Abstract: A load cell mass comparator wherein a pressure compensated load cell is connected at its upper end to a floating plate through a self-aligning coupling, such as, a universal joint assembly. The floating plate is slidably mounted on a plurality of guide rods extending between fixed upper and lower plates. A spring assembly and shock absorber are mounted between the upper fixed plate and floating plate. The lower end of the load cell is connected to the mass to be calibrated through a universal joint, thrust bearing, and spherical load stop bearing. The construction and arrangement of the components in the load cell mass comparator provides an instrument employed heretofore in a laboratory environment to a commercial environment where masses in the range of 1 to 10,000 pounds can be compared and calibrated.
    Type: Grant
    Filed: March 8, 1984
    Date of Patent: June 18, 1985
    Assignees: Frazier Precision Instrument Company, Inc., Holometrics, Inc.
    Inventors: Thomas F. Scrivener, Randall M. Schoonover
  • Patent number: RE32631
    Abstract: The strain gauge bridge circuit located in .[.the.]. .Iadd.a .Iaddend.load cell .[.of a load cell mass comparator.]. is modified to provide temperature stability by coupling a remotely located temperature compensating circuit between the two normally connected output ends of strain gauges in adjacent arms of the bridge. The compensating circuit is comprised of a pair of series connected low noise, drift-free precision resistors of relatively low resistance value compared to the resistance of the strain gauges. The precision resistors are shunted by relatively high valued potentiometers which operate to balance the bridge. One potentiometer additionally includes a series connected high value precision resistor for providing fine balance while the other potentiometer is used for coarse balance.
    Type: Grant
    Filed: July 10, 1986
    Date of Patent: March 29, 1988
    Assignees: Frazier Precision Instrument Company, Inc., Holometrics, Inc.
    Inventor: Howard P. Layer