Patents Assigned to Holtronic Technologies Limited
  • Patent number: 6005666
    Abstract: Apparatus for and a method of optical inspection in a total internal reflection holographic imaging system. Multi wavelength laser beams are directed onto a prism supporting a first substrate containing pre-recorded hologram which is to be imaged onto a recording medium of a second substrate, the multi wavelength beams being normal to both substrates. The distance between the two substrates is measured by interferometric techniques. Actuators are provided for adjusting the distance between the two substrates, these actuators being energized to cause minute adjustments of the spacing during a scanning operation whereby the imaging of the pre-recorded hologram is ensured at the correct focus throughout the scanning operation.
    Type: Grant
    Filed: September 26, 1990
    Date of Patent: December 21, 1999
    Assignee: Holtronic Technologies, Limited
    Inventors: Rene Dandliker, John Edward Brook, Massoud Hamidi
  • Patent number: 4966428
    Abstract: Apparatus for the manufacture of integrated circuits using holographic techniques in which a holographic image formed on a first recording medium provided on a glass slab is replayed by being scanned in order to reproduce an image of the holographic image on a second recording medium provided on a silicon slice. The replay source provides a a collimated narrow circular beam or elongated beam which passes normally through a face of the prism, through an index matching liquid located between the prism and the glass slab before being totally internally reflected at the other surface of the glass slab. The collimated replay beam provides control over the effective numerical aperture thus preventing wide angle radiation from degrading the quality of the printed image.
    Type: Grant
    Filed: February 3, 1989
    Date of Patent: October 30, 1990
    Assignee: Holtronic Technologies Limited
    Inventor: Nicholas J. Phillips
  • Patent number: 4917497
    Abstract: A holographic technique for the detection of position of known items so as to be able to reject those samples which do not lie within certain defined spatial parameters. A plate which contains a single exposure of the three dimensional holographic image of an object is illuminated by parallel reference beams from a laser to allow the reconstruction of a real focused image of the object. A displacement translator supports the object and permits displacement thereof in three directions all at right angles to one another. The coincidence of the object and its holographic image are detected either optically by means of a stereoscopic microscope, or electrically by means of a stereoscopic microscope and a photo-diode.
    Type: Grant
    Filed: July 31, 1987
    Date of Patent: April 17, 1990
    Assignee: Holtronic Technologies Limited
    Inventors: Donald W. Tomkins, Laurence Holden
  • Patent number: 4857425
    Abstract: A method of manufacturing integrated circuits using holographic techniques by interference between an input beam and a reference beam generated from laser sources. A holographic image of the object formed on a mask window, is formed on recording emulsion coated on a glass slab by means of interference between the input beam which has passed through the mask and the reference beam which is reflected from the surface of a prism in contact with the glass slab. In order to reproduce the holographic image on a silicon slice which replaces the mask, the reference beam is replayed in the reverse direction through the prism such that the interference between the input beam and the replayed reference beam causes the holographic image to be created as a real image in the silicon slice.
    Type: Grant
    Filed: June 26, 1987
    Date of Patent: August 15, 1989
    Assignee: Holtronic Technologies Limited
    Inventor: Nicholas J. Phillips