Patents Assigned to I.C.I. Design Institute Inc.
  • Patent number: 7413223
    Abstract: An inspection device in accordance with the present invention is configured so that a light source used for irradiating light, and a reflection-type prism that irradiates the light from the light source to a hologram provided on an inspection target that is placed downward and that diffracts light rays in different directions that are reflected from the hologram upward in the same or substantially the same direction are housed in a case. With such an arrangement, it becomes possible to provide an inspection device that can positively conduct an inspection process for identifying the genuineness of an inspection target having a hologram quickly, and is also advantageous in costs.
    Type: Grant
    Filed: February 23, 2006
    Date of Patent: August 19, 2008
    Assignee: I.C.I. Design Institute Inc.
    Inventor: Yoshiaki Iida
  • Publication number: 20060279817
    Abstract: An inspection device in accordance with the present invention is configured so that a light source used for irradiating light, and a reflection-type prism that irradiates the light from the light source to a hologram provided on an inspection target that is placed downward and that diffracts light rays in different directions that are reflected from the hologram upward in the same or substantially the same direction are housed in a case. With such an arrangement, it becomes possible to provide an inspection device that can positively conduct an inspection process for identifying the genuineness of an inspection target having a hologram quickly, and is also advantageous in costs.
    Type: Application
    Filed: February 23, 2006
    Publication date: December 14, 2006
    Applicant: I.C.I. DESIGN INSTITUTE INC.
    Inventor: Yoshiaki Iida