Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
Type:
Grant
Filed:
March 16, 2022
Date of Patent:
March 19, 2024
Assignee:
Inovision Software Solutions, Inc.
Inventors:
Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
Abstract: An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.
Type:
Grant
Filed:
May 4, 2020
Date of Patent:
April 19, 2022
Assignee:
INOVISION SOFTWARE SOLUTIONS, INC.
Inventors:
Jacob Nathaniel Allen, Zhipeng Liang, Brandon David See, Frank Damacio Luna
Abstract: A light is shined on a specular surface of an inspected object at a fixed position. Light is reflected directly from the surface into a fixed camera. Multiple images are taken as the light source moves. Images are fused into a single image. This invention takes a single image and generates several defect detection images using several distinct image processing sequences. Each defect detection image alone could be used to identify when defects are located under a camera pixel, but the several images are combined to create a feature vector that can be used as an input to a pattern classifier. The pattern classifier may be trained to achieve superior defect detection results by combining several detection images.
Type:
Application
Filed:
March 22, 2016
Publication date:
September 28, 2017
Applicant:
INOVISION SOFTWARE SOLUTIONS, INC.
Inventors:
Jacob Nathaniel Allen, Brandon David See, Patrick Kerry Krawec