Patents Assigned to Institut of High Energy Physics, Chinese Academy of Sciences
  • Patent number: 8972191
    Abstract: Phase sensitive X-ray imaging methods provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems impairing the wider use of phase contrast in X-ray radiography and tomography. To separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed “reverse projection” is the significantly reduced delivered dose, without degradation of the image quality.
    Type: Grant
    Filed: February 3, 2010
    Date of Patent: March 3, 2015
    Assignees: Paul Scherrer Institut, Institut of High Energy Physics, Chinese Academy of Sciences
    Inventors: Marco Stampanoni, Ziyu Wu, Peiping Zhu