Abstract: A system and method of generating test code for testing an electronic device on an Automatic Test Equipment (ATE) platform are described. The invention translates scan and pattern test data into test code based upon user defined settings. The test data preferably comes from a test data generation program such as a Scan ATPG or Simulation program, which generates test data. The test data is serially streamed to the invention by the use of function calls embedded in the test data generation program. The user, preferably using a Graphical User Interface (GUI), defines the desired ATE platform type, as well as other custom format features for the output data. The translation, preferably running simultaneously with the test data generation plan, produces the test code as the test data is generated. The user also has the option to generate several different versions of test code simultaneously from the same generation of the test data.

Abstract: A system and method for generating testing program code for testing an electronic device on an automatic test equipment (ATE) platform are described. The ATE platform is interconnectable to a testing workstation comprising a processor, memory and input/output facilities. The electronic device under test is removably coupled to the ATE platform. The ATE platform further includes a tester for testing the electronic device responsive to the testing program code. The testing of the electronic device on the ATE platform is controlled by and results from the testing of the electronic device are displayed using the input/output facilities of the testing workstation. A library of ATE platform parameters associated with the testing workstation is maintained and the ATE platform parameters for a plurality of ATE platforms including the ATE platform interconnectable to the testing workstation are stored in the library.