Patents Assigned to INTERNATIONAL TEST SOLUTIONS, LLC
  • Patent number: 11756811
    Abstract: A device, mechanism, and methodology for regular and consistent cleaning of the vacuum aperture, nozzle, and contacting surfaces of a pick-and-place apparatus and the pick-up tools of automated or manual semiconductor device and die handling machines are disclosed. The cleaning material may include a cleaning pad layer with one or more intermediate layers that have predetermined characteristics, regular geometrical features, and/or an irregular surface morphology.
    Type: Grant
    Filed: July 2, 2019
    Date of Patent: September 12, 2023
    Assignee: International Test Solutions, LLC
    Inventors: Alan E. Humphrey, Bret A. Humphrey, Jerry J. Broz, Wayne C. Smith
  • Patent number: 11434095
    Abstract: Novel materials and devices can remove small defects from long rolls of flexible electronics material while they are in continuous motion. The cleaning materials are designed to remove small particles without transferring defects or damaging the flexible electronics. The device generally consists of variable speed, motor-driven cylinders mounted on moveable brackets. The cylinders are capable of matching the speed of the cleaning material such that the cleaning material is always in contact with the web roll to be cleaned. The brackets are capable of rotating so the same material can be used more than once. Another material is used to remove debris from the cleaning material. A similar device consisting of motor-driven cylinders and moveable is used to apply the debris removal film to the cleaning film, allowing the cleaning film to be used multiple times.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: September 6, 2022
    Assignee: International Test Solutions, LLC
    Inventors: Mark M. Stark, Alan E. Humphrey
  • Patent number: 11318550
    Abstract: A cleaning material, device, and method for predictably cleaning the capillary tube for a wire bonding machine in which the cleaning pad has a predetermined configuration appropriate for the particular wire bonding machine and a substrate having a defined functionalized surface topology and geometry which can be introduced into the wire bonding machine during the normal wire bonding operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Grant
    Filed: April 22, 2020
    Date of Patent: May 3, 2022
    Assignee: International Test Solutions, LLC
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles, Wayne C. Smith, Janakraj Shivlal
  • Publication number: 20220093394
    Abstract: A cleaning material, device, and method for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card and a test socket, in which the cleaning pad has a predetermined configuration appropriate for the particular pin contact elements and a substrate having a defined functionalized surface topology and geometry which can be introduced into the testing apparatus during the normal testing operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Application
    Filed: December 2, 2021
    Publication date: March 24, 2022
    Applicant: INTERNATIONAL TEST SOLUTIONS, LLC
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles
  • Patent number: 11211242
    Abstract: A cleaning material, device, and method for predictably cleaning the contact elements and support hardware of a tester interface, such as a probe card and a test socket, in which the cleaning pad has a predetermined configuration appropriate for the particular pin contact elements and a substrate having a defined functionalized surface topology and geometry which can be introduced into the testing apparatus during the normal testing operations. The cleaning material has a predetermined topography with a plurality of functional 3-dimensional (3D) microstructures that provide performance characteristics which are not possible with a non-functionalized and flat surface.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: December 28, 2021
    Assignee: INTERNATIONAL TEST SOLUTIONS, LLC
    Inventors: Alan E. Humphrey, Jerry J. Broz, Bret A. Humphrey, Alex S. Poles
  • Patent number: 11155428
    Abstract: Novel materials and devices can remove small defects from long rolls of flexible electronics material while they are in continuous motion. The cleaning materials are designed to remove small particles without transferring defects or damaging the flexible electronics. The device generally consists of variable speed, motor-driven cylinders mounted on moveable brackets. The cylinders are capable of matching the speed of the cleaning material such that the cleaning material is always in contact with the web roll to be cleaned. The brackets are capable of rotating so the same material can be used more than once. Another material is used to remove debris from the cleaning material. A similar device consisting of motor-driven cylinders and moveable is used to apply the debris removal film to the cleaning film, allowing the cleaning film to be used multiple times.
    Type: Grant
    Filed: February 22, 2019
    Date of Patent: October 26, 2021
    Assignee: INTERNATIONAL TEST SOLUTIONS, LLC
    Inventors: Mark M. Stark, Alan E. Humphrey