Abstract: A current transient suppression circuit includes an inductor electrically connected to a test signal by an input of the inductor, at least one switching device electrically connected to an output of the inductor, and an output of the at least one switching device connected to a shunt path. A method of suppressing current transients in a circuit includes receiving a test signal at an inductor, and when the test signal comprises a current transient, the current transient is received at the inductor, activating at least one switching device electrically connected to the inductor to shunt the current transient away from a device under test.

Abstract: A power supply in a test and measurement device includes a stimulus having an output coupled to an amplifier in which an output signal from the stimulus controls an output level of the amplifier. The stimulus may include a Digital to Analog Converter. A measurement circuit detects the output level of the amplifier. The power supply includes an overpulse generator that can be structured to accept a desired amplifier output level, overdrive the stimulus at a first level for a first time period, and drive the stimulus at a second level for a second time period. The measurement circuit determines when the overpulse generator switches from driving the stimulus at the first level to driving the stimulus at the second level. The time period for driving the stimulus at the second level starts as the actual amplifier output level approaches the desired amplifier output level.

Abstract: Embodiments described herein include a data acquisition unit having a plurality of ports that are each configured to receive a signal from a respective temperature sensor of a device under test. Each of the temperature sensors is associated with a location with respect to the device under test. The data acquisition unit also includes a processor configured to determine a temperature corresponding to each temperature sensor, based on the signal received from the respective temperature sensor. The processor can then generate a thermal gradient for the device under test based on the temperature and the location of each of the temperature sensors. This thermal gradient can then be output for further analysis. Additional embodiments may be described and/or claimed herein.

Abstract: A switching power supply can include multiple power MOSFETs that receive an initial gate drive waveform comprising a fast slew rate region having a negative slope and a slow slew rate region also having a negative slope. The MOSFETs can turn off during the slow slew rate region of the initial gate drive waveform.

Abstract: A feedback ammeter, which may be included in a source measure unit or a digital multi-meter, for example, including an operational amplifier having an input and an output and a feedback path electrically coupled between the output and the input of the operational amplifier. The feedback path includes a first non-linear device to allow the measurement of decades of current. The ammeter also includes an amplifier electrically coupled to the input of the operational amplifier and the output of the operational amplifier, a second non-linear device electrically coupled to an output of the amplifier, and a resistor electrically coupled between the second capacitor and the input of the operational amplifier. A constant resistance input impedance is established using the second non-linear device that can adjust the circuit gain.

Abstract: A test and measurement instrument for performing multiple operations, including a port to receive a signal from a device under test; and a processor. The processor configured to, based on a parallel trigger model, execute a first process associated with first functionality of the test and measurement instrument, and execute a second process on the signal from the device under test, the second process associated with second functionality of the test and measurement instrument. The second process commencing prior to completion of the first process.

Abstract: A test and measurement device, including a first input structured to receive a first voltage from a first conductor of a first triaxial cable, a second input structured to receive a second voltage from a second conductor of the first triaxial cable or a second triaxial cable, circuitry configured to change modes based on the first voltage and the second voltage; and an output structured to output a signal.

Abstract: A safety adapter assembly includes a first electrical connector, a second electrical connector, a connector body, and a safety sleeve. The connector body is structured to couple the first electrical connector to the second electrical connector. The safety sleeve is substantially surrounding the connector body and configured to move relative to the connector body to selectively allow user access to the first electrical connector while substantially blocking user access to the second electrical connector, or to allow user access to the second electrical connector while substantially blocking user access to the first electrical connector.

Abstract: A system for testing an integrated-circuit wafer, the system including a probe card having a probe needle and a probe body enclosing a pressure chamber. The probe body includes a unitary sidewall, a first end cap substantially closing a first end of the probe body, except for an outlet passage in the first end cap, and an inlet passage configured to introduce compressed gas into the pressure chamber. The probe needle is within the pressure chamber and is supported by the probe body. A free end of the probe needle extends through the outlet passage. The ends of the probe needle are separated by a first bend in the probe needle, which has a center of curvature that is located between the probe needle and a longitudinal centerline of the unitary sidewall. Methods of using a probe card are also disclosed.

Abstract: A testing environment includes a first measuring unit connected to a gate of a MOSFET device and a second measuring unit connected to a drain of the MOSFET device. The testing environment is particularly useful for testing gate charge for MOSFET devices. In a first phase, the gate of the device is driven with electrical current while the drain is driven with a constant voltage. As the MOSFET device turns on, the second measuring unit switches from providing the constant voltage to providing a constant current to the drain of the MOSFET, while measuring the drain voltage. The switching of modes is automatic and occurs without user intervention. After the MOSFET device has been driven to VgsMax by the gate current, all of the relevant data is stored, which may be analyzed and presented to a user in a User Interface or presented in other manner.

Abstract: A test and measurement circuit including a capacitor in parallel with a device under test, a direct current voltage source configured to charge the capacitor, a pulse generator configured to generate a pulse for testing the device under test, and a sensor for determining a current in the device under test.

Abstract: A current source has at least one gain component having a constant gain at frequencies below a frequency point, and having a gain inversely proportional to frequency at frequencies above the frequency point, the gain component having an input and an output, a source resistor connected in series with the output of the gain component, the gain component to regulate a voltage across the source resistor to be a source voltage, such that the gain of the gain component limits regulation by the gain component of the source voltage and an output voltage across a load between a high terminal and a low terminal, and a feedback component to receive at least a portion of the output voltage, the feedback component connected to the input of the gain component, the feedback component configured to reduce the gain of the gain component available to regulate the source voltage across the source resistor.

Abstract: A test and measurement instrument including a voltage source configured to output a source voltage, a current sensor, and one or more processors. The one or more processors are configured to determine an estimation of a load of an unknown connected device under test based on the source voltage, the current sensor, and a voltage of the connected device under test without any prior knowledge of the connected device under test.

Abstract: A test and measurement instrument switch matrix including a first cable including a center conductor and a guard connected to a first output of the test and measurement instrument; a second cable including a center conductor and a guard connected to a second output of the test and measurement instrument; a third cable including a center conductor and a guard connected to the device under test; and a fourth cable including a center conductor connected to the device under test and a guard connected to the device under test.

Abstract: A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.

Abstract: Disclosed is a test and measurement instrument including a plurality of ports. The ports are configured to source a test signal into a device under test (DUT), and receive a signal response from the DUT. The test and measurement instrument also includes a measurement unit configured to measure the signal response. The test and measurement instrument further includes a processor configured to compare the signal response to a data structure. The processor also determines a classification of, and/or connections to, at least one DUT component coupled to at least one of the ports based on results of the comparison.

Abstract: A test and measurement device including a source configured to output a source signal, a source output configured to output the source signal to a connected cable, a guard drive circuit electrically coupled to the source and configured to receive the source signal and generated a guard drive signal, the guard drive circuit having a gain less than one, and a guard drive circuit output configured to output the guard drive signal to a connected guard.

Abstract: Disclosed is a test and measurement switch matrix. The test and measurement switch matrix includes a solid state switch to couple a test signal from a Device Under Test (DUT) to a test system. The solid state switch has a dual tee guard arrangement providing low leakage when off. The solid state switch also includes an optically coupled drive, which further improves isolation and reduces undesirable charge injection when changing switch states.

Abstract: A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.