Abstract: An operation of projecting slit light onto an object to be measured and receiving light reflected thereon, and an operation of acquiring a two-dimensional image concerning the object to be measured are repeated a certain number of times by changing a focal length. An imaging contrast is calculated with respect to each of areas on the two-dimensional images acquired at the different focal lengths. A high contrast area where the imaging contrast exceeds a predetermined threshold value is extracted with respect to each of the two-dimensional images acquired at the different focal lengths. Distance information concerning the respective areas is acquired by performing triangulation with respect to each of the high contrast areas. Position adjustment of measurement dimensions is performed in such a manner that the areas are included in the measurement dimensions having the predetermined measurement depth, based on the distance information.

Abstract: A reflection characteristic measuring apparatus includes: a light irradiating member for irradiating light toward a sample surface to be measured; a light detector, having a two-dimensional light receiving surface, for receiving reflection light from the sample surface illuminated with the light irradiated by the light irradiating member to output two-dimensional light receiving data concerning a first area corresponding to an area of the light receiving surface; an area setter for setting a second area at an appropriate position within the first area, the second area being smaller than the first area, to restrict light receiving data to be used in obtaining a reflection characteristic of the sample surface; and a calculator for obtaining a characteristic of the sample surface, based on two-dimensional light receiving data concerning the second area.

Abstract: A concave diffraction grating device, a reflective dispersion device, and a spectral device of the invention include a diffraction grating plane having an aspherical configuration, wherein the diffraction grating plane is symmetrical in a predetermined direction, and asymmetrical in a direction orthogonal to the predetermined direction in such a manner that the curvature of one end portion of the diffraction grating plane in the direction orthogonal to the predetermined direction is gradually decreased, and the curvature of the other end portion thereof is gradually increased. The concave diffraction grating device, the reflective dispersion device, and the spectral device with the above arrangement have desirable slit image forming performance with respect to all the wavelengths in a visible region, and are suitable for mass-production.

Abstract: In a wavelength displacement correcting system and method of the invention, a monochromatic beam from a light emitting diode driven by a constant current is incident through an incident slit of a spectral device. The incident beam is diffracted on a diffraction grating to form a dispersed light image, and information relating to the dispersed light image of the incident slit is outputted from the spectral device. A wavelength displacement amount of the monochromatic beam is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image.

Abstract: A standard plane sample which supplies an optical characteristic measuring device with reference data. The standard plane sample including a sample portion that is measured by the optical characteristic measuring device to supply measurement data, and a recording medium that stores identification data for identifying a kind of the sample portion as well as reference data corresponding to the optical characteristic of the sample portion.

Abstract: An optical measuring apparatus includes: an illumination system having a toroidal mirror which is by circularly rotating a parabolic curve or its approximate curve around an axis with the focal point of the parabolic curve or the substantial light focusing point of the approximate curve forming a focal point arc; and a plurality of illuminators which are arranged in the vicinity of the focal point arc to reflect beams emanated from the illuminators by the toroidal mirror as parallel beams for projection onto the object surface in different directions on the measurement plane; a light detecting system which detects the reflection beams from the object surface in a specific direction; and a controller/calculator which successively turns on the illuminators, measures the reflection beams from the object surface in respective illuminating directions of the illuminators, and calculates reflection characteristics of the object surface in the respective illuminating directions.

Abstract: A color luminance meter 1 is provided with a polychrometer 4 as a spectral optical system including a light receiving sensor array 43, a signal processing circuit 5 and an operation control unit 6. The operation control unit 6 carries out calculations to obtain characteristics of a measurement light based on a specified spectral responsitivity, using light reception signals and specified weighting coefficients. The spectral responsitivities of light receiving sensors constructing the light receiving sensor array 43 are selected such that B?5 nm and A/B lies within a range of 1.5 to 4.0 when A, B denote the half power band width of the spectral responsitivities and a center wavelength interval of the spectral responsitivities. Accordingly, there can be provided a light measuring apparatus capable of maximally suppressing errors to highly precisely measure color luminance values and the like even in a measurement of a light lying in a narrow band such as a monochromatic light.

Abstract: A two-dimensional spectroradiometer has an optical system such as an objective optical system 2 and a relay lens 6 for receiving light rays La from a two-dimensional light source L to form an optical image i.e. a first image 2a and a second image 6a, a WBPF 12 as a transmittance wavelength variable filter having a spectral transmittance characteristic that transmittance wavelengths of the light rays La differ from each other depending on transmittance sites of the filter where the respective light rays La pass, a scanning WBPF 10 which scannably holds the WBPF 12 on an optical path forming the optical image, and an image sensor 7 for capturing the second image 6a composed of the light rays La passing through the WBPF 12 at a position corresponding to each of scanning steps of the WBPF 12 to acquire a plurality of images each having a different spectral sensitivity among pixels of the image at the position corresponding to the each of the scanning steps.

Abstract: An apparatus for measuring a goniometric reflection property of a sample has: one or more illuminators; a toroidal mirror which is rotationally symmetrical around a center axis effectively contacting with a surface of the sample; a light receiver having an incident aperture on the center axis; a rotating optics which rotates around a rotation axis which effectively coincides with the center axis; and a controller for controlling operations of the illuminators, the light receiver, and the rotating optics, wherein the toroidal mirror reflects light fluxes emitted from the surface of the sample illuminated by the one or more illuminators in emitting directions perpendicular to the center axis and directs each of the light fluxes to the center axis, and wherein the rotating optics specifies one of the light fluxes reflected by the toroidal mirror and directs the specified light flux to the incident aperture of the light receiver.

Abstract: A spectroradiometer is calibrated by a calibration source including a plurality of monochromatic sources for emitting monochromatic rays having different wavelengths from each other, respectively; a reference light emitter for emitting monochromatic reference light by receiving the monochromatic rays emitted from the monochromatic sources; a reference sensor for measuring a reference intensity of the monochromatic reference light emitted from the reference light emitter; and a controller for controlling the emission of the monochromatic rays by the monochromatic sources, and the measurement of the reference intensity of the monochromatic reference light by the reference sensor.

Abstract: An output current from each pixel sensor can be extracted at an arbitrary ratio by a current divider. An arithmetic control unit sets the dividing ratio in correspondence to a color matching function. The current components are added together by a summing amplifier so that a signal corresponding to a tristimulus value is composed and then converted into a digital signal. That is, weighting by weight factors corresponding to color matching functions of CIE 2-degree observer is performed in a stage of analog signal processing.

Abstract: In a multi-angle colorimeter having an illumination system that illuminates a sample surface and a plurality of light receiving systems that receive reflected light therefrom, an illumination system for orientation error detection is provided that illuminates the sample surface from substantially close direction to the normal of the sample surface. Actual measured reflectance factor is corrected based on the specific approximation function obtained from the measured reflectance factor and detected orientation error.

Abstract: The battery housing structure having the battery cavity for housing the battery and the battery cavity lid for closing the opening of the battery cavity, is provided with: the pushing portion for pushing the battery housed in the battery cavity toward the battery cavity lid; the supporting member that supports the battery cavity lid so as to be pivotable about the shaft substantially parallel to the pushing direction of the pushing portion; the battery armature that is provided on the battery cavity lid and is in contact with the electrode of the battery housed in the battery cavity; the slanting part provided on the side, of the battery armature, that comes into contact with the electrode of the battery first when the battery cavity lid is pivoted from the position to open the battery cavity to the position to close the battery cavity. The battery armature pivots while pushing the battery housed in the battery cavity in the direction of the pushing portion.

Abstract: In an operation guide customizable measuring instrument constructed such that an operation guide for guiding an operation procedure of the instrument is displayable on a display section, and an instrument mechanism for measuring a physical quantity of an object to be measured is operable by an instrument control program equipped with a function which is callable in response to a predetermined command, the instrument has an operation guide storage which variably stores an operation guide file containing the operation guide and the command written in a markup language and a script language therein; an operation guide file processing part which displays the operation guide on the display section based on the operation guide file, and displays an instruction input section for accepting an instruction of an operator on the display section; and a command processing part which outputs the command to the instrument control program so as to call the function corresponding to the command in response to the instruction

Abstract: A calibration light source outputs emission lines having a known emission-line wavelength, a spectral luminometer to be calibrated measures an emission-line output of the calibration light source, and a system control unit calibrates the wavelength of the spectral luminometer by estimating the wavelength of the emission-line output from ratios of outputs of a light receiving unit at a plurality of measurement wavelengths neighboring an emission-line wavelength and estimating a wavelength change amount from a difference between the estimated wavelength of the emission-line output and the known emission-line wavelength. The wavelength and the sensitivity of a spectral luminometer can be calibrated at a user side.

Abstract: A spectrometer for correcting a displacement of a dispersed light image having a light source for outputting a monochromatic ray of light, an optical system which images a dispersed light image of the monochromatic ray through an incident slit on an imaging plane, a sensor array, and a calculator for calculating a variation in an imaging position of a primary dispersed light image of the monochromatic ray through the incident slit on the imaging plane from its initial position as a first image displacement amount, and a variation in an imaging position of a secondary dispersed light image of the monochromatic ray through the incident slit from its initial position as a second image displacement amount, and calculating, based on the first and second image displacement amounts, a third image displacement amount which is free of an influence due to a fluctuation of a wavelength of the monochromatic ray.