Patents Assigned to Lam Corporation
  • Patent number: 8441268
    Abstract: A system for detecting fluid on a substrate is provided. The system includes, but is not limited to, a sensor board, a first capacitive sensor, and a platform upon which the substrate is to be placed. The first capacitive sensor is mounted on the sensor board. The first capacitive sensor has a transmit sensor pad for transmitting a signal, a receive sensor pad for receiving the signal, and an analog-to-digital convertor connected with the receive sensor pad for analyzing the received signal. The platform is a first distance from the transmit and receive sensor pads.
    Type: Grant
    Filed: April 6, 2010
    Date of Patent: May 14, 2013
    Assignee: Lam Corporation
    Inventors: Peter Norton, Charley Abboud
  • Patent number: 7009281
    Abstract: A system and method of processing a substrate including loading a substrate into a plasma chamber and setting a pressure of the plasma chamber to a pre-determined pressure set point. Several inner surfaces that define a plasma zone are heated to a processing temperature of greater than about 200 degrees C. A process gas is injected into the plasma zone to form a plasma and the substrate is processed.
    Type: Grant
    Filed: December 22, 2003
    Date of Patent: March 7, 2006
    Assignee: Lam Corporation
    Inventors: Andrew D. Bailey, III, Tuqiang Ni
  • Publication number: 20040119469
    Abstract: A system and method for determining a component of an eddy current sensor (ECS) signal attributable to a substrate includes placing a substrate in a first position relative to an ECS at a first distance from the ECS. The substrate can include a conductive film on a first surface of the substrate. A first ECS signal can be detected with the substrate in the first position. The substrate can then be inverted relative to the ECS such that the substrate is in a second position relative to the ECS at a second distance from the ECS. The second distance is equal to the first distance less about a thickness of the substrate. A second ECS signal is detected with the substrate in the second position. A difference signal is determined. The difference signal is equal to a difference between a first signal level on a calibration graph for the ECS and the second signal level. The second signal level being shifted a distance about equal to the thickness of the substrate.
    Type: Application
    Filed: December 23, 2002
    Publication date: June 24, 2004
    Applicant: LAM CORPORATION
    Inventor: Yehiel Gotkis