Abstract: The present invention relates to a cryopreparation chamber (100) for preparing and manipulating a sample for electron microscopy, the cryopreparation chamber (100) being cooled by a primary cryogen, the cryopreparation chamber (100) including a first and a second chamber portion (101,102), the second chamber portion (102) being detachably placeable (101) on the first chamber portion (101), and moreover, the second chamber portion (102) being provided, in its outer wall (106), with an access port (107) through which a specimen holder (108) for an electron microscope can be inserted into the cryopreparation chamber (100). The present invention also relates to a cryopreparation device (200) which is suitable for cryopreparing a sample for an electron microscope and includes such a cryopreparation chamber (100).

Abstract: A method for preparing a hydrous, cryopreserved sample that is enclosed in a sample container (1, 1a, 1b, 1c), in the case of which, at least sample material is introduced into the sample container; this is then sealed pressure-tight and subsequently cooled by a cryogen (8) in a temporal and spatial sequence, a sacrificial region (4) of the container contents (2) initially solidifying and, only subsequently thereto, the entire container contents solidifying. A sample container (1a) that may be preferably used in this case is designed to be tubular, sealed at both ends thereof, and to essentially have a U-shaped form.

Abstract: A sample stage for processing a sample in an ion beam etching apparatus has positioning arrangements each having a receiving apparatus and a mask, a sample being mountable in the receiving apparatus with reference to an ion beam and positionable relative to the mask. The sample stage includes a mechanism that enables a switchover between respective positioning arrangements so a selected positioning arrangement is respectively orientable toward the ion beam. The sample in the selected positioning arrangement is exposed to the ion beam while the remaining positioning arrangements face away from the ion beam. The positioning arrangements are arranged in one common vessel. A method for sequential preparation of at least two samples in an ion beam etching unit using the sample stage is also disclosed.

Abstract: For cooled processing of a sample, a system for cooling the sample includes a holding device (22) for receiving the sample in a sample holder (20), as well as a cooling chamber (12) that surrounds the position (P) of the sample mounted on the holding device. Provided in the cooling chamber (12) is a window through which a tool receptacle (16) for receiving a tool (W) for processing the sample projects into the cooling chamber (12). The holding device (22) is coolable to a settable temperature by means of a fluid coolant, and ensures cooling of the sample. For this, a coolant, e.g. liquid nitrogen, flows through a coolant conduit of the holding device (22), which conduit is furnished with the coolant at the input end (31) and opens at the output end (41) into the cooling chamber (12), which in this fashion is filled with coolant gas.

Abstract: A sample stage for processing a sample in an ion beam etching apparatus has positioning arrangements each having a receiving apparatus and a mask, a sample being mountable in the receiving apparatus with reference to an ion beam and positionable relative to the mask. The sample stage includes a mechanism that enables a switchover between respective positioning arrangements so a selected positioning arrangement is respectively orientable toward the ion beam. The sample in the selected positioning arrangement is exposed to the ion beam while the remaining positioning arrangements face away from the ion beam. The positioning arrangements are arranged in one common vessel. A method for sequential preparation of at least two samples in an ion beam etching unit using the sample stage is also disclosed.

Abstract: The invention relates to a cooling apparatus (101) for a sample in an ion beam etching process, including, a sample stage (102) for arranging the sample, a coolant receptacle (120) containing a coolant, at least one thermal conduction element (106a, 106b) that connects the sample stage (102) to the coolant, a cooling finger (105) connected to the thermal conduction element (106a, 106b), the cooling finger (105) comprising a conduit (130, 131) through which coolant can flow and which is connectable to the coolant receptacle (120). The invention further relates to a method of adjusting the temperature of a sample in an ion beam etching process, including mounting a sample on a coolable sample stage (102), aligning the sample on the sample stage (102), and cooling the sample by coolant directed through a conduit (130, 131) of a cooling finger.

Abstract: In an apparatus for microwave-assisted preparation of specimens with a microwave generator (1), a microwave chamber for receiving specimens (5) to be processed, and a container arrangement (11) for a number of containers (9) for liquids, the microwave chamber is realized as a waveguide (2) that includes a first opening (7a) for introduction of a specimen (5) and a second opening (8a), preferably arranged at the bottom, through which a liquid container (9) is reversibly introduced into the microwave chamber while the specimen (5) is held stationary, until the liquid container thus introduced into the microwave chamber, and the liquid contained therein, surround the specimen (5).

Abstract: A probe (1) for electron microscopy is cut from a solid material. A sample surface (3) is configured on the same, which is treated with an ion beam (J) at a predetermined angle of incidence such that the material is ablated from the sample surface (3) by means of etching until the desired observation surface (20) is exposed on the sample (1) in the region of the incidence zone (4) of the ion beam (J), which enables the viewing (12) of the desired region of the sample (1) using an electron microscope. For this purpose, at least two stationary ion beams (J1, J2) are guided onto the sample surface (3) at a predetermined angle (?) in alignment with each other such that the ion beams (J1, J2) at least come in contact with each other on the sample surface (3), or cross each other, and form an incidence zone (4) in that location, and that both the sample (1) and the ion beams (J1, J2) are not moved, and thus are operated in a stationary manner.

Abstract: A method and a device for preparing specimens for a cryo-electron microscope are described. A carrier is fixed to a holder, sample liquid is applied to the carrier, and a blotting device for removing excess sample liquid from the carrier by means of the absorbing medium is applied. The absorbing medium is illuminated with light and a change in the optical properties of the absorbing medium is detected by means of an optical sensor device. A control moves the blotting away from the carrier depending on a change in the detected optical properties.

Abstract: An apparatus (1) for processing specimens (15), comprising an observation device (2), a specimen holder (3) for receiving the specimen (15) to be processed, and a tool holder (6), the tool holder (6) being pivotable in a plane normal to its longitudinal axis (L?) by a pivot arm (22), and being rotatable about its longitudinal axis (L?); furthermore a drive system for selectable execution of the pivoting of the pivot arm (22) is provided.

Abstract: The present invention relates to a method for positioning a cutting knife of a microtome or ultramicrotome equipped with motors for moving the cutting knife, the following steps being carried out: a) determining/defining at least two segments of the cutting knife according to a division of the previously defined width of the cutting knife; b) selecting a segment of the cutting knife; and c) positioning the cutting knife in an operational position by motorized movement of the cutting knife, wherein the selected segment of the cutting knife is positioned to cut the specimen.

Abstract: The present invention relates to a cryopreparation chamber (100) for preparing and manipulating a sample for electron microscopy, the cryopreparation chamber (100) being cooled by a primary cryogen, the cryopreparation chamber (100) including a first and a second chamber portion (101,102), the second chamber portion (102) being detachably placeable (101) on the first chamber portion (101), and moreover, the second chamber portion (102) being provided, in its outer wall (106), with an access port (107) through which a specimen holder (108) for an electron microscope can be inserted into the cryopreparation chamber (100). The present invention also relates to a cryopreparation device (200) which is suitable for cryopreparing a sample for an electron microscope and includes such a cryopreparation chamber (100).

Abstract: A method for preparing a hydrous, cryopreserved sample that is enclosed in a sample container (1, 1a, 1b, 1c), in the case of which, at least sample material is introduced into the sample container; this is then sealed pressure-tight and subsequently cooled by a cryogen (8) in a temporal and spatial sequence, a sacrificial region (4) of the container contents (2) initially solidifying and, only subsequently thereto, the entire container contents solidifying. A sample container (1a) that may be preferably used in this case is designed to be tubular, sealed at both ends thereof, and to essentially have a U-shaped form.

Abstract: A method and a device for preparing specimens for a cryo-electron microscope are described. A carrier is fixed to a holder, sample liquid is applied to the carrier, and a blotting device for removing excess sample liquid from the carrier by means of the absorbing medium is applied. The absorbing medium is illuminated with light and a change in the optical properties of the absorbing medium is detected by means of an optical sensor device. A control moves the blotting away from the carrier depending on a change in the detected optical properties.

Abstract: A specimen holder (10) is proposed in order to create a capability for preparing, in a cutting device, in particular a microtome or ultramicrotome, a specimen that is to examined in an AFM. The specimen holder (10) is embodied in several parts. It comprises an insert (12) in which the specimen is secured. Also provided is a receiving ring (14) in which the insert (12) can be received. The insert together with the receiving ring (14) is mounted, in particular thread-joined, on a base element (16). As a result of the mounting of the receiving ring (14) on the base element (16), the insert together with the specimen is fixed in its position.

Abstract: A knife holder for a microtome having a vibrating knife comprises a support element and a clamping element movable relative to the support element. The support element is embodied with a support surface for the knife, and the clamping element is embodied with a clamping surface. For clamping the knife, the support surface and clamping surface are settable at a distance of 0.1 to 1.5 from one another.

Abstract: A specimen holder for a high-pressure freezing device comprises a first shaped part (2) and a second shaped part (3) that form, in the mutually joined state, a specimen space (6). The first shaped part (2) is embodied in a cup shape, and possesses a bottom (5) that closes off the specimen chamber (6) toward the outside to prevent contact between the specimen and a pressure medium.

Abstract: An automatic loading apparatus (12) for specimens (1) for high-pressure cryosubstitution is disclosed. The automatic loading apparatus (12) is connected to a high-pressure freezing device (40). Specimens (1) are inserted in a holder (2). By means of a slider (4), the specimens (1) and holders (2) are conveyed to the automatic loading apparatus (12). The guidance element (26) allows exact positioning of the holder (2) in the clamping element (14). The automatic loading apparatus makes possible rapid transfer of the holder (2) having the specimen (1) from, for example, an optical microscope to the high-pressure freezing device (40).

Abstract: An apparatus and a method for cryosubstitution and embedding of biological specimens is disclosed. The apparatus encompasses a container (6) for receiving at least one specimen carrier (2) having a specimen (4). The specimen carriers (2) are placed into troughs (12) of the container (6). Configured in each trough is a step (20) by which the specimen carrier (2), together with the specimen (4), is held in the container (6).