Patents Assigned to Lieven Van Hoe
  • Patent number: 8064663
    Abstract: The present invention relates to a method and system for evaluating at least one abnormality in one or more medical images of a subject comprising: (a) determining the location of each abnormality from pre-defined selection, (b) determining the pattern of each abnormality from pre-defined selection, (c) accessing a multidimensional database comprising data of patterns, locations, and conditions associated therewith, in which the database comprises data of each of patterns, locations, and conditions is comprised in separate dimension(s), and characteristic information for patterns, locations, and conditions is organized in the database into discrete categories, (d) extracting from the multidimensional database a list of conditions corresponding to the imaging data determined in steps (a) and (b), (e) providing an evaluation of abnormality using list obtained in step (d). The invention also relates to a database, computer program, system for navigating the database, a method for entering data into a database.
    Type: Grant
    Filed: December 1, 2005
    Date of Patent: November 22, 2011
    Assignee: Lieven Van Hoe
    Inventors: Lieven Van Hoe, Bart Verweire