Patents Assigned to Livewire Test Labs, Inc.
  • FAULT DETECTION USING COMBINED REFLECTOMETRY AND ELECTRONIC PARAMETER MEASUREMENT
    Publication number: 20110181295
    Abstract: Systems and methods for detecting a fault in an electronic conductor are provided. Electronic parameter measurements are combined with reflectometry profiles to determine when faults are present on the electronic conductor.
    Type: Application
    Filed: January 19, 2011
    Publication date: July 28, 2011
    Applicant: LIVEWIRE TEST LABS, INC.
    Inventors: Michael Lee Haugen, Michael Paul Masquelier, James Craig Stephenson, Michael Paul Diamond, Steven Andrew Kerr
  • System and method to locate an anomaly of a conductor
    Patent number: 7075309
    Abstract: A system (20) and method to locate an anomaly (22) of a conductor (24) is provided. The system (20) uses a test set (28) to inject a test signal (36) into the conductor (24) at a location (PT) and a probe (30) to detect the test signal (36) at a second location (PP). A communication link (42) between the probe (30) and the test set (28) has a predetermined propagation delay (DS), from which the system (20) can calculate a propagation delay (DTP) of the conductor (24) between the test set (28) and the probe (30), and a propagation delay (DPA) between the probe (30) and the anomaly (22). By varying the location (PP) of the probe (30) until the propagation delay (DPA) between the probe (30) and the anomaly (22) is substantially zero, the precise location (PA) of the anomaly (22) may be determined. The propagation velocity (VC) of the conductor (24) may also be determined.
    Type: Grant
    Filed: March 7, 2005
    Date of Patent: July 11, 2006
    Assignee: Livewire Test Labs, Inc.
    Inventor: Paul Samuel Smith
  • System and Method to Locate an Anomaly of a Conductor
    Publication number: 20050194978
    Abstract: A system (20) and method to locate an anomaly (22) of a conductor (24) is provided. The system (20) uses a test set (28) to inject a test signal (36) into the conductor (24) at a location (PT) and a probe (30) to detect the test signal (36) at a second location (PP). A communication link (42) between the probe (30) and the test set (28) has a predetermined propagation delay (DS), from which the system (20) can calculate a propagation delay (DTP) of the conductor (24) between the test set (28) and the probe (30), and a propagation delay (DPA) between the probe (30) and the anomaly (22). By varying the location (PP) of the probe (30) until the propagation delay (DPA) between the probe (30) and the anomaly (22) is substantially zero, the precise location (PA) of the anomaly (22) may be determined. The propagation velocity (VC) of the conductor (24) may also be determined.
    Type: Application
    Filed: March 7, 2005
    Publication date: September 8, 2005
    Applicant: LIVEWIRE TEST LABS, INC.
    Inventor: Paul Smith