Patents Assigned to Lumetric, Inc.
  • Publication number: 20200393240
    Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.
    Type: Application
    Filed: August 27, 2020
    Publication date: December 17, 2020
    Applicant: Lumetrics, Inc.
    Inventors: Michael A. Marcus, Kyle J. Hadcock, Donald S. Gibson, Filipp V. Ignatovich
  • Patent number: 10761021
    Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.
    Type: Grant
    Filed: October 29, 2018
    Date of Patent: September 1, 2020
    Assignee: Lumetrics, Inc.
    Inventors: Michael A. Marcus, Kyle J. Hadcock, Donald S. Gibson, Filipp V. Ignatovich
  • Publication number: 20190162660
    Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference database of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material, and an apparatus for performing the methods are also disclosed.
    Type: Application
    Filed: October 29, 2018
    Publication date: May 30, 2019
    Applicant: Lumetrics, Inc.
    Inventors: Michael A. MARCUS, Kyle J. HADCOCK, Donald S. GIBSON, Filipp V. IGNATOVICH
  • Patent number: 10190977
    Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference data base of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material is also disclosed.
    Type: Grant
    Filed: May 3, 2017
    Date of Patent: January 29, 2019
    Assignee: LUMETRICS, INC.
    Inventors: Michael A. Marcus, Donald S. Gibson, Kyle J. Hadcock, Filipp V. Ignatovich
  • Publication number: 20180321145
    Abstract: A method of identifying the material and determining the physical thickness of each layer in a multilayer structure is disclosed. The method includes measuring the optical thickness of each of the layers of the multilayer object as a function of wavelength of a light source and calculating a normalized group index of refraction dispersion curve for each layer in the multilayer structure. The measured normalized group index of refraction dispersion curves for each of the layers is then compared to a reference data base of known materials and the material of each layer is identified. The physical thickness of each layer is then determined from the group index of refraction dispersion curve for the material in each layer and the measured optical thickness data. A method for determining the group index of refraction dispersion curve of a known material is also disclosed.
    Type: Application
    Filed: May 3, 2017
    Publication date: November 8, 2018
    Applicant: Lumetrics, Inc.
    Inventors: Michael A. MARCUS, Donald S. GIBSON, Kyle J. HADCOCK, Filipp V. IGNATOVICH
  • Patent number: 10006754
    Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.
    Type: Grant
    Filed: September 19, 2016
    Date of Patent: June 26, 2018
    Assignee: Lumetrics, Inc.
    Inventors: Donald S. Gibson, Filipp V. Ignatovich, Michael A. Marcus
  • Patent number: 9958355
    Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
    Type: Grant
    Filed: May 13, 2016
    Date of Patent: May 1, 2018
    Assignee: Lumetrics, Inc.
    Inventors: Filipp V. Ignatovich, Donald S. Gibson, Michael A. Marcus
  • Publication number: 20170102222
    Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.
    Type: Application
    Filed: September 19, 2016
    Publication date: April 13, 2017
    Applicant: Lumetrics, Inc.
    Inventors: Donald S. GIBSON, Filipp V. IGNATOVICH, Michael A. MARCUS
  • Patent number: 9506837
    Abstract: An apparatus for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens, the fiducial marks defining an estimate of the angular orientation of the meridional axis of the intraocular is disclosed. The apparatus includes a rotatable intraocular lens holder coupled to drive assembly and an actuator which are mounted into an optical measurement cell receptacle of a wavefront measuring instrument or an angular error measuring instrument. A method for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens is also disclosed.
    Type: Grant
    Filed: April 16, 2014
    Date of Patent: November 29, 2016
    Assignee: Lumetrics, Inc.
    Inventors: John Solpietro, David Compertore, Michael A. Marcus
  • Patent number: 9448058
    Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.
    Type: Grant
    Filed: October 31, 2014
    Date of Patent: September 20, 2016
    Assignee: Lumetrics, Inc.
    Inventors: Donald S. Gibson, Filipp V. Ignatovich, Michael A. Marcus
  • Publication number: 20160252425
    Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
    Type: Application
    Filed: May 13, 2016
    Publication date: September 1, 2016
    Applicant: LUMETRICS, INC.
    Inventors: Filipp V. IGNATOVICH, Donald S. GIBSON, Michael A. MARCUS
  • Patent number: 9341541
    Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
    Type: Grant
    Filed: March 31, 2015
    Date of Patent: May 17, 2016
    Assignee: Lumetrics, Inc.
    Inventors: Filipp V. Ignatovich, Donald S. Gibson, Michael A. Marcus
  • Publication number: 20160123716
    Abstract: An interferometer apparatus which include two or more coupled fiber optic Michelson interferometers using fiber optic stretches which stretch two or more optical fibers wound around the perimeter of the optical fiber stretchers by the same amount is disclosed. Preferably a pair of reference and sample fiber optic stretches are utilized which run in a push-pull mode of operation. When one of the interferometers is a coherent light interferometer it can be used as a reference distance scale for all of the remaining low coherence light interferometer. A method for measuring a physical property of a device under test is also disclosed using the apparatus of the present invention.
    Type: Application
    Filed: October 31, 2014
    Publication date: May 5, 2016
    Applicant: Lumetrics, Inc.
    Inventors: Donald S. GIBSON, Filipp V. IGNATOVICH, Michael A. MARCUS
  • Publication number: 20150297401
    Abstract: An apparatus for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens, the fiducial marks defining an estimate of the angular orientation of the meridional axis of the intraocular is disclosed. The apparatus includes a rotatable intraocular lens holder coupled to drive assembly and an actuator which are mounted into an optical measurement cell receptacle of a wavefront measuring instrument or an angular error measuring instrument. A method for determining the angular error in the placement of fiducial marks on a toric intraocular lens with respect to the true location of a meridional axis of the intraocular lens is also disclosed.
    Type: Application
    Filed: April 16, 2014
    Publication date: October 22, 2015
    Applicant: LUMETRICS, INC.
    Inventors: John SOLPIETRO, David COMPERTORE, Michael A. MARCUS
  • Publication number: 20150204756
    Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
    Type: Application
    Filed: March 31, 2015
    Publication date: July 23, 2015
    Applicant: LUMETRICS, INC.
    Inventors: Filipp V. IGNATOVICH, Donald S. GIBSON, Michael A. MARCUS
  • Patent number: 9019485
    Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
    Type: Grant
    Filed: March 11, 2013
    Date of Patent: April 28, 2015
    Assignee: Lumetrics, Inc.
    Inventors: Filipp V. Ignatovich, Donald S. Gibson, Michael A. Marcus
  • Patent number: 8836778
    Abstract: A portable hand-held camera for imaging the fundus of an eye, the camera comprising a housing comprising an internal cavity terminating at a forward housing end, a forward lens, and a light source configured to direct light from locations distributed around the perimeter of the forward lens forwardly out of the housing end. In other embodiment, a portable hand-held camera for imaging the fundus of an eye includes optics configured to focus light reflected back from the fundus onto an image receptor, with the optics being capable of varying the field of view among differing portions of the fundus. Methods to ensure unique image identification and storage are described.
    Type: Grant
    Filed: December 4, 2010
    Date of Patent: September 16, 2014
    Assignee: Lumetrics, Inc.
    Inventors: Filipp V. Ignatovich, David M. Kleinman, Christopher T. Cotton, Todd Blalock
  • Publication number: 20140253907
    Abstract: An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
    Type: Application
    Filed: March 11, 2013
    Publication date: September 11, 2014
    Applicant: LUMETRICS, INC.
    Inventors: Filipp V. IGNATOVICH, Donald S. GIBSON, Michael A. MARCUS
  • Patent number: 8610899
    Abstract: A scanning system comprised of a multi-axis drive module comprised of a first linear drive operable along a first axis, a second linear drive joined to the first linear drive and operable along a second axis non-parallel to the first axis, and a first rotary drive mounted on the second linear drive, operable around an axis parallel to the first axis, and comprised of a rotary fixture for holding the object. A first optical probe is provided for scanning the object. The rotary fixture for holding the object may include a central object-receiving port. A first fluid circuit may be provided, which is in communication with the central object-receiving port. In that manner, an internal cavity of the object may be pressurized through a passageway in the portion of the object that is disposed in the central object-receiving port, thereby stabilizing a region of the object to be scanned.
    Type: Grant
    Filed: December 2, 2010
    Date of Patent: December 17, 2013
    Assignee: Lumetrics, Inc.
    Inventors: Kyle J. Hadcock, Stephen Heveron-Smith, Vincent Lamanna, David Baranson
  • Publication number: 20120287255
    Abstract: A portable hand-held camera for imaging the fundus of an eye, the camera comprising a housing comprising an internal cavity terminating at a forward housing end, a forward lens, and a light source configured to direct light from locations distributed around the perimeter of the forward lens forwardly out of the housing end. In other embodiment, a portable hand-held camera for imaging the fundus of an eye includes optics configured to focus light reflected back from the fundus onto an image receptor, with the optics being capable of varying the field of view among differing portions of the fundus. Methods to ensure unique image identification and storage are described.
    Type: Application
    Filed: December 4, 2010
    Publication date: November 15, 2012
    Applicant: LUMETRICS, INC.
    Inventors: Filipp V. Ignatovich, David M. Kleinman, Christopher T. Cotton, Todd Blalock