Patents Assigned to Materials Research Corporation
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Patent number: 9429422Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.Type: GrantFiled: November 4, 2013Date of Patent: August 30, 2016Assignee: Systems & Materials Research CorporationInventors: Alan V. Bray, Matthew Lindsey
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Publication number: 20160106142Abstract: A 3D food printing system, which can deposit macro- and micro-nutrients in an additive process to prepare a wide variety of different types of food. According to embodiments described herein, a 3D printed food system can be used to rapidly and efficiently prepare meals on demand, rather than in advance, while also allowing nutritional content, flavor, and taste to be customized for individual crew members. In some embodiments, the food can also be prepared in a largely or even completely automated fashion.Type: ApplicationFiled: May 22, 2014Publication date: April 21, 2016Applicant: Systems and Materials Research CorporationInventors: Anjan CONTRACTOR, David James IRVIN, Malcolm David PROUTY, Keris Allrich WARD, Jesse Baskin MCDANIEL
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Patent number: 9068583Abstract: An apparatus for making and using a fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to a moisture source. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a premature cure indicator that provides a visual indication that the outer moisture resistant layer has been damaged.Type: GrantFiled: November 2, 2011Date of Patent: June 30, 2015Assignee: Systems & Materials Research CorporationInventors: Alan V. Bray, Denise Deppe, David J. Irvin, Leslie Schmidt
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Patent number: 8869579Abstract: A fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to atmospheric moisture. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a moisture indicator that provides a visual indication that the outer moisture resistant layer has been damaged.Type: GrantFiled: December 29, 2011Date of Patent: October 28, 2014Assignee: Systems & Materials Research CorporationInventors: Alan V. Bray, Denise Dama Deppe, Gary Schmidt, John Lee Massingill, Pulinkumar Navinbhai Patel, Clois E. Powell, Vijaykumar Madhawrao Mannari
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Publication number: 20140283987Abstract: A method for rapidly adhering thermoplastic polyurethane (TPU) material to a void in a metallic surface, the method comprising placing a solid volume of a TPU over metallic surface; directing a laser toward the TPU; applying pressure on the TPU; and irradiating the TPU material until the material melts and adheres to the metallic surface. Some embodiments make use of a hand-held near-infrared radiation laser tool to irradiate the TPU material, the laser tool comprising a laser optics and fiber; a housing for holding said laser optics and fiber and maintaining a desired distance and orientation of the laser relative to the fastener to be filled; electronics for controlling said laser; a collimator; a beam expander; a laser shield; and a conformal dome or a flat pressure head for holding a solid portion of a filler material in place while the beam is used to melt the material and for applying pressure to the melted filler material.Type: ApplicationFiled: March 19, 2014Publication date: September 25, 2014Applicant: Systems and Materials Research CorporationInventors: Anjan CONTRACTOR, Malcolm David PROUTY, Jesse Baskin MCDANIEL, Keris Allrich WARD, Christopher M. PAVLOS, Christopher Young INGHAM
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Publication number: 20140152487Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.Type: ApplicationFiled: November 4, 2013Publication date: June 5, 2014Applicant: Systems and Materials Research CorporationInventors: Alan V. BRAY, Matthew LINDSEY
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Patent number: 8581602Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.Type: GrantFiled: August 5, 2010Date of Patent: November 12, 2013Assignee: Systems and Materials Research CorporationInventors: Alan V. Bray, Matthew Lindsey
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Publication number: 20120168055Abstract: An apparatus for making and using a fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to a moisture source. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a premature cure indicator that provides a visual indication that the outer moisture resistant layer has been damaged.Type: ApplicationFiled: November 2, 2011Publication date: July 5, 2012Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATIONInventors: ALAN V. BRAY, DENISE DEPPE, LESLIE SCHMIDT, DAVID J. IRVIN
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Patent number: 8149160Abstract: A non-contact, distance traveled measurement system (DTMS) to calculate speed and distance traveled by a vehicle over rails—more specifically, by trains traveling on standard railroad tracks. Preferably, a pair of short range (near field) microwave-based transmitters/sensors (transceivers) are mounted on the underside of the train and used to key on rail-bed features such as cross ties or tie plates. Preferred embodiments also include infrared sensors as a redundant channel that is less sensitive to moisture in the track bed. Data from the sensors is correlated to determine the time delay between the first and second sensors' passage over objects on the rail bed such as cross-ties or tie-plates. From this time delay, nearly instantaneous velocity can be computed at each given target such as a tie plate (metal target) or a tie (dielectric contrast target). Velocity versus time curves can be integrated over time to derive distance traveled.Type: GrantFiled: October 27, 2010Date of Patent: April 3, 2012Assignee: Systems and Materials Research CorporationInventors: Alan V. Bray, Sean McNeal, Jesse McDaniel
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Publication number: 20110115668Abstract: A non-contact, distance traveled measurement system (DTMS) to calculate speed and distance traveled by a vehicle over rails—more specifically, by trains traveling on standard railroad tracks. Preferably, a pair of short range (near field) microwave-based transmitters/sensors (transceivers) are mounted on the underside of the train and used to key on rail-bed features such as cross ties or tie plates. Preferred embodiments also include infrared sensors as a redundant channel that is less sensitive to moisture in the track bed. Data from the sensors is correlated to determine the time delay between the first and second sensors' passage over objects on the rail bed such as cross-ties or tie-plates. From this time delay, nearly instantaneous velocity can be computed at each given target such as a tie plate (metal target) or a tie (dielectric contrast target). Velocity versus time curves can be integrated over time to derive distance traveled.Type: ApplicationFiled: October 27, 2010Publication date: May 19, 2011Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATIONInventors: ALAN V. BRAY, Sean McNeal, Jesse McDaniel
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Publication number: 20110050248Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.Type: ApplicationFiled: August 5, 2010Publication date: March 3, 2011Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATIONInventors: Alan V. Bray, Matthew Lindsey
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Patent number: 7705610Abstract: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film.Type: GrantFiled: March 3, 2008Date of Patent: April 27, 2010Assignee: System & Material Research CorporationInventors: Alan V. Bray, Claude H. Garrett, Christian J. Corley
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Publication number: 20090066344Abstract: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film.Type: ApplicationFiled: March 3, 2008Publication date: March 12, 2009Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATIONInventors: Alan V. Bray, Claude H. Garrett, Christian J. Corley
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Patent number: 7339382Abstract: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film.Type: GrantFiled: November 10, 2005Date of Patent: March 4, 2008Assignee: Systems & Materials Research CorporationInventors: Alan V. Bray, Claude H. Garrett, Christian J. Corley
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Patent number: 6475353Abstract: Apparatus and method for sputter depositing a layer of material comprises a sputtering chamber having an internal conductive wall which provides an electrical reference for plasma during sputter deposition. A conductive shield positioned in the processing space of the chamber between the target and the substrate is configured for capturing sputtered material which would deposit on the chamber wall surface during sputter deposition. The conductive shield reduces the amount of sputtered material depositing on the chamber wall and maintains a surface portion of the wall as a generally stable electrical reference for the plasma and is further operable for passing plasma therethrough during deposition to contact the stable electrical reference.Type: GrantFiled: May 22, 1997Date of Patent: November 5, 2002Assignees: Sony Corporation, Materials Research CorporationInventor: Alexander D. Lantsman
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Patent number: 6042777Abstract: There is provided a method for fabricating intermetallic sputter targets of two or more elements in which a mixture of two or more elemental powders are blended and synthesized within a pressing apparatus at a temperature below the melting point of the lowest melting point element in the mixture, followed by heating the synthesized intermetallic powder in the pressing apparatus to a temperature below the melting point of the intermetallic structure while simultaneously applying pressure to the powder to achieve a final density greater than 90% of theoretical density. The powder metallurgy technique of the present invention provides a better microstructure than cast structures, and avoids contamination of the sputter target by eliminating the crushing step of synthesized intermetallic chunks necessitated by separate steps of synthesizing and pressing.Type: GrantFiled: August 3, 1999Date of Patent: March 28, 2000Assignees: Sony Corporation, Materials Research CorporationInventors: Chi-Fung Lo, Darryl Draper, Hung-Lee Hoo, Paul S. Gilman
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Patent number: 6039788Abstract: The present invention relates to a method of manufacturing high purity chromium suitable for deposition onto a semiconductor wafer or other substrate by sputtering. The process increases productivity, expands melting capability and provides consistent high purity chromium by reducing contamination by the dissolution of crucible material. The present invention provides for the addition of chromium oxide (Cr.sub.2 O.sub.3) to control oxygen content in chromium thereby producing high purity chromium ingots and protecting the ceramic crucibles from chemical attack by the liquid chromium.Type: GrantFiled: April 9, 1998Date of Patent: March 21, 2000Assignees: Sony Corporation, Materials Research CorporationInventors: Raymond K. F. Lam, Charles E. Melin, Guiseppe Colella
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Patent number: 6030514Abstract: A target for sputtering is subjected to a surface treatment process and special packaging after target manufacture for improved sputtering performance and process and yield by reducing particulates. The sputtering target is first surface treated to remove oxides, impurities and contaminants. The surface treated target is then covered with a metallic enclosure and, optionally, a passivating barrier layer. The metallic enclosure protects the target surface from direct contact with subsequently employed packaging material such as plastic bags, thereby eliminating sources of organic materials during sputtering operations. The surface treatment of the target removes deformed material, smearing, twins, or burrs and the like from the target surface, reducing "burn-in" or sputter conditioning time prior to production sputtering of thin films.Type: GrantFiled: May 2, 1997Date of Patent: February 29, 2000Assignees: Sony Corporation, Materials Research CorporationInventors: John A. Dunlop, Michael Goldstein, Gerald B. Feldewerth, Cari Shim, Stephan Schittny
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Patent number: 6010583Abstract: A high performance, high density sputtering target and a method of making. An aluminum and non-aluminum reactive metal powder blend is subjected to cold pressing under pressure, machining, evacuating, and hot pressing under pressure. The aluminum and non-aluminum metal react directly to yield a high performance, high density sputter target containing greater than about 2% aluminum with substantially uniform composition across the body.Type: GrantFiled: September 9, 1997Date of Patent: January 4, 2000Assignees: Sony Corporation, Materials Research CorporationInventors: Suresh Annavarapu, John Ettlinger, Tony Sica
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Patent number: 5993734Abstract: The invention relates to the manufacture of sputtering targets of tungsten-titanium alloy using high purity tungsten and titanium hydride powders. The powders are blended and placed in a containment vessel holding a die. The die is heated to a temperature of about 700.degree. C. to about 1000.degree. C. in an argon atmosphere while under pressure. The combination of temperature and pressure is high enough to dehydrate the titanium hydride and to remove the gases. The die is then heated to a higher temperature, in the range of about 1250.degree. C. to 1350.degree. C. while the pressure is increased so as to compact and alloy the powders. The pressure and temperature are held constant until there is no further movement of the ram. The resulting compacted alloy material is then machined to provide a sputtering target with a density between 96% and 100% of theoretical and a gas content less than 850 p.p.m.Type: GrantFiled: March 25, 1998Date of Patent: November 30, 1999Assignees: Sony Corporation, Materials Research CorporationInventors: Alfred Snowman, Thomas J. Hunt