Patents Assigned to Materials Research Corporation
  • Patent number: 9429422
    Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.
    Type: Grant
    Filed: November 4, 2013
    Date of Patent: August 30, 2016
    Assignee: Systems & Materials Research Corporation
    Inventors: Alan V. Bray, Matthew Lindsey
  • Publication number: 20160106142
    Abstract: A 3D food printing system, which can deposit macro- and micro-nutrients in an additive process to prepare a wide variety of different types of food. According to embodiments described herein, a 3D printed food system can be used to rapidly and efficiently prepare meals on demand, rather than in advance, while also allowing nutritional content, flavor, and taste to be customized for individual crew members. In some embodiments, the food can also be prepared in a largely or even completely automated fashion.
    Type: Application
    Filed: May 22, 2014
    Publication date: April 21, 2016
    Applicant: Systems and Materials Research Corporation
    Inventors: Anjan CONTRACTOR, David James IRVIN, Malcolm David PROUTY, Keris Allrich WARD, Jesse Baskin MCDANIEL
  • Patent number: 9068583
    Abstract: An apparatus for making and using a fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to a moisture source. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a premature cure indicator that provides a visual indication that the outer moisture resistant layer has been damaged.
    Type: Grant
    Filed: November 2, 2011
    Date of Patent: June 30, 2015
    Assignee: Systems & Materials Research Corporation
    Inventors: Alan V. Bray, Denise Deppe, David J. Irvin, Leslie Schmidt
  • Patent number: 8869579
    Abstract: A fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to atmospheric moisture. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a moisture indicator that provides a visual indication that the outer moisture resistant layer has been damaged.
    Type: Grant
    Filed: December 29, 2011
    Date of Patent: October 28, 2014
    Assignee: Systems & Materials Research Corporation
    Inventors: Alan V. Bray, Denise Dama Deppe, Gary Schmidt, John Lee Massingill, Pulinkumar Navinbhai Patel, Clois E. Powell, Vijaykumar Madhawrao Mannari
  • Publication number: 20140283987
    Abstract: A method for rapidly adhering thermoplastic polyurethane (TPU) material to a void in a metallic surface, the method comprising placing a solid volume of a TPU over metallic surface; directing a laser toward the TPU; applying pressure on the TPU; and irradiating the TPU material until the material melts and adheres to the metallic surface. Some embodiments make use of a hand-held near-infrared radiation laser tool to irradiate the TPU material, the laser tool comprising a laser optics and fiber; a housing for holding said laser optics and fiber and maintaining a desired distance and orientation of the laser relative to the fastener to be filled; electronics for controlling said laser; a collimator; a beam expander; a laser shield; and a conformal dome or a flat pressure head for holding a solid portion of a filler material in place while the beam is used to melt the material and for applying pressure to the melted filler material.
    Type: Application
    Filed: March 19, 2014
    Publication date: September 25, 2014
    Applicant: Systems and Materials Research Corporation
    Inventors: Anjan CONTRACTOR, Malcolm David PROUTY, Jesse Baskin MCDANIEL, Keris Allrich WARD, Christopher M. PAVLOS, Christopher Young INGHAM
  • Publication number: 20140152487
    Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.
    Type: Application
    Filed: November 4, 2013
    Publication date: June 5, 2014
    Applicant: Systems and Materials Research Corporation
    Inventors: Alan V. BRAY, Matthew LINDSEY
  • Patent number: 8581602
    Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.
    Type: Grant
    Filed: August 5, 2010
    Date of Patent: November 12, 2013
    Assignee: Systems and Materials Research Corporation
    Inventors: Alan V. Bray, Matthew Lindsey
  • Publication number: 20120168055
    Abstract: An apparatus for making and using a fastener suitable for use in airplane manufacture or repair that is coated with a pre-mixed moisture cure sealant. The sealant layer is coated with a frangible moisture barrier that will break apart when the fastener is installed, thus exposing the sealant to a moisture source. Once exposed to moisture, the sealant will begin to cure. Preferred embodiments also provide a premature cure indicator that provides a visual indication that the outer moisture resistant layer has been damaged.
    Type: Application
    Filed: November 2, 2011
    Publication date: July 5, 2012
    Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATION
    Inventors: ALAN V. BRAY, DENISE DEPPE, LESLIE SCHMIDT, DAVID J. IRVIN
  • Patent number: 8149160
    Abstract: A non-contact, distance traveled measurement system (DTMS) to calculate speed and distance traveled by a vehicle over rails—more specifically, by trains traveling on standard railroad tracks. Preferably, a pair of short range (near field) microwave-based transmitters/sensors (transceivers) are mounted on the underside of the train and used to key on rail-bed features such as cross ties or tie plates. Preferred embodiments also include infrared sensors as a redundant channel that is less sensitive to moisture in the track bed. Data from the sensors is correlated to determine the time delay between the first and second sensors' passage over objects on the rail bed such as cross-ties or tie-plates. From this time delay, nearly instantaneous velocity can be computed at each given target such as a tie plate (metal target) or a tie (dielectric contrast target). Velocity versus time curves can be integrated over time to derive distance traveled.
    Type: Grant
    Filed: October 27, 2010
    Date of Patent: April 3, 2012
    Assignee: Systems and Materials Research Corporation
    Inventors: Alan V. Bray, Sean McNeal, Jesse McDaniel
  • Publication number: 20110115668
    Abstract: A non-contact, distance traveled measurement system (DTMS) to calculate speed and distance traveled by a vehicle over rails—more specifically, by trains traveling on standard railroad tracks. Preferably, a pair of short range (near field) microwave-based transmitters/sensors (transceivers) are mounted on the underside of the train and used to key on rail-bed features such as cross ties or tie plates. Preferred embodiments also include infrared sensors as a redundant channel that is less sensitive to moisture in the track bed. Data from the sensors is correlated to determine the time delay between the first and second sensors' passage over objects on the rail bed such as cross-ties or tie-plates. From this time delay, nearly instantaneous velocity can be computed at each given target such as a tie plate (metal target) or a tie (dielectric contrast target). Velocity versus time curves can be integrated over time to derive distance traveled.
    Type: Application
    Filed: October 27, 2010
    Publication date: May 19, 2011
    Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATION
    Inventors: ALAN V. BRAY, Sean McNeal, Jesse McDaniel
  • Publication number: 20110050248
    Abstract: An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.
    Type: Application
    Filed: August 5, 2010
    Publication date: March 3, 2011
    Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATION
    Inventors: Alan V. Bray, Matthew Lindsey
  • Patent number: 7705610
    Abstract: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film.
    Type: Grant
    Filed: March 3, 2008
    Date of Patent: April 27, 2010
    Assignee: System & Material Research Corporation
    Inventors: Alan V. Bray, Claude H. Garrett, Christian J. Corley
  • Publication number: 20090066344
    Abstract: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film.
    Type: Application
    Filed: March 3, 2008
    Publication date: March 12, 2009
    Applicant: SYSTEMS AND MATERIALS RESEARCH CORPORATION
    Inventors: Alan V. Bray, Claude H. Garrett, Christian J. Corley
  • Patent number: 7339382
    Abstract: Wet and dry film thickness can be measured non-invasively on structures, such as surfaces associated with vessels, aircraft and buildings, using calibrated microwave sensors. The film is measured by directing microwave energy toward the film. The microwave energy passes through the film and is reflected by a reflective or semi-reflective substrate surface below the film. Properties of the reflected wave are compared with properties of reflected waves that were passed through calibration samples of known thicknesses to determine the unknown thickness of the film. In some embodiments, one or more sensors are maintained at a fixed altitude above the conductive/semi-conductive substrate for measurement, and in other embodiments, one or more sensors are maintained at a fixed altitude above the film.
    Type: Grant
    Filed: November 10, 2005
    Date of Patent: March 4, 2008
    Assignee: Systems & Materials Research Corporation
    Inventors: Alan V. Bray, Claude H. Garrett, Christian J. Corley
  • Patent number: 6475353
    Abstract: Apparatus and method for sputter depositing a layer of material comprises a sputtering chamber having an internal conductive wall which provides an electrical reference for plasma during sputter deposition. A conductive shield positioned in the processing space of the chamber between the target and the substrate is configured for capturing sputtered material which would deposit on the chamber wall surface during sputter deposition. The conductive shield reduces the amount of sputtered material depositing on the chamber wall and maintains a surface portion of the wall as a generally stable electrical reference for the plasma and is further operable for passing plasma therethrough during deposition to contact the stable electrical reference.
    Type: Grant
    Filed: May 22, 1997
    Date of Patent: November 5, 2002
    Assignees: Sony Corporation, Materials Research Corporation
    Inventor: Alexander D. Lantsman
  • Patent number: 6042777
    Abstract: There is provided a method for fabricating intermetallic sputter targets of two or more elements in which a mixture of two or more elemental powders are blended and synthesized within a pressing apparatus at a temperature below the melting point of the lowest melting point element in the mixture, followed by heating the synthesized intermetallic powder in the pressing apparatus to a temperature below the melting point of the intermetallic structure while simultaneously applying pressure to the powder to achieve a final density greater than 90% of theoretical density. The powder metallurgy technique of the present invention provides a better microstructure than cast structures, and avoids contamination of the sputter target by eliminating the crushing step of synthesized intermetallic chunks necessitated by separate steps of synthesizing and pressing.
    Type: Grant
    Filed: August 3, 1999
    Date of Patent: March 28, 2000
    Assignees: Sony Corporation, Materials Research Corporation
    Inventors: Chi-Fung Lo, Darryl Draper, Hung-Lee Hoo, Paul S. Gilman
  • Patent number: 6039788
    Abstract: The present invention relates to a method of manufacturing high purity chromium suitable for deposition onto a semiconductor wafer or other substrate by sputtering. The process increases productivity, expands melting capability and provides consistent high purity chromium by reducing contamination by the dissolution of crucible material. The present invention provides for the addition of chromium oxide (Cr.sub.2 O.sub.3) to control oxygen content in chromium thereby producing high purity chromium ingots and protecting the ceramic crucibles from chemical attack by the liquid chromium.
    Type: Grant
    Filed: April 9, 1998
    Date of Patent: March 21, 2000
    Assignees: Sony Corporation, Materials Research Corporation
    Inventors: Raymond K. F. Lam, Charles E. Melin, Guiseppe Colella
  • Patent number: 6030514
    Abstract: A target for sputtering is subjected to a surface treatment process and special packaging after target manufacture for improved sputtering performance and process and yield by reducing particulates. The sputtering target is first surface treated to remove oxides, impurities and contaminants. The surface treated target is then covered with a metallic enclosure and, optionally, a passivating barrier layer. The metallic enclosure protects the target surface from direct contact with subsequently employed packaging material such as plastic bags, thereby eliminating sources of organic materials during sputtering operations. The surface treatment of the target removes deformed material, smearing, twins, or burrs and the like from the target surface, reducing "burn-in" or sputter conditioning time prior to production sputtering of thin films.
    Type: Grant
    Filed: May 2, 1997
    Date of Patent: February 29, 2000
    Assignees: Sony Corporation, Materials Research Corporation
    Inventors: John A. Dunlop, Michael Goldstein, Gerald B. Feldewerth, Cari Shim, Stephan Schittny
  • Patent number: 6010583
    Abstract: A high performance, high density sputtering target and a method of making. An aluminum and non-aluminum reactive metal powder blend is subjected to cold pressing under pressure, machining, evacuating, and hot pressing under pressure. The aluminum and non-aluminum metal react directly to yield a high performance, high density sputter target containing greater than about 2% aluminum with substantially uniform composition across the body.
    Type: Grant
    Filed: September 9, 1997
    Date of Patent: January 4, 2000
    Assignees: Sony Corporation, Materials Research Corporation
    Inventors: Suresh Annavarapu, John Ettlinger, Tony Sica
  • Patent number: 5993734
    Abstract: The invention relates to the manufacture of sputtering targets of tungsten-titanium alloy using high purity tungsten and titanium hydride powders. The powders are blended and placed in a containment vessel holding a die. The die is heated to a temperature of about 700.degree. C. to about 1000.degree. C. in an argon atmosphere while under pressure. The combination of temperature and pressure is high enough to dehydrate the titanium hydride and to remove the gases. The die is then heated to a higher temperature, in the range of about 1250.degree. C. to 1350.degree. C. while the pressure is increased so as to compact and alloy the powders. The pressure and temperature are held constant until there is no further movement of the ram. The resulting compacted alloy material is then machined to provide a sputtering target with a density between 96% and 100% of theoretical and a gas content less than 850 p.p.m.
    Type: Grant
    Filed: March 25, 1998
    Date of Patent: November 30, 1999
    Assignees: Sony Corporation, Materials Research Corporation
    Inventors: Alfred Snowman, Thomas J. Hunt