Patents Assigned to Measurement Microsystems A-Z, Inc.
  • Patent number: 7315370
    Abstract: A flash optical performance monitor for monitoring DWDM channels is disclosed. The monitor is to assess the spectral quality of an optical signal received and to determine from changes in the spectral quality, relative to a known spectral quality indicative of an acceptable signal, an estimate of signal quality. The flash optical performance monitor comprises a spectroemetric transducer for performing a spectral decomposition of the optical signal received, and for transforming the decomposed optical signal into electrical-domain data, a memory for storing advanced digital signal processing routines, and a processor in connection with the wavelength optical unit and with the memory. The processor receives the advanced digital signal processing routines and the electrical spectral data, and applies the advanced digital signal processing routines to the electrical spectral data. Also a method for monitoring a quality of data transmission of at least one optical channel is disclosed.
    Type: Grant
    Filed: December 1, 2003
    Date of Patent: January 1, 2008
    Assignee: Measurement Microsystems A-Z Inc.
    Inventors: Andrzcj Barwicz, Roman Z. Morawski, Andrzej Miekina, Sebastien Lesueur, Tomasz Oleszczak
  • Patent number: 7084974
    Abstract: An apparatus and method for in situ spectral measurement is disclosed. The apparatus uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: August 1, 2006
    Assignee: Measurement Microsystems A-Z, Inc.
    Inventors: Andrzej Barwicz, Roman Z. Morawski, Mohamed B. Slima
  • Patent number: 6510257
    Abstract: A multi-wavelength polarization monitor for use in optical networks is disclosed. A received light signal is beam split into first and second signal portions using a beam splitter having known optical characteristics. Each of the first and second signal portions is then dispersed onto a detector array using a first and second dispersive element having known polarization-dependent characteristics. The signal portions are dispersed other than as channelized data within known channels. The dispersed first and second signal portions are then detected using a first and a second detector array and electrical signals in dependence thereupon are provided for A/D conversion and digital signal processing.
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: January 21, 2003
    Assignee: Measurement Microsystems A-Z Inc.
    Inventors: Andrzej Barwicz, Stephen William Roberts
  • Patent number: 6002479
    Abstract: An apparatus and method for in situ spectral measurement is disclosed. The apparatus uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data.
    Type: Grant
    Filed: May 19, 1998
    Date of Patent: December 14, 1999
    Assignee: Measurement Microsystems A-Z Inc.
    Inventors: Andrzej Barwicz, Roman Z. Morawski, Mohamed B. Slima
  • Patent number: 5991023
    Abstract: A method for spectral measurement is disclosed. The method uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data. The method is equally applicable to enhancing resolution of spectra captured using high resolution spectral imaging devices.
    Type: Grant
    Filed: May 19, 1998
    Date of Patent: November 23, 1999
    Assignee: Measurement Microsystems A-Z Inc.
    Inventors: Roman Z. Morawski, Andrzej Barwicz, Mohamed B. Slima, Andrzej Miekina