Abstract: Disclosed herein is a burn-in system with a plurality of plugs on test boards, including: a main body (100) which has a test chamber (200) with an open front side; a plurality of test boards (40) on which a plurality of semiconductor chips (90) are mounted and which is mounted in the test chamber (200); a main board which tests the semiconductor chips by exchanging signals with the plurality of semiconductor chips; a door (540) which is provided on the main body (100) to open and close the test chamber (200); and a temperature control means provided inside the main body (100) to heat and cool the test boards (40) mounted inside the test chamber (200).