Patents Assigned to MES Testing & Research Center Co., Ltd.
  • Patent number: 5391988
    Abstract: A method and apparatus for nondestructively detecting a flaw such as a hairline crack or defect within a conductive object to be inspected. Surface flaws can be distinguished from deep flaws. The pulse duration of the pulse voltage induced in the secondary coil of a sensor is measured at two separate time instances. At one time instance, the pulse duration is affected by variations in the distance between the sensor and the object but is not affected by the flaw. At the other time instance the pulse duration is affected by said variations and also by the flaw. The effect of said variations is cancelled, using these two measured pulse durations. Only a signal correctly indicating the flaw is extracted to detect the presence of the flaw.
    Type: Grant
    Filed: April 20, 1993
    Date of Patent: February 21, 1995
    Assignees: Kabushiki Kaisha Nihon Hihakai Keisoku Kenkyusho, Mitsui Engineering & Shipbuilding Co., Ltd., MES Testing & Research Center Co., Ltd.
    Inventor: Shigeru Kitagawa