Abstract: A field distribution measuring method for measuring a spatial distribution of an electric field or a magnetic field at a plurality of sampling points. The method includes the steps of continuously sweeping the sampling points by a probe, in which, based on spurious spectra generated by offsets between positions of the probe and measuring timings, a shift amount of the sampling points is computed, and, taking into account the shift amount, a distribution of electric fields or magnetic fields is measured. The method further includes a step of removing the measured noises generated due to the offsets between sweeping positions of the probe and the measuring timings.
Type:
Grant
Filed:
July 8, 2002
Date of Patent:
October 12, 2004
Assignees:
Advantest Corporation, Minister for Public Management, Home Affairs, Posts and
Telecommunications
Abstract: A correlation function measuring method and apparatus can correct a correlation vector with high accuracy. The correlation function measuring apparatus includes first signal processing means 18a to 22a for processing a first monitored signal to give a first spectrum, second signal processing means 18b to 22b for processing a second monitored signal to give a second spectrum, correction value computing means 26 for inputting correction signals to the first and second signal processing means to give correction values corresponding to respective frequencies, based on the first spectrum and the second spectrum, and correlation function computing means 30 for obtaining a correlation function between the first spectrum and the second spectrum by using correction values given by the correction value computing means.
Type:
Grant
Filed:
January 29, 2001
Date of Patent:
July 15, 2003
Assignees:
Advantest Corp., Minister of Public Management Home Affairs, Posts and
Telecommunications