Abstract: A microscopic object characterization system comprises a computer system, a microscope with a computing unit connected to the computer system, and an object characterization program executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of the microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on the refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: A microscope comprising a coherent light source producing a coherent light beam, a light beam guide system comprising a beam splitter configured to split the coherent light beam into a reference beam and a sample illumination beam, a sample holder configured to hold a sample to be observed, a sample illumination device configured to direct the sample illumination beam through the sample and into a microscope objective, a beam reuniter configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Abstract: Microscopic object characterization system (1), comprising a computer system (2, 2a, 2b), a microscope (4) with a computing unit (5) connected to the computer system, and an object characterization program (17) executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of said microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on said refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: Microscope (2) comprising a coherent light source (4) producing a coherent light beam (7), a light beam guide system (6) comprising a beam splitter (14) configured to split the coherent light beam (7) into a reference beam (7a) and a sample illumination beam (7b), a sample holder (18) configured to hold a sample (1) to be observed, a sample illumination device (28) configured to direct the sample illumination beam (7b) through the sample and into a microscope objective (37), a beam reuniter (16) configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system (8) configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.

Abstract: Microscopic object characterization system (1), comprising a computer system (2, 2a, 2b), a microscope (4) with a computing unit (5) connected to the computer system, and an object characterization program (17) executable in the computer system configured to receive refractive index data representing at least a spatial distribution of measured values of refractive index (RI) or values correlated to refractive index of said microscopic object. The object characterization program is operable to execute an algorithm applying a plurality of transformations on said refractive index data. The transformations generate a distribution of two or more parameters used to characterize features of the microscopic object.

Abstract: Microscope (2) comprising a coherent light source (4) producing a coherent light beam (7), a light beam guide system (6) comprising a beam splitter (14) configured to split the coherent light beam (7) into a reference beam (7a) and a sample illumination beam (7b), a sample holder (18) configured to hold a sample (1) to be observed, a sample illumination device (28) configured to direct the sample illumination beam (7b) through the sample and into a microscope objective (37), a beam reuniter (16) configured to reunite the reference beam and sample illumination beam after passage of the sample illumination beam through the sample to be observed, and a light sensing system (8) configured to capture at least phase and intensity values of the coherent light beam downstream of the beam reuniter.