Patents Assigned to National Institute of Metrology
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Publication number: 20240142634Abstract: The present application provides a trusted space positioning calibration service system and an operation method thereof. The system includes: a differential benchmark data service module, a positioning data digital calibration server and a trusted space positioning calibration apparatus.Type: ApplicationFiled: January 9, 2024Publication date: May 2, 2024Applicant: National Institute of Metrology, ChinaInventors: Xingchuang XIONG, Xiang FANG, Yanlin LIANG, Zhengyi ZHAO, Zhen LIU, Wenkui HE
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Patent number: 11965920Abstract: A method for achieving terminal-pair definition of four-terminal-pair (4TP) impedance and an application thereof are provided, which belongs to the field of precision measurement and metrology. A current output terminal of a two-stage follower is connected to a high current terminal of impedance through a coaxial line, and a voltage output terminal of the two-stage follower is connected to a high voltage terminal of the impedance through the coaxial line, which makes current of the high voltage terminal be 0, and core wire currents and outer wire currents of the high current terminal equal and reverse. The terminal-pair definition of the 4TP impedance can be satisfied; and the follower is added to make a bridge ratio variable and isolate effects of bridge load changes, thereby accelerating a balancing speed of the 4TP impedance bridge, and achieving accurate and fast comparative measurement having high precision of the 4TP AC impedance.Type: GrantFiled: November 6, 2023Date of Patent: April 23, 2024Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Yan Yang, Lu Huang, Dongxue Dai, Wei Wang, Xia Liu
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Patent number: 11835378Abstract: An automatic large-mass-weight handling system comprises: a weight picking device (10) configured for picking up and holding a large-mass-weight (75); a driving device (80) for providing a driving power; a weight transferring device (50) comprising a first horizontal rail (52) and a vertical rail (62) assembled to the first horizontal rail (52) in a way of being movable along the first horizontal rail (52), the first horizontal rail (52) extending in a first horizontal direction, the vertical rail (62) extending in a vertical direction perpendicular to the first horizontal direction, and the weight picking device (10) being assembled to the vertical rail (62); and a control unit for controlling the movement of the weight picking device (10); wherein the control unit controls the driving device (80) in a way that the weight picking device (10) is able to be moved automatically in the first horizontal direction and is able to be moved automatically in the vertical direction.Type: GrantFiled: December 8, 2016Date of Patent: December 5, 2023Assignee: NATIONAL INSTITUTE OF METROLOGYInventors: Xiaoping Ren, Jian Wang, Changqing Cai, Tao Li, Manhong Hu, Xiang Wang, Ping Chen
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Patent number: 11816844Abstract: A method for measuring angular velocity and angular acceleration based on monocular vision. Firstly, a movement sequence image of a feature mark fixed on a working table of a rotary motion generating device is acquired via an acquisition and imaging device. Secondly, a region of interest on the movement sequence image of the feature mark under different shooting distances and rotating conditions is determined by cyclic matching between a set of circular templates and the movement sequence image of the feature mark. Then, a sub-pixel of feature line edges in the region of interest is extracted using a line segment detection method, and only the feature line edges in a motion direction are retained through a constraint of the number of edge points. Finally, the angular velocity and angular acceleration are calculated by using the extracted feature line edges in the motion direction.Type: GrantFiled: December 20, 2021Date of Patent: November 14, 2023Assignees: Guizhou University, National Institute of Metrology, ChinaInventors: Ming Yang, Chenguang Cai, Zhihua Liu, Qi Lyu, Wenfeng Liu, Ping Yang
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Patent number: 11788831Abstract: A six-degree-of-freedom measurement method by machine vision based on physical decoupling. A point projector capable of emitting three laser beams perpendicular to each other is placed on a measured object. A rear-projection screen is configured to allow the three laser beams to be projected thereon as three laser points. The collection of motion images is performed by a camera. Plane coordinates of the three laser points are obtained by processing a sequence image. A mathematical decoupling model is built according to a nature of sphere and a spatial position relationship of three laser beams. The plane coordinates of the three laser points are input into the mathematical decoupling model to obtain six-degree-of-freedom information of the measured object.Type: GrantFiled: October 22, 2021Date of Patent: October 17, 2023Assignees: National Institute of Metrology, China, Guizhou UniversityInventors: Chenguang Cai, Ying Zhang, Zhihua Liu, Ming Yang, Wen Ye, Yan Xia
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Patent number: 11754595Abstract: A method for calibrating linear vibration and angular vibration based on monocular vision. A motion sequence image of a feature mark is acquired by an industrial camera, and an output signal of a linear and angular accelerometer is acquired by a data acquisition card, where the feature mark and the linear and angular accelerometer are fixed on a work table. An exciting acceleration of the linear and angular accelerometer is measured by a monocular vision method integrating a camera calibration method and a sub-pixel edge extraction method based on line segment detection. The exciting acceleration and the output signal are fitted by a sine approximation method, respectively, and corresponding fitted peaks are obtained. A sensitivity of the linear and angular accelerometer is obtained according to the fitted peaks.Type: GrantFiled: December 20, 2021Date of Patent: September 12, 2023Assignees: National Institute of Metrology, China, Guizhou UniversityInventors: Chenguang Cai, Ming Yang, Zhihua Liu, Qi Lyu, Wenfeng Liu, Ping Yang
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Patent number: 11709045Abstract: A surface texture probe and a surface texture measurement apparatus with a vibrational membrane are provided. The probe includes a housing and a vibrational membrane, a stylus holder, a vertical guide assembly, a guide adjustment assembly and a stylus. An inner end of the vibrational membrane is attached to an upper end of the stylus holder. An outer end of the vibrational membrane is fixed to a vibrational membrane connection assembly fixedly connected to the housing. The vertical guide assembly is fixed inside the housing and slidably connected to the stylus holder and configured to guide the stylus holder to move in a vertical direction. The stylus is fixed to a lower end of the stylus holder. The guide adjustment assembly is mounted on the vertical guide assembly and configured to adjust a sliding friction force between the vertical guide assembly and the stylus holder.Type: GrantFiled: February 19, 2022Date of Patent: July 25, 2023Assignee: National Institute of Metrology, ChinaInventors: Yushu Shi, Shu Zhang, Zhoumiao Shi
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Publication number: 20230047877Abstract: Disclosed are a device and a method for measuring laser displacement. The device comprises an interferometric measurement module, a laser light source module, a signal modulation module, a control processing module and an optical vernier demodulation module. The control processing module controls the signal modulation module to apply a light source modulation signal to the laser light source module, so that the laser light source module provides two laser beams with fixed frequency difference to the interferometric measurement module. The control processing module controls the interferometric measurement module to perform interferometric measurement. During measurement, lasers respectively interfere in two Fabry-Perot cavities in the interferometric measurement module, and are detected by two photodetectors to form main and secondary measurement interference signals.Type: ApplicationFiled: October 25, 2022Publication date: February 16, 2023Applicant: National Institute of Metrology, ChinaInventors: Jianjun CUI, Peng ZHANG, Kai CHEN
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Patent number: 11579169Abstract: The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.Type: GrantFiled: September 18, 2021Date of Patent: February 14, 2023Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Zhen-Dong Zhu, Si-Tian Gao, Wei Li
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Publication number: 20230010324Abstract: The present disclosure relates to a field programmable gate array (FPGA)-based multi-channel dynamic light scattering (DLS) autocorrelation system and method. The system includes a DLS generation apparatus, a photon correlator, and a host computer, where the photon correlator includes an FPGA and a universal serial bus (USB) communication module; the DLS generation apparatus is connected to the FPGA; the FPGA is configured to count and perform correlation calculation on photon pulses generated by the DLS generation apparatus; the USB communication module is connected to the host computer; the FPGA includes a dual counter module and a correlation calculation module; the dual counter module is connected to the DLS generation apparatus and the correlation calculation module; the correlation calculation module is connected to the USB communication module; the dual counter module includes a plurality of dual counters; and the correlation calculation module includes a plurality of correlators.Type: ApplicationFiled: January 19, 2022Publication date: January 12, 2023Applicant: National Institute of Metrology, ChinaInventors: Lu Huang, Yuqi Fang, Sitian Gao, Miao Sun
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Publication number: 20220404379Abstract: A sequencing method, system and kit of low molecular weight heparin (LMWH) oligosaccharides are provided.Type: ApplicationFiled: January 17, 2022Publication date: December 22, 2022Applicants: Shandong University, National Institute of Metrology, ChinaInventors: Lianli Chi, Deling Shi, Bing Zhang, Tianji Zhang, Fei Li, Qingqing Chen
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Patent number: 11268978Abstract: The present disclosure provides a tip-enhanced Raman spectroscope system. The system includes a laser emitting unit, a laser excitation unit, a first dichroic beam splitter, a first Raman spectrometer, and a confocal detecting unit. The laser excitation unit includes a sample stage and a first scanning probe. The sample stage is configured to have a sample disposed thereon such that a first incident laser beam emitted from the laser emitting unit is transmitted to the sample to excite first scattered light. The first dichroic beam splitter is configured to split a first Raman scattered light from the first Rayleigh scattered light. The first Raman spectrometer is disposed on a first Raman optical path of the first Raman scattered light. The confocal detecting unit is disposed on a first Rayleigh optical path of the first Rayleigh scattered light to image the sample.Type: GrantFiled: September 26, 2019Date of Patent: March 8, 2022Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Zhen-Dong Zhu, Si-Tian Gao, Wei Li, Shi Li, Jing-Tao Xu
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Patent number: 11156636Abstract: The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.Type: GrantFiled: September 25, 2019Date of Patent: October 26, 2021Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Zhen-Dong Zhu, Si-Tian Gao, Wei Li
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Patent number: 11067596Abstract: A method for calibrating phase-frequency characteristics of low frequency accelerometer based on time-spatial synchronization, comprises: measuring excitation displacement of the low frequency accelerometer to realize excitation acceleration measurement of the low frequency accelerometer; realizing alignment of the excitation acceleration signal of the low frequency accelerometer with output voltage signal of the low frequency accelerometer in the spatial domain based on TSS technology, fitting the excitation acceleration signal and the output voltage signal respectively by SAM, and calculating phase ?F of the excitation acceleration signal at a zero position of horizontal long-stroke shaker and phase ?Z of the output voltage signal at the time when a zero encoder on the shaker outputs pulse; and calculating the sensitivity phase of the low frequency accelerometer with ?Z and ?F, and determining phase-frequency characteristics of the low frequency accelerometer by calibrating the sensitivity phases at differeType: GrantFiled: October 14, 2019Date of Patent: July 20, 2021Assignees: National Institute of Metrology, Beijing University of Chemical TechnologyInventors: Chenguang Cai, Ming Yang, Zhihua Liu, Hao Cheng, Cuiyun Jin
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Patent number: 10907950Abstract: Disclosed are a laser heterodyne interferometric apparatus based on plane mirror reflection and a corresponding method. The interferometric apparatus includes a dual-frequency laser, a first photoelectric receiver, a second photoelectric receiver, a first polarizing beamsplitter, a second polarizing beamsplitter, a third polarizing beamsplitter, a quarter-wave plate, a right angle mirror, an optical compensator, and a measured plane mirror. The method performs heterodyne interferometry with two spatially separated beams of different frequencies and balances the optical path lengths of the measurement beam and the reference beam with the optical compensator. In the method, the measured plane mirror moves back and forth along the propagation direction of the input beams. The disclosure suppresses optical non-linearity and optical thermal drift in laser heterodyne interferometry, simplifies the optical path structure, and improves accuracy of laser heterodyne interferometry.Type: GrantFiled: February 27, 2019Date of Patent: February 2, 2021Assignee: National Institute of MetrologyInventors: Yang Bai, Zheng Kun Li, Yun Feng Lu, Zhong Hua Zhang, Qing He
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Publication number: 20200103279Abstract: The present disclosure provides a tip-enhanced Raman spectroscope system. The system includes a laser emitting unit, a laser excitation unit, a first dichroic beam splitter, a first Raman spectrometer, and a confocal detecting unit. The laser excitation unit includes a sample stage and a first scanning probe. The sample stage is configured to have a sample disposed thereon such that a first incident laser beam emitted from the laser emitting unit is transmitted to the sample to excite first scattered light. The first dichroic beam splitter is configured to split a first Raman scattered light from the first Rayleigh scattered light. The first Raman spectrometer is disposed on a first Raman optical path of the first Raman scattered light. The confocal detecting unit is disposed on a first Rayleigh optical path of the first Rayleigh scattered light to image the sample.Type: ApplicationFiled: September 26, 2019Publication date: April 2, 2020Applicant: National Institute of Metrology, ChinaInventors: ZHEN-DONG ZHU, SI-TIAN GAO, WEI LI, SHI LI, JING-TAO XU
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Publication number: 20200103438Abstract: The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.Type: ApplicationFiled: September 25, 2019Publication date: April 2, 2020Applicant: National Institute of Metrology, ChinaInventors: ZHEN-DONG ZHU, SI-TIAN GAO, WEI LI
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Patent number: 10504712Abstract: A mass spectrometry device comprises a reaction gas introduction device and a gas phase molecule-ion reaction mass spectrometry analysis device, wherein the reaction gas introduction device is connected to the gas phase molecule-ion reaction mass spectrometry analysis device; the reaction gas introduction device is configured to introduce reaction gas into the gas phase molecule-ion reaction mass spectrometry analysis device; and the gas phase molecule-ion reaction mass spectrometry analysis device is configured to enable molecules or ions to be subjected to a reaction and carry out mass spectrometry analysis on a reaction result. The reaction gas introduction device comprises a reaction gas container, the reaction gas container being configured to contain gas or volatile liquid or solid and generate gas molecules needed by a reaction; and a reaction gas quantitation device, configured to carry out flow control on the gas molecules.Type: GrantFiled: March 23, 2016Date of Patent: December 10, 2019Assignee: National Institute of Metrology, ChinaInventors: You Jiang, Xiang Fang, Xing-Chuang Xiong, Ze-Jian Huang
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Patent number: 10378950Abstract: The invention relates to a measuring device for measuring the mass of a weight, comprising a main frame, a main beam supported on the main frame and comprising a central knife and two side knives parallel with the central knife; a balancing system loaded on one end of the main beam and comprising a set of counterweights; a weighting system loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system. The central knife and the two side knives are made from metal with a high temperature-cryogenic cycling process. The central knife and the two side knives are configured to be adjusted in parallelism with a three-coordinates measuring machine. The control system is adapted to control the balancing system and the weighting system to synchronously load or unload the balancing system and the weighting system.Type: GrantFiled: October 12, 2016Date of Patent: August 13, 2019Assignee: NATIONAL INSTITUTE OF METROLOGYInventors: Jian Wang, Changqing Cai, Xiaoping Ren, Tao Li, Manhong Hu, Xiaolei Wang, Honglei Ji, Xiang Wang, Ping Chen
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Patent number: 10274362Abstract: The invention discloses a measuring device for measuring the mass of a weight, comprising: a main frame; a main beam supported on main frame; a balancing system loaded on one end of the main beam; a weighting system, loaded on the other end of the main beam; a weight transportation system capable of transporting and loading a standard weight or a test weight into the weighting system and capable of unloading and transporting them away from the weighting system; and a control system comprising an optical sensor mounted in the main frame, a laser displacement sensor mounted on the main beam, a monitor, and a control unit connected electrically to the optical sensor, the laser displacement sensor and the monitor. The control system is adapted to compare a main beam first displacement data obtained by the optical sensor and a main beam second displacement data obtained by the laser displacement sensor to accurately measure the actual displacement of the main beam.Type: GrantFiled: October 12, 2016Date of Patent: April 30, 2019Assignee: NATIONAL INSTITUTE OF METROLOGYInventors: Jian Wang, Changqing Cai, Xiaoping Ren, Tao Li, Manhong Hu, Xiaolei Wang, Honglei Ji, Xiang Wang, Ping Chen