Patents Assigned to NATIONAL INSTITUTE OF METROLOGY, CHINA
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Publication number: 20240142634Abstract: The present application provides a trusted space positioning calibration service system and an operation method thereof. The system includes: a differential benchmark data service module, a positioning data digital calibration server and a trusted space positioning calibration apparatus.Type: ApplicationFiled: January 9, 2024Publication date: May 2, 2024Applicant: National Institute of Metrology, ChinaInventors: Xingchuang XIONG, Xiang FANG, Yanlin LIANG, Zhengyi ZHAO, Zhen LIU, Wenkui HE
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Patent number: 11965920Abstract: A method for achieving terminal-pair definition of four-terminal-pair (4TP) impedance and an application thereof are provided, which belongs to the field of precision measurement and metrology. A current output terminal of a two-stage follower is connected to a high current terminal of impedance through a coaxial line, and a voltage output terminal of the two-stage follower is connected to a high voltage terminal of the impedance through the coaxial line, which makes current of the high voltage terminal be 0, and core wire currents and outer wire currents of the high current terminal equal and reverse. The terminal-pair definition of the 4TP impedance can be satisfied; and the follower is added to make a bridge ratio variable and isolate effects of bridge load changes, thereby accelerating a balancing speed of the 4TP impedance bridge, and achieving accurate and fast comparative measurement having high precision of the 4TP AC impedance.Type: GrantFiled: November 6, 2023Date of Patent: April 23, 2024Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Yan Yang, Lu Huang, Dongxue Dai, Wei Wang, Xia Liu
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Patent number: 11816844Abstract: A method for measuring angular velocity and angular acceleration based on monocular vision. Firstly, a movement sequence image of a feature mark fixed on a working table of a rotary motion generating device is acquired via an acquisition and imaging device. Secondly, a region of interest on the movement sequence image of the feature mark under different shooting distances and rotating conditions is determined by cyclic matching between a set of circular templates and the movement sequence image of the feature mark. Then, a sub-pixel of feature line edges in the region of interest is extracted using a line segment detection method, and only the feature line edges in a motion direction are retained through a constraint of the number of edge points. Finally, the angular velocity and angular acceleration are calculated by using the extracted feature line edges in the motion direction.Type: GrantFiled: December 20, 2021Date of Patent: November 14, 2023Assignees: Guizhou University, National Institute of Metrology, ChinaInventors: Ming Yang, Chenguang Cai, Zhihua Liu, Qi Lyu, Wenfeng Liu, Ping Yang
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Patent number: 11788831Abstract: A six-degree-of-freedom measurement method by machine vision based on physical decoupling. A point projector capable of emitting three laser beams perpendicular to each other is placed on a measured object. A rear-projection screen is configured to allow the three laser beams to be projected thereon as three laser points. The collection of motion images is performed by a camera. Plane coordinates of the three laser points are obtained by processing a sequence image. A mathematical decoupling model is built according to a nature of sphere and a spatial position relationship of three laser beams. The plane coordinates of the three laser points are input into the mathematical decoupling model to obtain six-degree-of-freedom information of the measured object.Type: GrantFiled: October 22, 2021Date of Patent: October 17, 2023Assignees: National Institute of Metrology, China, Guizhou UniversityInventors: Chenguang Cai, Ying Zhang, Zhihua Liu, Ming Yang, Wen Ye, Yan Xia
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Patent number: 11754595Abstract: A method for calibrating linear vibration and angular vibration based on monocular vision. A motion sequence image of a feature mark is acquired by an industrial camera, and an output signal of a linear and angular accelerometer is acquired by a data acquisition card, where the feature mark and the linear and angular accelerometer are fixed on a work table. An exciting acceleration of the linear and angular accelerometer is measured by a monocular vision method integrating a camera calibration method and a sub-pixel edge extraction method based on line segment detection. The exciting acceleration and the output signal are fitted by a sine approximation method, respectively, and corresponding fitted peaks are obtained. A sensitivity of the linear and angular accelerometer is obtained according to the fitted peaks.Type: GrantFiled: December 20, 2021Date of Patent: September 12, 2023Assignees: National Institute of Metrology, China, Guizhou UniversityInventors: Chenguang Cai, Ming Yang, Zhihua Liu, Qi Lyu, Wenfeng Liu, Ping Yang
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Patent number: 11709045Abstract: A surface texture probe and a surface texture measurement apparatus with a vibrational membrane are provided. The probe includes a housing and a vibrational membrane, a stylus holder, a vertical guide assembly, a guide adjustment assembly and a stylus. An inner end of the vibrational membrane is attached to an upper end of the stylus holder. An outer end of the vibrational membrane is fixed to a vibrational membrane connection assembly fixedly connected to the housing. The vertical guide assembly is fixed inside the housing and slidably connected to the stylus holder and configured to guide the stylus holder to move in a vertical direction. The stylus is fixed to a lower end of the stylus holder. The guide adjustment assembly is mounted on the vertical guide assembly and configured to adjust a sliding friction force between the vertical guide assembly and the stylus holder.Type: GrantFiled: February 19, 2022Date of Patent: July 25, 2023Assignee: National Institute of Metrology, ChinaInventors: Yushu Shi, Shu Zhang, Zhoumiao Shi
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Publication number: 20230047877Abstract: Disclosed are a device and a method for measuring laser displacement. The device comprises an interferometric measurement module, a laser light source module, a signal modulation module, a control processing module and an optical vernier demodulation module. The control processing module controls the signal modulation module to apply a light source modulation signal to the laser light source module, so that the laser light source module provides two laser beams with fixed frequency difference to the interferometric measurement module. The control processing module controls the interferometric measurement module to perform interferometric measurement. During measurement, lasers respectively interfere in two Fabry-Perot cavities in the interferometric measurement module, and are detected by two photodetectors to form main and secondary measurement interference signals.Type: ApplicationFiled: October 25, 2022Publication date: February 16, 2023Applicant: National Institute of Metrology, ChinaInventors: Jianjun CUI, Peng ZHANG, Kai CHEN
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Patent number: 11579169Abstract: The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.Type: GrantFiled: September 18, 2021Date of Patent: February 14, 2023Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Zhen-Dong Zhu, Si-Tian Gao, Wei Li
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Publication number: 20230010324Abstract: The present disclosure relates to a field programmable gate array (FPGA)-based multi-channel dynamic light scattering (DLS) autocorrelation system and method. The system includes a DLS generation apparatus, a photon correlator, and a host computer, where the photon correlator includes an FPGA and a universal serial bus (USB) communication module; the DLS generation apparatus is connected to the FPGA; the FPGA is configured to count and perform correlation calculation on photon pulses generated by the DLS generation apparatus; the USB communication module is connected to the host computer; the FPGA includes a dual counter module and a correlation calculation module; the dual counter module is connected to the DLS generation apparatus and the correlation calculation module; the correlation calculation module is connected to the USB communication module; the dual counter module includes a plurality of dual counters; and the correlation calculation module includes a plurality of correlators.Type: ApplicationFiled: January 19, 2022Publication date: January 12, 2023Applicant: National Institute of Metrology, ChinaInventors: Lu Huang, Yuqi Fang, Sitian Gao, Miao Sun
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Publication number: 20220404379Abstract: A sequencing method, system and kit of low molecular weight heparin (LMWH) oligosaccharides are provided.Type: ApplicationFiled: January 17, 2022Publication date: December 22, 2022Applicants: Shandong University, National Institute of Metrology, ChinaInventors: Lianli Chi, Deling Shi, Bing Zhang, Tianji Zhang, Fei Li, Qingqing Chen
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Patent number: 11268978Abstract: The present disclosure provides a tip-enhanced Raman spectroscope system. The system includes a laser emitting unit, a laser excitation unit, a first dichroic beam splitter, a first Raman spectrometer, and a confocal detecting unit. The laser excitation unit includes a sample stage and a first scanning probe. The sample stage is configured to have a sample disposed thereon such that a first incident laser beam emitted from the laser emitting unit is transmitted to the sample to excite first scattered light. The first dichroic beam splitter is configured to split a first Raman scattered light from the first Rayleigh scattered light. The first Raman spectrometer is disposed on a first Raman optical path of the first Raman scattered light. The confocal detecting unit is disposed on a first Rayleigh optical path of the first Rayleigh scattered light to image the sample.Type: GrantFiled: September 26, 2019Date of Patent: March 8, 2022Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Zhen-Dong Zhu, Si-Tian Gao, Wei Li, Shi Li, Jing-Tao Xu
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Patent number: 11156636Abstract: The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.Type: GrantFiled: September 25, 2019Date of Patent: October 26, 2021Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Zhen-Dong Zhu, Si-Tian Gao, Wei Li
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Publication number: 20200103279Abstract: The present disclosure provides a tip-enhanced Raman spectroscope system. The system includes a laser emitting unit, a laser excitation unit, a first dichroic beam splitter, a first Raman spectrometer, and a confocal detecting unit. The laser excitation unit includes a sample stage and a first scanning probe. The sample stage is configured to have a sample disposed thereon such that a first incident laser beam emitted from the laser emitting unit is transmitted to the sample to excite first scattered light. The first dichroic beam splitter is configured to split a first Raman scattered light from the first Rayleigh scattered light. The first Raman spectrometer is disposed on a first Raman optical path of the first Raman scattered light. The confocal detecting unit is disposed on a first Rayleigh optical path of the first Rayleigh scattered light to image the sample.Type: ApplicationFiled: September 26, 2019Publication date: April 2, 2020Applicant: National Institute of Metrology, ChinaInventors: ZHEN-DONG ZHU, SI-TIAN GAO, WEI LI, SHI LI, JING-TAO XU
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Publication number: 20200103438Abstract: The present disclosure provides a scanning probe, a method and an apparatus for manufacturing the scanning probe. The scanning probe includes a base and a micro-tip disposed on an end of the base, wherein at least a section of the micro-tip comprises a lateral surface with a concavely curved generatrix. In the method, an end of a probe precursor is immersed in a corrosive solution by having a length direction of the probe precursor inclined with a liquid surface of the corrosive solution. The probe precursor is corroded by the corrosive solution while a corrosion current of the corroding is monitored. The probe precursor is moved away from the corrosive solution after a magnitude of the corrosion current has a plunge. The apparatus includes a container containing the corrosive solution, and a driving device configured to move the probe precursor in the container through a fastener.Type: ApplicationFiled: September 25, 2019Publication date: April 2, 2020Applicant: National Institute of Metrology, ChinaInventors: ZHEN-DONG ZHU, SI-TIAN GAO, WEI LI
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Patent number: 10504712Abstract: A mass spectrometry device comprises a reaction gas introduction device and a gas phase molecule-ion reaction mass spectrometry analysis device, wherein the reaction gas introduction device is connected to the gas phase molecule-ion reaction mass spectrometry analysis device; the reaction gas introduction device is configured to introduce reaction gas into the gas phase molecule-ion reaction mass spectrometry analysis device; and the gas phase molecule-ion reaction mass spectrometry analysis device is configured to enable molecules or ions to be subjected to a reaction and carry out mass spectrometry analysis on a reaction result. The reaction gas introduction device comprises a reaction gas container, the reaction gas container being configured to contain gas or volatile liquid or solid and generate gas molecules needed by a reaction; and a reaction gas quantitation device, configured to carry out flow control on the gas molecules.Type: GrantFiled: March 23, 2016Date of Patent: December 10, 2019Assignee: National Institute of Metrology, ChinaInventors: You Jiang, Xiang Fang, Xing-Chuang Xiong, Ze-Jian Huang
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Patent number: 10169870Abstract: The present invention relates to a novel objective method for assessing high contrast resolution of images based on Rayleigh criterion and a testing operating method. The novel objective method for assessing high contrast resolution of images based on Rayleigh criterion involves combining the Rayleigh criterion with regional pixel intensity profiles for simultaneous application to high contrast resolution images of CT equipment, which allows objective assessment by using the Rayleigh criterion after the drawing of the regional pixel intensity profiles; the introduction of a normalized margin and the use of a Lanczos window function for interpolation processing on original images enable a considerably practical, time-effective and operable objective assessment method that is convenient for testers to use and also easy for CT equipment operators to use.Type: GrantFiled: December 15, 2016Date of Patent: January 1, 2019Assignee: NATIONAL INSTITUTE OF METROLOGY, CHINAInventors: Pu Zhang, Wenli Liu
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Patent number: 10163618Abstract: The invention proposes a mass spectrometry apparatus for ultraviolet light ionization of neutral lost molecules, and a method for operating same. The mass spectrometry apparatus for ultraviolet light ionization of neutral lost molecules includes a quadrupole tandem special linear ion trap mass analyzer, a vacuum ultraviolet lamp, a lamp front shutter, a gradient vacuum system and other necessary components for the mass spectrometry apparatus. In addition, the invention also proposes a method for operating the apparatus to efficiently store ions, fragment and analyze the ions, perform ultraviolet efficient ionization on lost neutral molecules, and then analyze the ions.Type: GrantFiled: November 19, 2015Date of Patent: December 25, 2018Assignee: NATIONAL INSTITUTE OF METROLOGY CHINAInventors: Xingchuang Xiong, Xiang Fang, You Jiang, Xiaoyun Gong, Zejian Huang, Meiying Liu
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Patent number: 9964681Abstract: A high-diffusion-coefficient and high-brightness light source generation device comprising: a light source module, an optical fiber bundle and an optical fiber hemisphere emitter, wherein the light source module provides the optical fiber bundle with a plane light source having the same size as an end surface of an incident end thereof, the incident end receives light emitted from the light source module, exit ends transmit the light to the optical fiber hemisphere emitter, the exit ends of the optical fiber bundle arranged on a hemispherical wall of the optical fiber hemisphere emitter in an equal solid angle manner, an end surface of each optical fiber exit end located on the same surface as the inner wall of a hemisphere, a bottom plate arranged above an opening of the optical fiber hemisphere emitter, and an opal glass window arranged at the circle center position of the bottom plate.Type: GrantFiled: February 10, 2015Date of Patent: May 8, 2018Assignee: THE NATIONAL INSTITUTE OF METROLOGY(CHINA)Inventors: Zilong Liu, Yu Wang, Wenli Liu, Rui Chen
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Publication number: 20170271137Abstract: The invention discloses a networking mass analysis method and device, and belongs to the field of mass spectrometer and ion mass analysis. The device comprises an ion source, an ion transporter, an ion deflector and multiple mass analyzers, wherein the ion transporter is connected with one of the multiple mass analyzers, the multiple mass analyzers are connected with the ion deflector respectively, the ion source produces the ions to be detected, the ions to be detected enter any of the mass analyzers connected with the ion deflector via the ion transporter for mass analysis, and the remaining ions to be detected are transported to the corresponding mass analyzers via the ion deflector for mass analysis. The invention can improve the mass analysis duty ratio of continuous ion sources and obtain more mass-to-charge ratio information of ion beams within each time slot.Type: ApplicationFiled: March 23, 2016Publication date: September 21, 2017Applicant: National Institute of Metrology, ChinaInventors: You JIANG, Xiang FANG, Xingchuang XIONG, Zejian HUANG
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Patent number: 9679759Abstract: The present invention discloses a rectangular ion trap device and method for ion storage. The device comprises a front end cover including left electrode, middle layer insulator, and right electrode, wherein the left electrode and the right electrode are respectively positioned at both sides of the middle layer insulator; a rear end cover, wherein the rear end cover has the same axis as the front end cover, and the central position of the rear end cover electrode is penetrated; the front and rear electrodes and the upper and lower electrodes are symmetric along the axis of the front end cover, and these electrodes form a space region for ion storage about the axis between the front end cover and the rear end cover electrode. The present invention can increase the number of ions in storage within a unit time prominently.Type: GrantFiled: August 15, 2014Date of Patent: June 13, 2017Assignee: National Institute of Metrology, ChinaInventors: Xingchuang Xiong, You Jiang, Zejian Huang, Xiang Fang