Patents Assigned to Neaspec GmbH
  • Method for measuring the near-field signal
    Patent number: 9043946
    Abstract: The present invention relates to a method for measuring the near-field signal of a sample in a scattering type near-field microscope and to a device for conducting said method.
    Type: Grant
    Filed: December 19, 2012
    Date of Patent: May 26, 2015
    Assignee: Neaspec GmbH
    Inventor: Nenad Ocelic
  • METHOD FOR MEASURING THE NEAR-FIELD SIGNAL
    Publication number: 20150089694
    Abstract: The present invention relates to a method for measuring the near-field signal of a sample in a scattering type near-field microscope and to a device for conducting said method.
    Type: Application
    Filed: December 19, 2012
    Publication date: March 26, 2015
    Applicant: Neaspec GmbH
    Inventor: Nenad Ocelic
  • Near field optical microscope
    Patent number: 8832861
    Abstract: The invention relates to a device for conducting near-field optical measurements of a specimen, a method for conducting near-field optical measurements and the use of the device.
    Type: Grant
    Filed: March 12, 2010
    Date of Patent: September 9, 2014
    Assignee: Neaspec GmbH
    Inventor: Nenad Ocelic
  • NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM
    Publication number: 20130145505
    Abstract: The invention relates to a device for conducting near-field optical measurements of a specimen comprising an optical imaging system, the use of such device and to a method for adjusting the probe or the illumination of the probe in such a device.
    Type: Application
    Filed: February 21, 2011
    Publication date: June 6, 2013
    Applicant: Neaspec GmbH
    Inventors: Nenad Ocelic, Florian Huth