Abstract: A compact spectroscope is sufficiently lightweight for use in combination with a microscope for analyzing samples using Raman analytical techniques. The Raman spectroscope includes a housing detachably mountable to the microscope. The housing contains at least one source of radiation. One or more filters are positioned at desired angles across the beam path provided by the source of radiation. The spectroscope includes a variety of components operatively connected to source of radiation capable of providing one or more Raman beams, as well as a variety of components for processing beam constituents for microscope analysis. A fiber optic probe is provided for examining large samples or samples at remote sites. A computer or other electronic reader may also be attached to the Raman spectroscope for viewing analytical data.

Abstract: An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.

Abstract: An apparatus and method for producing a substantially straight instrument image is provided. The apparatus and method for producing a substantially straight instrument image, according to the present invention includes a curved slit. The curved slit may be formed in a light beam controller. The curved slit is capable of admitting a light beam into the instrument. The instrument parameters associated with optical devices located in the instrument in the path of the light beam are determined. One or more formulae are used to transform and process the instrument spectral parameters to determine the shape or curvature of the curved slit.

Abstract: An apparatus and method for measuring an emission. A source of all excitation beam is provided. In the path of the excitation beam, means are located for providing one or more daughter beams. The one or more daughter beams are directed at one or more substances. The substances may include one or more known qualified substances, and one or more known unqualified substances. The substances have substantially similar characterizations. Positionable adjacent to the one or more substances are means for generating one or more emission beams. A spectral analysis device is provided for collecting spectral measurements substantially simultaneously from the one or more emission beams. Means are provided for subsequently comparing the spectral measurements from the one or more substances.

Abstract: A method for producing a standard Raman spectrum of a sample. A source of incident radiation is provided. Means provide an incident beam and a monitor beam from the incident radiation. The incident beam is directed to the sample and a Raman beam is generated from the sample. Spectral data may be collected directly from the monitor beam and the Raman beam simultaneously. The occurrence of a frequency shift in the incident radiation is determined. One spectral measurement is made after the occurrence of the frequency shift, or a first spectral measurement is made before and a second spectral measurement is made after the frequency shift. One or more arithmetic calculations are applied to the single spectral measurement, or the second spectral measurement is subtracted from the first spectral measurement. One or more integral transforms are applied to the resulting spectral measurement data to produce the standard Raman spectrum.

Abstract: An apparatus for measuring and applying instrumentation correction to produce a standard Raman spectrum of a sample to be analyzed. A source of incident radiation is included. Also included are means for providing from the incident radiation an incident beam and a monitor beam. The incident beam is directed at the sample. The invention includes means for generating from the sample a Raman beam. Spectral data may be collected directly from the monitor beam and the Raman beam. Spectral data may be collected substantially simultaneously from the monitor beam and the Raman beam, or sequentially. One or more integral transforms are applied to spectral data to produce the standard Raman spectrum of the sample.