Abstract: A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.

Abstract: Disclosed is a monitoring method wherein: a target is prepared using terrain model data including terrain location information; at a first time, an image of the target is picked up by means of an image pickup unit of a surveying device, and first image data is generated; at a second time after the first time, an image of the target is picked by means of the image pickup unit of the surveying device, and second image data is generated; and displacement of the target is detected using a first image based on the first image data, and a second image based on the second image data.

Abstract: A surveying instrument includes: a survey system; an image sensing system, including first and second image sensing units, the second having an angle of view wider than that of the first; horizontal and vertical angle drivers to rotate the survey and image sensing systems around a surveying instrument vertical and horizontal axes, respectively; a data storage part; an angle detecting part; and a control unit to cause an image, based on image data the first or second generates after imaging, a design data object for showing the design data portion locations included in the image, and coordinate measurement point objects for showing the coordinate measurement points locations, to be surveyed, corresponding to the design data portion included in the image, to appear on a representation device in response to the design data stored in the data storage part and the detected angle.

Abstract: A target including a reference object of a known size is prepared. The reference object from target image data, which is generated by photographing the target using a survey instrument, is detected through image processing to calculate first size data on dimensions of the reference object. A defect from external appearance image data, which is generated by photographing an external appearance of a structure using the survey instrument, is detected through image processing to calculate defect data on dimensions of the defect. The first size data is compared with second size data on actual dimensions of the reference object to calculate correction data, which is used to correct the defect data.

Abstract: A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.

Abstract: A surveying instrument includes: a survey system; an image sensing system, including first and second image sensing units, the second having an angle of view wider than that of the first; horizontal and vertical angle drivers to rotate the survey and image sensing systems around a surveying instrument vertical and horizontal axes, respectively; a data storage part; an angle detecting part; and a control unit to cause an image, based on image data the first or second generates after imaging, a design data object for showing the design data portion locations included in the image, and coordinate measurement point objects for showing the coordinate measurement points locations, to be surveyed, corresponding to the design data portion included in the image, to appear on a representation device in response to the design data stored in the data storage part and the detected angle.

Abstract: A surveying device includes: an angle-of-view value acquisition unit which acquires the angle of view of a telescope; and a manipulation amount correction unit which, on the basis of the angle of view acquired by the angle-of-view value acquisition unit, corrects the displacement amount of the telescope such that the displacement amount of the telescope with respect to the rotation amounts of a horizontal tangent screw and a vertical tangent screw when the angle of view of the telescope is a first angle of view is smaller than the displacement amount of the telescope with respect to the rotation amounts of the horizontal tangent screw and the vertical tangent screw when the angle of view of the telescope is a second angle of view wider than the first angle of view.

Abstract: A target for surveying includes: a reference point and at least one first light emitting body disposed on a vertical line passing through the reference point; and at least one second light emitting body disposed on a horizontal line passing through the reference point and achieving light emitting characteristics different from the light emitting characteristics of the first light emitting body.

Abstract: By providing a diffusing plate between a laser diode and an objective lens, a measurement light flux emitted from the laser diode is irradiated on a corner cube in a defocused state via the objective lens. The light flux having been reflected at corner cube sustains the defocused state. The reflected light flux having been reflected at and having exited the corner cube becomes condensed onto an avalanche photodiode through the objective lens. Even when a vibration occurs at the corner cube, the reflected light flux is received at the avalanche photodiode as long as the light flux having been reflected at and having exited the corner cube is within the predetermined range.