Patents Assigned to Niton Corporation
  • Patent number: 6801595
    Abstract: A device and method for identifying the composition of a target sample. The target sample may be a matrix such as a metal alloy, a soil sample, or a work of art. The device includes an x-ray fluorescence detector that produces an x-ray signal output in response to the target sample. The device also includes an optical spectroscope that produces an optical signal output in response to the target sample. Further, a processor is included that analyzes and combines the x-ray signal output and the optical signal output to determine the composition of the test material. In one embodiment, the optical spectroscope is a laser induced photon fluorescence detector.
    Type: Grant
    Filed: May 3, 2002
    Date of Patent: October 5, 2004
    Assignee: Niton Corporation
    Inventors: Lee Grodzins, Hal Grodzins
  • Patent number: 6765986
    Abstract: An x-ray fluorescence analyzer and method. The analyzer and method use a single radio-active source, such as, 241Am to determine the composition of a metal alloy or precious metal. The method compensates for Rayleigh scattering by first determining a scaling factor using a particular energy line in the spectrum of the test material and comparing that line to the same energy line for a pure metal. Based on the scaling factor the energy spectrum for the pure is compensated and then subtracted from the energy spectrum of the test material at discrete points.
    Type: Grant
    Filed: February 4, 2002
    Date of Patent: July 20, 2004
    Assignee: Niton Corporation
    Inventors: Lee Grodzins, Hal Grodzins