Abstract: A system for inspecting or screening electrically powered device includes a signal generator inputting a preselected signal into the electrically powered device. There is also an antenna array positioned at a pre-determined distance above the electrically powered device. Apparatus collects RF energy emitted by the electrically powered device in response to input of said preselected signal. The signature of the collected RF energy is compared with an RF energy signature of a genuine part. The comparison determines one of a genuine or a counterfeit condition of the electrically powered device.

Abstract: A method and apparatus is provided for the analysis of gaseous compounds, especially for determining the concentration of a gas or gases in a gas mixture by microwave spectroscopy. Microwave radiation is generated at one or more frequencies the gas is most responsive to, transmitted by antenna, passed through the gas under test, received by antenna, and the absorption and/or reflection of the microwave radiation is measured by means such as digitization and analysis using the FFT spectrum versus energy response generated, the response subsequently used to calculate the gas concentration.

Abstract: A system for identifying a real-world geographic location of an emission source emitting electromagnetic energy includes a platform configured for movement and an apparatus disposed on the platform and configured to collect and process, in a passive manner and during movement of the platform, at least a pair of successive samples of the electromagnetic energy emission and define angular and spatial coordinates of the emission source. The apparatus includes at least a pair of antennas, a receiver coupled to antennas and a processor executing a predetermined logic.

Abstract: A sensor includes a hollow enclosure, an antenna disposed external to the hollow enclosure and configured to collect emission of electromagnetic energy, a circuit disposed within the hollow enclosure and comprising a low noise amplifier (LNA) connectable to the antenna, and an analog to digital converter (ADC) in a connection with the LNA, circuit connections connecting, during use of the sensor, the circuit to each of the antenna, a source of electric energy and a signal processing component, a connection between the enclosure and an enclosure of an integrated circuit (IC), whereby the antenna id disposed between the sensor and the IC, and the sensor configured to at least measure a low-level electromagnetic energy emitted from the IC.

Abstract: The present invention is a signal processing method to significantly improve the detection and identification of source emissions. More particularly, the present invention offers a processing method to reduce the false alarm rate of systems which remotely detect and identify the presence of electronic devices through an analysis of a received spectrum the devices' unintended emissions. The invention identifies candidate emission elements and determines their validity based on a frequency and phase association with other emissions present in the received spectrum. The invention compares the measured phase and frequency data of the emissions with a software solution of the theoretically or empirically derived closed-form expression which governs the phase and frequency distribution of the emissions within the source. Verification of this relationship serves to dramatically increase the confidence of the detection.

Abstract: An apparatus for testing, inspecting or screening an electrically powered device for modified or unmodified hardware, firmware or software modifications including Malware, Trojans, adware, improper versioning, worms, or virus and the like, includes an antenna positioned at a distance from the electrically powered device and a signal receiver or sensor for examining a signal from the electrically powered device. The receiver or sensor collects unintended RF energy components emitted by the electrically powered device and includes one or more processors and executable instructions that perform analysis in a response to the acquired signal input while the electrically powered device is active or powered. The characteristics of the collected RF energy may be compared with RF energy characteristics of an unmodified device. The comparison determines one of a modified, unmodified or score of certainty of modified condition of the electrically powered device.

Abstract: A method for creating an enhanced multipaction resistant diamond-like coating (DLC) coating with lower Secondary Electron Emission (SEE) properties is performed on an initial surface by etching a DLC coating deposited on the surface after deposition and optionally creating interlayers to enhance adhesion mechanical properties between the DLC coating and the initial surface.

Abstract: A window pane for an interceptor missile includes a light transmissive base material and light transmissive additive particles dispersed within a thickness of the light transmissive base material so as to define stress nodes, the stress nodes localizing, upon applied thermal shock or thermal heating, crack propagation around each stress node and/or between two or more adjacent stress nodes and preventing a continuous crack propagation through any one of a length, a width and a thickness of the window pane.

Abstract: An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the e

Abstract: An apparatus for a network of electrical and/or electronic devices coupled to a data bus comprises a sensor coupled to the data bus and configured to capture information content communicated through the data bus in a form of electromagnetic emissions being at least one of differential mode electromagnetic emissions, common mode electromagnetic emissions, coupled radiated electromagnetic emissions, and data bit streams; one or more processors or logic devices, and a non-transitory computational medium comprising executable instructions. The apparatus measure a feature value in at least one region of a time domain or a frequency domain of the captured electromagnetic emissions, calculates a difference value between the measured feature value and one or more baseline feature values, and determines, based on the calculated value, a presence or an absence of anomalies indicative of at least one of cyber intrusion attempt, cyber attack, cyber-physical attacks, malware, etc.

Abstract: An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.

Abstract: A hybrid of initial time consuming phase of a Single Directional Dijkstra's Algorithm is embodied on an unclocked CMOS logic chip using a parallelized approach with Asynchronous Digital Logic (ADL). The chip includes a a plurality of addressable configurable cells arranged as a multidimensional orthogonal array. The cell array only executes mathematical operations based on a communication between immediately adjacent cells.

Abstract: An apparatus for testing, inspecting or screening an electronic device for electrical characteristics, modified or unmodified hardware, or firmware modifications including Malware, Trojans, improper versioning, and the like, includes a transmitting antenna positioned at a distance from the electronic device and a electromagnetic energy receiver or sensor for examining a resulting unintentional derived electromagnetic energy from the electronic device. The receiver collects unintentional RF energy components emitted by the device and includes a processor and executable instructions that perform analysis in a response to the acquired electromagnetic energy input. The characteristics of the collected RF energy may be compared with RF energy characteristics of an exemplary device. The analysis determines one of a modified, unmodified or score of certainty of discerned condition of the device.

Abstract: A hand-held apparatus for analysis, testing, inspecting and/or screening a fully integrated and assembled electrically powered assets and devices for measurement of degree of device aging, degradation, condition, and/or Remaining Useful Life (RUL). The device includes an on-board antenna positioned at a distance from the electrically powered device under test and a signal receiver or sensor for examining a signal from the electrically powered device, but especially applied to electronic devices. The receiver or sensor collects unintended and/or intended RF energy components emitted by the electrically powered device and performs the above analysis in a response to the acquired signal input while the electrically powered device is active or powered.

Abstract: A diagnostic apparatus for analysis, testing, inspecting and/or screening an integrated and assembled electrically powered equipment rack and its populated cards and devices for measurement of degree of device aging, improper operation, degradation, condition, and/or Remaining Useful Life (RUL). The device includes an antenna card with a detachably attachable antenna module that can be positioned at a distance from the electrically devices under test and a signal receiver or sensor for examining a signal from the electrically powered device, but especially applied to rackmount supported electronics and/or chassis based electronics. The receiver or sensor collects unintended and/or intended RF energy components emitted by the electrically powered device and performs the above analysis in a response to the acquired signal input while the electrically powered device is active or powered.

Abstract: An integrated circuit includes an antenna, a die manufactured from a semiconducting material, an RF energy collection and processing means disposed on or within said die and including at least a receiver and a processing means, an input configured to supply power to said RF energy collection and processing means and an output for operative communication by said RF energy collection and processing means. The integrated circuit is configurable and operable to provide at least one of electromagnetic emission anomaly detection, tamper detection, anti-tamper monitoring, degradation monitoring, health monitoring, counterfeit detection, software changes monitoring, firmware changes monitoring and monitoring of other RF energy anomalies.

Abstract: An apparatus for detecting a condition or authenticity of one or more electronic devices includes an enclosure having an antenna integrated therewithin, a fixture mounted within a hollow interior of the enclosure, the fixture being configured to receive the one or more electronic devices and connect one or more signals to each of the one or more electronic devices and a sensor and controller assembly connected to the antenna and configured to process a signature of an emission of a radiofrequency (RF) energy from of one or more electronic devices having the one or more signals connected thereto.

Abstract: A device and a method for monitoring and analysis utilize unintended electromagnetic emissions of electrically powered components, devices or systems. The emissions are received at the antenna and a receiver. A processor processes and measures change or changes in a signature of the unintended electromagnetic emissions. The measurement are analyzed to both record a baseline score for future measurements and to be used in determining status and/or health of the analyzed system or component.

Abstract: An apparatus, configured and operable to determine a state and/or an operation of a powered electrical device, comprises one or more antennas, a receiver operable to receive emission(s) of electromagnetic energy from the electrical device; an illumination device operable to illuminate the electrical device with a pulse of electromagnetic energy; a controller including: one or more processors, a non-transitory computer readable medium comprising executable instructions that, when executed by the one or more processors, cause the one or more processors to perform the steps of selecting a spectral frequency target component of the emission(s), iteratively controlling the illumination device, measuring, at each iteration, a change in characteristic(s) of the spectral frequency target component of the emission(s), assigning a score value to each measurement, and iteratively effecting optimized parameter(s) of the pulse based on the score value until a final score value indicates a desired state, operation of the e

Abstract: A semiconductor device comprises a semiconductor substrate, one or more circuits disposed on the semiconductor substrate, and a modification of any one of hardware, software or firmware of the electronic device that generates emission of electromagnetic energy from the semiconductor device with desired characteristic(s), without changing a designed interface functionality of the semiconductor device. Method are also provided for modifying the semiconductor device and identifying modified semiconductor device.